Probing Symmetry Properties of Few-Layer MoS2 and h‑BN by Optical Second-Harmonic Generation

We have measured optical second-harmonic generation (SHG) from atomically thin samples of MoS2 and h-BN with one to five layers. We observe strong SHG from materials with odd layer thickness, for which a noncentrosymmetric structure is expected, while the centrosymmetric materials with even layer th...

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Veröffentlicht in:Nano Letters 2013-07, Vol.13 (7), p.3329-3333
Hauptverfasser: Li, Yilei, Rao, Yi, Mak, Kin Fai, You, Yumeng, Wang, Shuyuan, Dean, Cory R, Heinz, Tony F
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Sprache:eng
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Zusammenfassung:We have measured optical second-harmonic generation (SHG) from atomically thin samples of MoS2 and h-BN with one to five layers. We observe strong SHG from materials with odd layer thickness, for which a noncentrosymmetric structure is expected, while the centrosymmetric materials with even layer thickness do not yield appreciable SHG. SHG for materials with odd layer thickness was measured as a function of crystal orientation. This dependence reveals the rotational symmetry of the lattice and is shown to provide a purely optical method of determining the orientation of crystallographic axes. We report values for the nonlinearity of monolayers and odd-layers of MoS2 and h-BN and compare the variation as a function of layer thickness with a model that accounts for wave propagation effects.
ISSN:1530-6984
1530-6992
DOI:10.1021/nl401561r