Solder joint reliability under realistic service conditions
•Fixed amplitude cycling tests lead to overestimates of life in varying amplitude cycling.•Miner’s rule does not apply to life of SnAgCu in thermal cycling over varying temperature ranges.•Miner’s rule overestimates isothermal fatigue life of SnAgCu solder for varying amplitudes.•A few high load cyc...
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Veröffentlicht in: | Microelectronics and reliability 2013-09, Vol.53 (9-11), p.1587-1591 |
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creator | Borgesen, P. Hamasha, S. Obaidat, M. Raghavan, V. Dai, X. Meilunas, M. Anselm, M. |
description | •Fixed amplitude cycling tests lead to overestimates of life in varying amplitude cycling.•Miner’s rule does not apply to life of SnAgCu in thermal cycling over varying temperature ranges.•Miner’s rule overestimates isothermal fatigue life of SnAgCu solder for varying amplitudes.•A few high load cycles reduces subsequent acceleration factor for cratering in cycling.
The ultimate life of a microelectronics component is often limited by failure of a solder joint due to crack growth through the laminate under a contact pad (cratering), through the intermetallic bond to the pad, or through the solder itself. Whatever the failure mode proper assessments or even relative comparisons of life in service are not possible based on accelerated testing with fixed amplitudes, or random vibration testing, alone. Effects of thermal cycling enhanced precipitate coarsening on the deformation properties can be accounted for by microstructurally adaptive constitutive relations, but separate effects on the rate of recrystallization lead to a break-down in common damage accumulation laws such as Miner’s rule. Isothermal cycling of individual solder joints revealed additional effects of amplitude variations on the deformation properties that cannot currently be accounted for directly. We propose a practical modification to Miner’s rule for solder failure to circumvent this problem. Testing of individual solder pads, eliminating effects of the solder properties, still showed variations in cycling amplitude to systematically reduce subsequent acceleration factors for solder pad cratering. General trends, anticipated consequences and remaining research needs are discussed. |
doi_str_mv | 10.1016/j.microrel.2013.07.091 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1531016303</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0026271413002679</els_id><sourcerecordid>1531016303</sourcerecordid><originalsourceid>FETCH-LOGICAL-c375t-3fb045885fd307593e74867a013b703eb62537dc44c995b6f78a274e1e2a321c3</originalsourceid><addsrcrecordid>eNqFkE1LxDAQhoMouK7-BelF8NI6SdqmxYuy-AULHlTwFtJ0CrN0mzXpLuy_N2XVq6eB4Xnn42HskkPGgZc3q2xN1juPfSaAywxUBjU_YjNeKZHWOf88ZjMAUaZC8fyUnYWwAgAFnM_Y7ZvrW_TJytEwJnEGmYZ6GvfJdpj6Hk1PYSSbBPQ7sphYN7Q0khvCOTvpTB_w4qfO2cfjw_viOV2-Pr0s7peplaoYU9k1kBdVVXStBFXUElVelcrEWxsFEptSFFK1Ns9tXRdN2anKCJUjR2Gk4FbO2fVh7sa7ry2GUa8pWOx7M6DbBs0LOYmQICNaHtAoJASPnd54Whu_1xz0BOmV_rWlJ1salI62YvDqZ4cJ1vSdN4Ol8JcWqhZcQRm5uwOH8eEdodfBEg4WW_JoR906-m_VNxy1gw4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1531016303</pqid></control><display><type>article</type><title>Solder joint reliability under realistic service conditions</title><source>Access via ScienceDirect (Elsevier)</source><creator>Borgesen, P. ; Hamasha, S. ; Obaidat, M. ; Raghavan, V. ; Dai, X. ; Meilunas, M. ; Anselm, M.</creator><creatorcontrib>Borgesen, P. ; Hamasha, S. ; Obaidat, M. ; Raghavan, V. ; Dai, X. ; Meilunas, M. ; Anselm, M.</creatorcontrib><description>•Fixed amplitude cycling tests lead to overestimates of life in varying amplitude cycling.•Miner’s rule does not apply to life of SnAgCu in thermal cycling over varying temperature ranges.•Miner’s rule overestimates isothermal fatigue life of SnAgCu solder for varying amplitudes.•A few high load cycles reduces subsequent acceleration factor for cratering in cycling.
The ultimate life of a microelectronics component is often limited by failure of a solder joint due to crack growth through the laminate under a contact pad (cratering), through the intermetallic bond to the pad, or through the solder itself. Whatever the failure mode proper assessments or even relative comparisons of life in service are not possible based on accelerated testing with fixed amplitudes, or random vibration testing, alone. Effects of thermal cycling enhanced precipitate coarsening on the deformation properties can be accounted for by microstructurally adaptive constitutive relations, but separate effects on the rate of recrystallization lead to a break-down in common damage accumulation laws such as Miner’s rule. Isothermal cycling of individual solder joints revealed additional effects of amplitude variations on the deformation properties that cannot currently be accounted for directly. We propose a practical modification to Miner’s rule for solder failure to circumvent this problem. Testing of individual solder pads, eliminating effects of the solder properties, still showed variations in cycling amplitude to systematically reduce subsequent acceleration factors for solder pad cratering. General trends, anticipated consequences and remaining research needs are discussed.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2013.07.091</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Amplitudes ; Applied sciences ; Constitutive relationships ; Cycles ; Deformation ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Failure ; Integrated circuits ; Laws ; Microelectronics ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Solders</subject><ispartof>Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1587-1591</ispartof><rights>2013 Elsevier Ltd</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c375t-3fb045885fd307593e74867a013b703eb62537dc44c995b6f78a274e1e2a321c3</citedby><cites>FETCH-LOGICAL-c375t-3fb045885fd307593e74867a013b703eb62537dc44c995b6f78a274e1e2a321c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.microrel.2013.07.091$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,3550,23930,23931,25140,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27921706$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Borgesen, P.</creatorcontrib><creatorcontrib>Hamasha, S.</creatorcontrib><creatorcontrib>Obaidat, M.</creatorcontrib><creatorcontrib>Raghavan, V.</creatorcontrib><creatorcontrib>Dai, X.</creatorcontrib><creatorcontrib>Meilunas, M.</creatorcontrib><creatorcontrib>Anselm, M.</creatorcontrib><title>Solder joint reliability under realistic service conditions</title><title>Microelectronics and reliability</title><description>•Fixed amplitude cycling tests lead to overestimates of life in varying amplitude cycling.•Miner’s rule does not apply to life of SnAgCu in thermal cycling over varying temperature ranges.•Miner’s rule overestimates isothermal fatigue life of SnAgCu solder for varying amplitudes.•A few high load cycles reduces subsequent acceleration factor for cratering in cycling.
The ultimate life of a microelectronics component is often limited by failure of a solder joint due to crack growth through the laminate under a contact pad (cratering), through the intermetallic bond to the pad, or through the solder itself. Whatever the failure mode proper assessments or even relative comparisons of life in service are not possible based on accelerated testing with fixed amplitudes, or random vibration testing, alone. Effects of thermal cycling enhanced precipitate coarsening on the deformation properties can be accounted for by microstructurally adaptive constitutive relations, but separate effects on the rate of recrystallization lead to a break-down in common damage accumulation laws such as Miner’s rule. Isothermal cycling of individual solder joints revealed additional effects of amplitude variations on the deformation properties that cannot currently be accounted for directly. We propose a practical modification to Miner’s rule for solder failure to circumvent this problem. Testing of individual solder pads, eliminating effects of the solder properties, still showed variations in cycling amplitude to systematically reduce subsequent acceleration factors for solder pad cratering. General trends, anticipated consequences and remaining research needs are discussed.</description><subject>Amplitudes</subject><subject>Applied sciences</subject><subject>Constitutive relationships</subject><subject>Cycles</subject><subject>Deformation</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Failure</subject><subject>Integrated circuits</subject><subject>Laws</subject><subject>Microelectronics</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Solders</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LxDAQhoMouK7-BelF8NI6SdqmxYuy-AULHlTwFtJ0CrN0mzXpLuy_N2XVq6eB4Xnn42HskkPGgZc3q2xN1juPfSaAywxUBjU_YjNeKZHWOf88ZjMAUaZC8fyUnYWwAgAFnM_Y7ZvrW_TJytEwJnEGmYZ6GvfJdpj6Hk1PYSSbBPQ7sphYN7Q0khvCOTvpTB_w4qfO2cfjw_viOV2-Pr0s7peplaoYU9k1kBdVVXStBFXUElVelcrEWxsFEptSFFK1Ns9tXRdN2anKCJUjR2Gk4FbO2fVh7sa7ry2GUa8pWOx7M6DbBs0LOYmQICNaHtAoJASPnd54Whu_1xz0BOmV_rWlJ1salI62YvDqZ4cJ1vSdN4Ol8JcWqhZcQRm5uwOH8eEdodfBEg4WW_JoR906-m_VNxy1gw4</recordid><startdate>20130901</startdate><enddate>20130901</enddate><creator>Borgesen, P.</creator><creator>Hamasha, S.</creator><creator>Obaidat, M.</creator><creator>Raghavan, V.</creator><creator>Dai, X.</creator><creator>Meilunas, M.</creator><creator>Anselm, M.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20130901</creationdate><title>Solder joint reliability under realistic service conditions</title><author>Borgesen, P. ; Hamasha, S. ; Obaidat, M. ; Raghavan, V. ; Dai, X. ; Meilunas, M. ; Anselm, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c375t-3fb045885fd307593e74867a013b703eb62537dc44c995b6f78a274e1e2a321c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Amplitudes</topic><topic>Applied sciences</topic><topic>Constitutive relationships</topic><topic>Cycles</topic><topic>Deformation</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Failure</topic><topic>Integrated circuits</topic><topic>Laws</topic><topic>Microelectronics</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Solders</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Borgesen, P.</creatorcontrib><creatorcontrib>Hamasha, S.</creatorcontrib><creatorcontrib>Obaidat, M.</creatorcontrib><creatorcontrib>Raghavan, V.</creatorcontrib><creatorcontrib>Dai, X.</creatorcontrib><creatorcontrib>Meilunas, M.</creatorcontrib><creatorcontrib>Anselm, M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Borgesen, P.</au><au>Hamasha, S.</au><au>Obaidat, M.</au><au>Raghavan, V.</au><au>Dai, X.</au><au>Meilunas, M.</au><au>Anselm, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Solder joint reliability under realistic service conditions</atitle><jtitle>Microelectronics and reliability</jtitle><date>2013-09-01</date><risdate>2013</risdate><volume>53</volume><issue>9-11</issue><spage>1587</spage><epage>1591</epage><pages>1587-1591</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>•Fixed amplitude cycling tests lead to overestimates of life in varying amplitude cycling.•Miner’s rule does not apply to life of SnAgCu in thermal cycling over varying temperature ranges.•Miner’s rule overestimates isothermal fatigue life of SnAgCu solder for varying amplitudes.•A few high load cycles reduces subsequent acceleration factor for cratering in cycling.
The ultimate life of a microelectronics component is often limited by failure of a solder joint due to crack growth through the laminate under a contact pad (cratering), through the intermetallic bond to the pad, or through the solder itself. Whatever the failure mode proper assessments or even relative comparisons of life in service are not possible based on accelerated testing with fixed amplitudes, or random vibration testing, alone. Effects of thermal cycling enhanced precipitate coarsening on the deformation properties can be accounted for by microstructurally adaptive constitutive relations, but separate effects on the rate of recrystallization lead to a break-down in common damage accumulation laws such as Miner’s rule. Isothermal cycling of individual solder joints revealed additional effects of amplitude variations on the deformation properties that cannot currently be accounted for directly. We propose a practical modification to Miner’s rule for solder failure to circumvent this problem. Testing of individual solder pads, eliminating effects of the solder properties, still showed variations in cycling amplitude to systematically reduce subsequent acceleration factors for solder pad cratering. General trends, anticipated consequences and remaining research needs are discussed.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2013.07.091</doi><tpages>5</tpages></addata></record> |
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subjects | Amplitudes Applied sciences Constitutive relationships Cycles Deformation Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Failure Integrated circuits Laws Microelectronics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Solders |
title | Solder joint reliability under realistic service conditions |
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