Investigations on radiation hardness of DEPFET sensors for the Belle II detector

In the upgrade of the Belle detector at KEK (Tsukuba, Japan) the two innermost layers of the vertex detector will be realized by a pixel detector (PXD) consisting of DEPFET (DEpleted P-channel Field Effect Transistor) matrices. As the position of the detector will be very close to the beam pipe, it...

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Veröffentlicht in:	Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2013-12, Vol.730, p.79-83
Hauptverfasser:	Ritter, Andreas, Andricek, Ladislav, Kleinohl, Tobias, Koffmane, Christian, Lütticke, Florian, Marinas, Carlos, Moser, Hans-Günther, Ninkovic, Jelena, Richter, Rainer, Schaller, Gerhard, Schnecke, Martina, Schopper, Florian
Format:	Artikel
Sprache:	eng
Schlagworte:	Beams (radiation) DEPFET Detectors Luminosity Particle tracking detectors Radiation damage Radiation hardness Semiconductor devices Silicon detector Silicon dioxide Spectrometers Threshold voltage
Online-Zugang:	Volltext
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