Active mass analysis on thin films of electrodeposited manganese dioxide for electrochemical capacitors
► Thin films of electrodeposited manganese dioxide have been shown to possess very high specific capacitances. ► An accurate estimate of the mass is necessary for generating the specific capacitance. ► Here we compare i–t integration, EQCM and ICP-OES methods of mass analysis. ► We have concluded th...
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| Veröffentlicht in: | Electrochimica acta 2013-01, Vol.87, p.133-139 |
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| container_title | Electrochimica acta |
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| creator | Cross, A.D. Morel, A. Drozd, M. Olcomendy, I. Hollenkamp, A.F. Donne, S.W. |
| description | ► Thin films of electrodeposited manganese dioxide have been shown to possess very high specific capacitances. ► An accurate estimate of the mass is necessary for generating the specific capacitance. ► Here we compare i–t integration, EQCM and ICP-OES methods of mass analysis. ► We have concluded that the i–t integration method is the most appropriate.
For an accurate estimate of the specific capacitance it is imperative that the mass of active material be known. This is of particular importance for thin films of electrodeposited manganese dioxide, where the conventional determination of active material is not possible. Here we compare three indirect methods of mass analysis; namely, by integration of chronoamperometric i–t data, through the use of the electrochemical quartz crystal microbalance, and via manganese analysis of the deposit via ICP-OES. Each of these approaches was shown to be complicated by a range of experimental artefacts; however, it was concluded that the integration method was the preferred approach because of its focus only on the electroactive manganese species within the electrode. |
| doi_str_mv | 10.1016/j.electacta.2012.08.028 |
| format | Article |
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For an accurate estimate of the specific capacitance it is imperative that the mass of active material be known. This is of particular importance for thin films of electrodeposited manganese dioxide, where the conventional determination of active material is not possible. Here we compare three indirect methods of mass analysis; namely, by integration of chronoamperometric i–t data, through the use of the electrochemical quartz crystal microbalance, and via manganese analysis of the deposit via ICP-OES. Each of these approaches was shown to be complicated by a range of experimental artefacts; however, it was concluded that the integration method was the preferred approach because of its focus only on the electroactive manganese species within the electrode.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/j.electacta.2012.08.028</identifier><identifier>CODEN: ELCAAV</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Applied sciences ; Capacitance ; Capacitors ; Capacitors. Resistors. Filters ; Chemistry ; Electrical engineering. Electrical power engineering ; Electrochemistry ; Electrodeposition ; Electrodes ; EQCM ; Estimates ; Exact sciences and technology ; General and physical chemistry ; ICP-OES ; Manganese ; Manganese dioxide ; Microorganisms ; Quartz crystals ; Study of interfaces ; Supercapacitors ; Thin films ; Various equipment and components</subject><ispartof>Electrochimica acta, 2013-01, Vol.87, p.133-139</ispartof><rights>2012 Elsevier Ltd</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c411t-99c29bd1515bf8e849d083197efb59ef5d5e4cf49d76a549775a9ecafc115cbc3</citedby><cites>FETCH-LOGICAL-c411t-99c29bd1515bf8e849d083197efb59ef5d5e4cf49d76a549775a9ecafc115cbc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0013468612013102$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,4010,27900,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26791465$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Cross, A.D.</creatorcontrib><creatorcontrib>Morel, A.</creatorcontrib><creatorcontrib>Drozd, M.</creatorcontrib><creatorcontrib>Olcomendy, I.</creatorcontrib><creatorcontrib>Hollenkamp, A.F.</creatorcontrib><creatorcontrib>Donne, S.W.</creatorcontrib><title>Active mass analysis on thin films of electrodeposited manganese dioxide for electrochemical capacitors</title><title>Electrochimica acta</title><description>► Thin films of electrodeposited manganese dioxide have been shown to possess very high specific capacitances. ► An accurate estimate of the mass is necessary for generating the specific capacitance. ► Here we compare i–t integration, EQCM and ICP-OES methods of mass analysis. ► We have concluded that the i–t integration method is the most appropriate.
For an accurate estimate of the specific capacitance it is imperative that the mass of active material be known. This is of particular importance for thin films of electrodeposited manganese dioxide, where the conventional determination of active material is not possible. Here we compare three indirect methods of mass analysis; namely, by integration of chronoamperometric i–t data, through the use of the electrochemical quartz crystal microbalance, and via manganese analysis of the deposit via ICP-OES. Each of these approaches was shown to be complicated by a range of experimental artefacts; however, it was concluded that the integration method was the preferred approach because of its focus only on the electroactive manganese species within the electrode.</description><subject>Applied sciences</subject><subject>Capacitance</subject><subject>Capacitors</subject><subject>Capacitors. Resistors. Filters</subject><subject>Chemistry</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electrochemistry</subject><subject>Electrodeposition</subject><subject>Electrodes</subject><subject>EQCM</subject><subject>Estimates</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>ICP-OES</subject><subject>Manganese</subject><subject>Manganese dioxide</subject><subject>Microorganisms</subject><subject>Quartz crystals</subject><subject>Study of interfaces</subject><subject>Supercapacitors</subject><subject>Thin films</subject><subject>Various equipment and components</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkU9r3DAQxUVpodu0n6G6FHqxK9mSJR2X0H8Q6KU9C-1olGixra3GCc23r9JNcw0MiBG_eW-Yx9h7KXop5PTp2OOMsIVW_SDk0Avbi8G-YDtpzdiNVruXbCeEHDs12ek1e0N0FEKYyYgdu97Dlu-QL4GIhzXM95SJl5VvN3nlKc9L6xL_Z1FLxFOhvGFs_HodViTkMZc_OSJPpf7H4AaXDGHmEE4B8lYqvWWvUpgJ3z2-F-zXl88_L791Vz--fr_cX3WgpNw652Bwhyi11Idk0SoXhR2lM5gO2mHSUaOC1L7NFLRyxujgEEICKTUcYLxgH8-6p1p-3yJtfskEOM9t2XJLvimPygkrzPNoA5WRStqGmjMKtRBVTP5U8xLqvZfCP6Tgj_4pBf-QghfWtxTa5IdHk0DtIqmGFTI9jQ-TcVJNunH7M4ftOHcZqyfIuALGXJuujyU_6_UXfouj1Q</recordid><startdate>20130101</startdate><enddate>20130101</enddate><creator>Cross, A.D.</creator><creator>Morel, A.</creator><creator>Drozd, M.</creator><creator>Olcomendy, I.</creator><creator>Hollenkamp, A.F.</creator><creator>Donne, S.W.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>7SP</scope></search><sort><creationdate>20130101</creationdate><title>Active mass analysis on thin films of electrodeposited manganese dioxide for electrochemical capacitors</title><author>Cross, A.D. ; Morel, A. ; Drozd, M. ; Olcomendy, I. ; Hollenkamp, A.F. ; Donne, S.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c411t-99c29bd1515bf8e849d083197efb59ef5d5e4cf49d76a549775a9ecafc115cbc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Applied sciences</topic><topic>Capacitance</topic><topic>Capacitors</topic><topic>Capacitors. Resistors. Filters</topic><topic>Chemistry</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electrochemistry</topic><topic>Electrodeposition</topic><topic>Electrodes</topic><topic>EQCM</topic><topic>Estimates</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>ICP-OES</topic><topic>Manganese</topic><topic>Manganese dioxide</topic><topic>Microorganisms</topic><topic>Quartz crystals</topic><topic>Study of interfaces</topic><topic>Supercapacitors</topic><topic>Thin films</topic><topic>Various equipment and components</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cross, A.D.</creatorcontrib><creatorcontrib>Morel, A.</creatorcontrib><creatorcontrib>Drozd, M.</creatorcontrib><creatorcontrib>Olcomendy, I.</creatorcontrib><creatorcontrib>Hollenkamp, A.F.</creatorcontrib><creatorcontrib>Donne, S.W.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics & Communications Abstracts</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cross, A.D.</au><au>Morel, A.</au><au>Drozd, M.</au><au>Olcomendy, I.</au><au>Hollenkamp, A.F.</au><au>Donne, S.W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Active mass analysis on thin films of electrodeposited manganese dioxide for electrochemical capacitors</atitle><jtitle>Electrochimica acta</jtitle><date>2013-01-01</date><risdate>2013</risdate><volume>87</volume><spage>133</spage><epage>139</epage><pages>133-139</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><coden>ELCAAV</coden><abstract>► Thin films of electrodeposited manganese dioxide have been shown to possess very high specific capacitances. ► An accurate estimate of the mass is necessary for generating the specific capacitance. ► Here we compare i–t integration, EQCM and ICP-OES methods of mass analysis. ► We have concluded that the i–t integration method is the most appropriate.
For an accurate estimate of the specific capacitance it is imperative that the mass of active material be known. This is of particular importance for thin films of electrodeposited manganese dioxide, where the conventional determination of active material is not possible. Here we compare three indirect methods of mass analysis; namely, by integration of chronoamperometric i–t data, through the use of the electrochemical quartz crystal microbalance, and via manganese analysis of the deposit via ICP-OES. Each of these approaches was shown to be complicated by a range of experimental artefacts; however, it was concluded that the integration method was the preferred approach because of its focus only on the electroactive manganese species within the electrode.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.electacta.2012.08.028</doi><tpages>7</tpages></addata></record> |
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| subjects | Applied sciences Capacitance Capacitors Capacitors. Resistors. Filters Chemistry Electrical engineering. Electrical power engineering Electrochemistry Electrodeposition Electrodes EQCM Estimates Exact sciences and technology General and physical chemistry ICP-OES Manganese Manganese dioxide Microorganisms Quartz crystals Study of interfaces Supercapacitors Thin films Various equipment and components |
| title | Active mass analysis on thin films of electrodeposited manganese dioxide for electrochemical capacitors |
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