Software-based self-test generation for microprocessors with high-level decision diagrams

This article presents a novel approach to automated behavioural level test program generation for microprocessors, using the model of high-level decision diagrams (HLDD) for representing instruction sets. The methodology of using HLDDs for modelling of microprocessors, and a new HLDD-based fault mod...

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Veröffentlicht in:Proceedings of the Estonian Academy of Sciences 2014-01, Vol.63 (1), p.48-48
Hauptverfasser: Jasnetski, Artjom, Ubar, Raimund, Tsertov, Anton, Brik, Marina
Format: Artikel
Sprache:eng
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