Fluctuating Surfaces of Growing 4He Crystals in Aerogel
Crystal-superfluid interface of 4 He in aerogel was shown to advance smoothly in a high temperature creep growth region above 0.6 K. In this report, we focused on the shape of the growing interface in the region and attempted to analyze the roughness of interfaces. The growth of rough interfaces is...
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Veröffentlicht in: | Journal of low temperature physics 2014-04, Vol.175 (1-2), p.126-132 |
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creator | Ochi, Aguri Matsuda, Hirofumi Isozaki, Rei Nomura, Ryuji Okuda, Yuichi |
description | Crystal-superfluid interface of
4
He in aerogel was shown to advance smoothly in a high temperature creep growth region above 0.6 K. In this report, we focused on the shape of the growing interface in the region and attempted to analyze the roughness of interfaces. The growth of rough interfaces is very common in nature and is known to often follow a scaling law; roughness usually increases with time and saturates in the later stage. We measured the roughness
w
(
t
) defined as the standard deviation of the interface height as a function of time
t
. It was found that
w
(
t
) in 98 % porosity aerogel initially increased with
t
and decreased after a particular time in the later stage. The abrupt reduction of roughness in the end of crystallization is unusual if it is intrinsic in the crystallization in aerogel. |
doi_str_mv | 10.1007/s10909-013-0974-7 |
format | Article |
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4
He in aerogel was shown to advance smoothly in a high temperature creep growth region above 0.6 K. In this report, we focused on the shape of the growing interface in the region and attempted to analyze the roughness of interfaces. The growth of rough interfaces is very common in nature and is known to often follow a scaling law; roughness usually increases with time and saturates in the later stage. We measured the roughness
w
(
t
) defined as the standard deviation of the interface height as a function of time
t
. It was found that
w
(
t
) in 98 % porosity aerogel initially increased with
t
and decreased after a particular time in the later stage. The abrupt reduction of roughness in the end of crystallization is unusual if it is intrinsic in the crystallization in aerogel.</description><identifier>ISSN: 0022-2291</identifier><identifier>EISSN: 1573-7357</identifier><identifier>DOI: 10.1007/s10909-013-0974-7</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Aerogels ; Characterization and Evaluation of Materials ; Condensed Matter Physics ; Creep (materials) ; Crystallization ; Crystals ; Fluctuation ; Magnetic Materials ; Magnetism ; Physics ; Physics and Astronomy ; Porosity ; Roughness ; Standard deviation</subject><ispartof>Journal of low temperature physics, 2014-04, Vol.175 (1-2), p.126-132</ispartof><rights>Springer Science+Business Media New York 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1667-cf4cd3237462b51c2389c9d7918185cea3e88836fd363abcfadd11a7c56fbdf93</citedby><cites>FETCH-LOGICAL-c1667-cf4cd3237462b51c2389c9d7918185cea3e88836fd363abcfadd11a7c56fbdf93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10909-013-0974-7$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10909-013-0974-7$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Ochi, Aguri</creatorcontrib><creatorcontrib>Matsuda, Hirofumi</creatorcontrib><creatorcontrib>Isozaki, Rei</creatorcontrib><creatorcontrib>Nomura, Ryuji</creatorcontrib><creatorcontrib>Okuda, Yuichi</creatorcontrib><title>Fluctuating Surfaces of Growing 4He Crystals in Aerogel</title><title>Journal of low temperature physics</title><addtitle>J Low Temp Phys</addtitle><description>Crystal-superfluid interface of
4
He in aerogel was shown to advance smoothly in a high temperature creep growth region above 0.6 K. In this report, we focused on the shape of the growing interface in the region and attempted to analyze the roughness of interfaces. The growth of rough interfaces is very common in nature and is known to often follow a scaling law; roughness usually increases with time and saturates in the later stage. We measured the roughness
w
(
t
) defined as the standard deviation of the interface height as a function of time
t
. It was found that
w
(
t
) in 98 % porosity aerogel initially increased with
t
and decreased after a particular time in the later stage. The abrupt reduction of roughness in the end of crystallization is unusual if it is intrinsic in the crystallization in aerogel.</description><subject>Aerogels</subject><subject>Characterization and Evaluation of Materials</subject><subject>Condensed Matter Physics</subject><subject>Creep (materials)</subject><subject>Crystallization</subject><subject>Crystals</subject><subject>Fluctuation</subject><subject>Magnetic Materials</subject><subject>Magnetism</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Porosity</subject><subject>Roughness</subject><subject>Standard deviation</subject><issn>0022-2291</issn><issn>1573-7357</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LAzEURYMoWKs_wN0s3UTfSyZfy1JsKxRcqOuQZpIyZTpTkxmk_94p49rVg8s9F94h5BHhGQHUS0YwYCggp2BUSdUVmaFQnCou1DWZATBGGTN4S-5yPgCA0ZLPiFo1g-8H19ftvvgYUnQ-5KKLxTp1P5es3IRimc65d00u6rZYhNTtQ3NPbuKYhIe_Oydfq9fP5YZu39dvy8WWepRSUR9LX3HGVSnZTqBnXBtvKmVQoxY-OB601lzGikvudj66qkJ0ygsZd1U0fE6ept1T6r6HkHt7rLMPTePa0A3ZouBgjNFMjFWcqj51OacQ7SnVR5fOFsFeJNlJkh0l2Yskq0aGTUweu-0-JHvohtSOH_0D_QIZG2jr</recordid><startdate>20140401</startdate><enddate>20140401</enddate><creator>Ochi, Aguri</creator><creator>Matsuda, Hirofumi</creator><creator>Isozaki, Rei</creator><creator>Nomura, Ryuji</creator><creator>Okuda, Yuichi</creator><general>Springer US</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20140401</creationdate><title>Fluctuating Surfaces of Growing 4He Crystals in Aerogel</title><author>Ochi, Aguri ; Matsuda, Hirofumi ; Isozaki, Rei ; Nomura, Ryuji ; Okuda, Yuichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1667-cf4cd3237462b51c2389c9d7918185cea3e88836fd363abcfadd11a7c56fbdf93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Aerogels</topic><topic>Characterization and Evaluation of Materials</topic><topic>Condensed Matter Physics</topic><topic>Creep (materials)</topic><topic>Crystallization</topic><topic>Crystals</topic><topic>Fluctuation</topic><topic>Magnetic Materials</topic><topic>Magnetism</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Porosity</topic><topic>Roughness</topic><topic>Standard deviation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ochi, Aguri</creatorcontrib><creatorcontrib>Matsuda, Hirofumi</creatorcontrib><creatorcontrib>Isozaki, Rei</creatorcontrib><creatorcontrib>Nomura, Ryuji</creatorcontrib><creatorcontrib>Okuda, Yuichi</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of low temperature physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ochi, Aguri</au><au>Matsuda, Hirofumi</au><au>Isozaki, Rei</au><au>Nomura, Ryuji</au><au>Okuda, Yuichi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fluctuating Surfaces of Growing 4He Crystals in Aerogel</atitle><jtitle>Journal of low temperature physics</jtitle><stitle>J Low Temp Phys</stitle><date>2014-04-01</date><risdate>2014</risdate><volume>175</volume><issue>1-2</issue><spage>126</spage><epage>132</epage><pages>126-132</pages><issn>0022-2291</issn><eissn>1573-7357</eissn><abstract>Crystal-superfluid interface of
4
He in aerogel was shown to advance smoothly in a high temperature creep growth region above 0.6 K. In this report, we focused on the shape of the growing interface in the region and attempted to analyze the roughness of interfaces. The growth of rough interfaces is very common in nature and is known to often follow a scaling law; roughness usually increases with time and saturates in the later stage. We measured the roughness
w
(
t
) defined as the standard deviation of the interface height as a function of time
t
. It was found that
w
(
t
) in 98 % porosity aerogel initially increased with
t
and decreased after a particular time in the later stage. The abrupt reduction of roughness in the end of crystallization is unusual if it is intrinsic in the crystallization in aerogel.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s10909-013-0974-7</doi><tpages>7</tpages></addata></record> |
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subjects | Aerogels Characterization and Evaluation of Materials Condensed Matter Physics Creep (materials) Crystallization Crystals Fluctuation Magnetic Materials Magnetism Physics Physics and Astronomy Porosity Roughness Standard deviation |
title | Fluctuating Surfaces of Growing 4He Crystals in Aerogel |
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