PEM fuel cell CL characterization using a standalone FIB and SEM: Experiments and simulation
A standalone focused ion beam (FIB) and standalone scanning electron microscope (SEM) were used to cut and take slices of the interior morphology of the catalyst layer. It was observed that the images obtained by the standalone SEM showed much finer features than those previously published in the li...
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| Veröffentlicht in: | Electrochimica acta 2012-12, Vol.85, p.322-331 |
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| container_title | Electrochimica acta |
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| creator | Lange, Kyle J. Carlsson, Håkan Stewart, Ian Sui, Pang-Chieh Herring, Rodney Djilali, Ned |
| description | A standalone focused ion beam (FIB) and standalone scanning electron microscope (SEM) were used to cut and take slices of the interior morphology of the catalyst layer. It was observed that the images obtained by the standalone SEM showed much finer features than those previously published in the literature. This is likely due to the effects of redeposition of sputtered material. The obtained SEM images were adjusted for brightness, thresholded, cropped, and used to computationally reconstruct a PEMFC CL section. A simulation of heat, charge, and mass transfer was performed to obtain effective transport properties. A perspective on the challenges and limitations of FIB/SEM tomography characterization of PEM fuel cell CLs is provided. |
| doi_str_mv | 10.1016/j.electacta.2012.08.082 |
| format | Article |
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| subjects | Applied sciences Catalyst layer Charge transfer Chemistry Computer simulation Electrochemistry Energy Energy. Thermal use of fuels Equipments for energy generation and conversion: thermal, electrical, mechanical energy, etc Exact sciences and technology FIB Fuel cells General and physical chemistry Ion beams Mass transfer PEM fuel cell Scanning electron microscopy SEM Tomography Transport properties |
| title | PEM fuel cell CL characterization using a standalone FIB and SEM: Experiments and simulation |
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