Temperature considerations on Hall Effect sensors current-related sensitivity behaviour

The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity behavior. To this purpose, an analysis of the factors affecting the sensors current-related sensitivity is performed, consisting of several pertinent considerations. An analytical investigation of the...

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Veröffentlicht in:Analog integrated circuits and signal processing 2013-12, Vol.77 (3), p.355-364
Hauptverfasser: Paun, Maria-Alexandra, Sallese, Jean-Michel, Kayal, Maher
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creator Paun, Maria-Alexandra
Sallese, Jean-Michel
Kayal, Maher
description The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity behavior. To this purpose, an analysis of the factors affecting the sensors current-related sensitivity is performed, consisting of several pertinent considerations. An analytical investigation of the carrier concentration temperature dependence including the freeze-out effect influence was performed. This information was subsequently included in accurate prediction of the current-related sensitivity temperature behavior. For a specific CMOS integration process of the Hall sensors, a parabolic curve is obtained for the relative variation of the current-related sensitivity.
doi_str_mv 10.1007/s10470-013-0188-6
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1506367962</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1506367962</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-284077c19f07badb2ecd03c96825eeeaa9e4639ccf9f34578bd9f048da50688a3</originalsourceid><addsrcrecordid>eNp9kMtOwzAQRS0EEqXwAeyyZGMYx4kfS1QVioTEpoil5ToTcJUmxXYq9e9xCWsWo3no3JHuJeSWwT0DkA-RQSWBAuO5lKLijMxYLTllWupzMgNd1pQBh0tyFeMWAEpZwYx8rHG3x2DTGLBwQx99c9p8noqhL1a264pl26JLRcQ-DiEWbgwB-0QDdjZh83v3yR98OhYb_LIHP4zhmly0tot489fn5P1puV6s6Ovb88vi8ZU6LqpES1WBlI7pFuTGNpsSXQPcaaHKGhGt1VgJrp1rdcurWqpNk9FKNbYGoZTlc3I3_d2H4XvEmMzOR4ddZ3scxmhY5riQWpQZZRPqwhBjwNbsg9_ZcDQMzClEM4VocojmFKIRWVNOmpjZ_hOD2WZzfXb0j-gHzGF2nQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1506367962</pqid></control><display><type>article</type><title>Temperature considerations on Hall Effect sensors current-related sensitivity behaviour</title><source>SpringerLink Journals - AutoHoldings</source><creator>Paun, Maria-Alexandra ; Sallese, Jean-Michel ; Kayal, Maher</creator><creatorcontrib>Paun, Maria-Alexandra ; Sallese, Jean-Michel ; Kayal, Maher</creatorcontrib><description>The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity behavior. To this purpose, an analysis of the factors affecting the sensors current-related sensitivity is performed, consisting of several pertinent considerations. An analytical investigation of the carrier concentration temperature dependence including the freeze-out effect influence was performed. This information was subsequently included in accurate prediction of the current-related sensitivity temperature behavior. For a specific CMOS integration process of the Hall sensors, a parabolic curve is obtained for the relative variation of the current-related sensitivity.</description><identifier>ISSN: 0925-1030</identifier><identifier>EISSN: 1573-1979</identifier><identifier>DOI: 10.1007/s10470-013-0188-6</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Circuits and Systems ; Electrical Engineering ; Engineering ; Signal,Image and Speech Processing</subject><ispartof>Analog integrated circuits and signal processing, 2013-12, Vol.77 (3), p.355-364</ispartof><rights>Springer Science+Business Media New York 2013</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-284077c19f07badb2ecd03c96825eeeaa9e4639ccf9f34578bd9f048da50688a3</citedby><cites>FETCH-LOGICAL-c364t-284077c19f07badb2ecd03c96825eeeaa9e4639ccf9f34578bd9f048da50688a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10470-013-0188-6$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10470-013-0188-6$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Paun, Maria-Alexandra</creatorcontrib><creatorcontrib>Sallese, Jean-Michel</creatorcontrib><creatorcontrib>Kayal, Maher</creatorcontrib><title>Temperature considerations on Hall Effect sensors current-related sensitivity behaviour</title><title>Analog integrated circuits and signal processing</title><addtitle>Analog Integr Circ Sig Process</addtitle><description>The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity behavior. To this purpose, an analysis of the factors affecting the sensors current-related sensitivity is performed, consisting of several pertinent considerations. An analytical investigation of the carrier concentration temperature dependence including the freeze-out effect influence was performed. This information was subsequently included in accurate prediction of the current-related sensitivity temperature behavior. For a specific CMOS integration process of the Hall sensors, a parabolic curve is obtained for the relative variation of the current-related sensitivity.</description><subject>Circuits and Systems</subject><subject>Electrical Engineering</subject><subject>Engineering</subject><subject>Signal,Image and Speech Processing</subject><issn>0925-1030</issn><issn>1573-1979</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOwzAQRS0EEqXwAeyyZGMYx4kfS1QVioTEpoil5ToTcJUmxXYq9e9xCWsWo3no3JHuJeSWwT0DkA-RQSWBAuO5lKLijMxYLTllWupzMgNd1pQBh0tyFeMWAEpZwYx8rHG3x2DTGLBwQx99c9p8noqhL1a264pl26JLRcQ-DiEWbgwB-0QDdjZh83v3yR98OhYb_LIHP4zhmly0tot489fn5P1puV6s6Ovb88vi8ZU6LqpES1WBlI7pFuTGNpsSXQPcaaHKGhGt1VgJrp1rdcurWqpNk9FKNbYGoZTlc3I3_d2H4XvEmMzOR4ddZ3scxmhY5riQWpQZZRPqwhBjwNbsg9_ZcDQMzClEM4VocojmFKIRWVNOmpjZ_hOD2WZzfXb0j-gHzGF2nQ</recordid><startdate>20131201</startdate><enddate>20131201</enddate><creator>Paun, Maria-Alexandra</creator><creator>Sallese, Jean-Michel</creator><creator>Kayal, Maher</creator><general>Springer US</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7TG</scope><scope>KL.</scope></search><sort><creationdate>20131201</creationdate><title>Temperature considerations on Hall Effect sensors current-related sensitivity behaviour</title><author>Paun, Maria-Alexandra ; Sallese, Jean-Michel ; Kayal, Maher</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-284077c19f07badb2ecd03c96825eeeaa9e4639ccf9f34578bd9f048da50688a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Circuits and Systems</topic><topic>Electrical Engineering</topic><topic>Engineering</topic><topic>Signal,Image and Speech Processing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Paun, Maria-Alexandra</creatorcontrib><creatorcontrib>Sallese, Jean-Michel</creatorcontrib><creatorcontrib>Kayal, Maher</creatorcontrib><collection>CrossRef</collection><collection>Meteorological &amp; Geoastrophysical Abstracts</collection><collection>Meteorological &amp; Geoastrophysical Abstracts - Academic</collection><jtitle>Analog integrated circuits and signal processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Paun, Maria-Alexandra</au><au>Sallese, Jean-Michel</au><au>Kayal, Maher</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature considerations on Hall Effect sensors current-related sensitivity behaviour</atitle><jtitle>Analog integrated circuits and signal processing</jtitle><stitle>Analog Integr Circ Sig Process</stitle><date>2013-12-01</date><risdate>2013</risdate><volume>77</volume><issue>3</issue><spage>355</spage><epage>364</epage><pages>355-364</pages><issn>0925-1030</issn><eissn>1573-1979</eissn><abstract>The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity behavior. To this purpose, an analysis of the factors affecting the sensors current-related sensitivity is performed, consisting of several pertinent considerations. An analytical investigation of the carrier concentration temperature dependence including the freeze-out effect influence was performed. This information was subsequently included in accurate prediction of the current-related sensitivity temperature behavior. For a specific CMOS integration process of the Hall sensors, a parabolic curve is obtained for the relative variation of the current-related sensitivity.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s10470-013-0188-6</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record>
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subjects Circuits and Systems
Electrical Engineering
Engineering
Signal,Image and Speech Processing
title Temperature considerations on Hall Effect sensors current-related sensitivity behaviour
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T18%3A55%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Temperature%20considerations%20on%20Hall%20Effect%20sensors%20current-related%20sensitivity%20behaviour&rft.jtitle=Analog%20integrated%20circuits%20and%20signal%20processing&rft.au=Paun,%20Maria-Alexandra&rft.date=2013-12-01&rft.volume=77&rft.issue=3&rft.spage=355&rft.epage=364&rft.pages=355-364&rft.issn=0925-1030&rft.eissn=1573-1979&rft_id=info:doi/10.1007/s10470-013-0188-6&rft_dat=%3Cproquest_cross%3E1506367962%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1506367962&rft_id=info:pmid/&rfr_iscdi=true