Enhanced light element imaging in atomic resolution scanning transmission electron microscopy

We show that an imaging mode based on taking the difference between signals recorded from the bright field (forward scattering region) in atomic resolution scanning transmission electron microscopy provides an enhancement of the detectability of light elements over existing techniques. In some insta...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Ultramicroscopy 2014-01, Vol.136, p.31-41
Hauptverfasser:	Findlay, S.D., Kohno, Y., Cardamone, L.A., Ikuhara, Y., Shibata, N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Annular bright field (ABF) Atomic resolution imaging Scanning transmission electron microscopy (STEM)
Online-Zugang:	Volltext
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