Sub-Micron-Wide Surficial Trench Frames to Define the Coating Areas of Sensitive Layers on Silicon MEMS Resonant Chemical Sensors
SUMMARY We propose a new processing method to form thin films on the predefined micro‐areas of movable parts of microdevices by using trench frames on the device surfaces in the coating of solutions containing the membrane materials. We fabricated 500‐nm‐wide surficial trench frames additively on si...
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Veröffentlicht in: | Electronics and communications in Japan 2013-10, Vol.96 (10), p.60-66 |
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creator | Murakami, Sunao Ikehara, Tsuyoshi Konno, Mitsuo Maeda, Ryutaro Fukawa, Tadashi Kimura, Mutsumi Mihara, Takashi |
description | SUMMARY
We propose a new processing method to form thin films on the predefined micro‐areas of movable parts of microdevices by using trench frames on the device surfaces in the coating of solutions containing the membrane materials. We fabricated 500‐nm‐wide surficial trench frames additively on silicon microcantilevers to define the areas coated with the thin films by increasing the tolerance to protrusion of a liquid droplet from the edge in the coating process. The trench frames were fabricated on the silicon surfaces by deep‐reactive ion etching with the resist mask patterned by electron beam lithography. We also fabricated the same trench frames on planar silicon substrates, and we examined the proper conditions for the formation of polybutadiene (PBD) thin films on the framed surfaces by coating PBD solution using a microdispenser system. When the n‐dodecane solution of PBD was applied to the micro‐area framed by the trenches, PBD film was successfully defined within the framed area. The trench frames fabricated on the cantilevers indicated the practical effectiveness to define the PBD thin films within the framed micro‐areas. © 2013 Wiley Periodicals, Inc. Electron Comm Jpn, 96(10): 60–66, 2013; Published online in Wiley Online Library (wileyonlinelibrary.com). DOI 10.1002/ecj.11379 |
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We propose a new processing method to form thin films on the predefined micro‐areas of movable parts of microdevices by using trench frames on the device surfaces in the coating of solutions containing the membrane materials. We fabricated 500‐nm‐wide surficial trench frames additively on silicon microcantilevers to define the areas coated with the thin films by increasing the tolerance to protrusion of a liquid droplet from the edge in the coating process. The trench frames were fabricated on the silicon surfaces by deep‐reactive ion etching with the resist mask patterned by electron beam lithography. We also fabricated the same trench frames on planar silicon substrates, and we examined the proper conditions for the formation of polybutadiene (PBD) thin films on the framed surfaces by coating PBD solution using a microdispenser system. When the n‐dodecane solution of PBD was applied to the micro‐area framed by the trenches, PBD film was successfully defined within the framed area. The trench frames fabricated on the cantilevers indicated the practical effectiveness to define the PBD thin films within the framed micro‐areas. © 2013 Wiley Periodicals, Inc. Electron Comm Jpn, 96(10): 60–66, 2013; Published online in Wiley Online Library (wileyonlinelibrary.com). DOI 10.1002/ecj.11379</description><identifier>ISSN: 1942-9533</identifier><identifier>EISSN: 1942-9541</identifier><identifier>DOI: 10.1002/ecj.11379</identifier><language>eng</language><publisher>Hoboken: Wiley Subscription Services, Inc., A Wiley Company</publisher><subject>cantilever ; chemical sensor ; Coating ; Devices ; Droplets ; Electron beam lithography ; Frames ; polymer coating ; Silicon ; silicon resonator ; surficial micropattern ; Thin films ; Trenches</subject><ispartof>Electronics and communications in Japan, 2013-10, Vol.96 (10), p.60-66</ispartof><rights>2013 Wiley Periodicals, Inc.</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c3669-f0e41ef915ef9a2958bebbb711a51d01f0c812ae24e2fa43cb4aee8c997e6ebd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fecj.11379$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fecj.11379$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27903,27904,45553,45554</link.rule.ids></links><search><creatorcontrib>Murakami, Sunao</creatorcontrib><creatorcontrib>Ikehara, Tsuyoshi</creatorcontrib><creatorcontrib>Konno, Mitsuo</creatorcontrib><creatorcontrib>Maeda, Ryutaro</creatorcontrib><creatorcontrib>Fukawa, Tadashi</creatorcontrib><creatorcontrib>Kimura, Mutsumi</creatorcontrib><creatorcontrib>Mihara, Takashi</creatorcontrib><title>Sub-Micron-Wide Surficial Trench Frames to Define the Coating Areas of Sensitive Layers on Silicon MEMS Resonant Chemical Sensors</title><title>Electronics and communications in Japan</title><addtitle>Electron. Comm. Jpn</addtitle><description>SUMMARY
We propose a new processing method to form thin films on the predefined micro‐areas of movable parts of microdevices by using trench frames on the device surfaces in the coating of solutions containing the membrane materials. We fabricated 500‐nm‐wide surficial trench frames additively on silicon microcantilevers to define the areas coated with the thin films by increasing the tolerance to protrusion of a liquid droplet from the edge in the coating process. The trench frames were fabricated on the silicon surfaces by deep‐reactive ion etching with the resist mask patterned by electron beam lithography. We also fabricated the same trench frames on planar silicon substrates, and we examined the proper conditions for the formation of polybutadiene (PBD) thin films on the framed surfaces by coating PBD solution using a microdispenser system. When the n‐dodecane solution of PBD was applied to the micro‐area framed by the trenches, PBD film was successfully defined within the framed area. The trench frames fabricated on the cantilevers indicated the practical effectiveness to define the PBD thin films within the framed micro‐areas. © 2013 Wiley Periodicals, Inc. Electron Comm Jpn, 96(10): 60–66, 2013; Published online in Wiley Online Library (wileyonlinelibrary.com). DOI 10.1002/ecj.11379</description><subject>cantilever</subject><subject>chemical sensor</subject><subject>Coating</subject><subject>Devices</subject><subject>Droplets</subject><subject>Electron beam lithography</subject><subject>Frames</subject><subject>polymer coating</subject><subject>Silicon</subject><subject>silicon resonator</subject><subject>surficial micropattern</subject><subject>Thin films</subject><subject>Trenches</subject><issn>1942-9533</issn><issn>1942-9541</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp1kD1PwzAQhiMEEp8D_8AjDCl27HyNVWgLpQVEihgtxz1Tl9Qpdgp05J_jUmBjufd0et4bniA4JbhDMI4uQM47hNA03wkOSM6iMI8Z2f3bKd0PDp2bY5ywmNGD4LNcVeFYS9uY8ElPAZUrq7TUokYTC0bOUN-KBTjUNugSlDaA2hmgohGtNs-oa0E41ChUgnG61W-ARmIN1t8MKnWtpc9xb1yiB3CNEaZFxQwWWvr_m0pj3XGwp0Tt4OQnj4LHfm9SXIWju8F10R2FkiZJHioMjIDKSeyHiPI4q6CqqpQQEZMpJgrLjEQCIgaREozKigmATOZ5CglUU3oUnG3_Lm3zugLX8oV2EupaGGhWjhPmlcRRRjOPnm9Rr8U5C4ovrV4Iu-YE841m7jXzb82evdiy77qG9f8g7xXD30a4bWjXwsdfQ9gXnqQ0jfnT7YCPJ0l2Mxzcc0y_AItijxI</recordid><startdate>201310</startdate><enddate>201310</enddate><creator>Murakami, Sunao</creator><creator>Ikehara, Tsuyoshi</creator><creator>Konno, Mitsuo</creator><creator>Maeda, Ryutaro</creator><creator>Fukawa, Tadashi</creator><creator>Kimura, Mutsumi</creator><creator>Mihara, Takashi</creator><general>Wiley Subscription Services, Inc., A Wiley Company</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>201310</creationdate><title>Sub-Micron-Wide Surficial Trench Frames to Define the Coating Areas of Sensitive Layers on Silicon MEMS Resonant Chemical Sensors</title><author>Murakami, Sunao ; Ikehara, Tsuyoshi ; Konno, Mitsuo ; Maeda, Ryutaro ; Fukawa, Tadashi ; Kimura, Mutsumi ; Mihara, Takashi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3669-f0e41ef915ef9a2958bebbb711a51d01f0c812ae24e2fa43cb4aee8c997e6ebd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>cantilever</topic><topic>chemical sensor</topic><topic>Coating</topic><topic>Devices</topic><topic>Droplets</topic><topic>Electron beam lithography</topic><topic>Frames</topic><topic>polymer coating</topic><topic>Silicon</topic><topic>silicon resonator</topic><topic>surficial micropattern</topic><topic>Thin films</topic><topic>Trenches</topic><toplevel>online_resources</toplevel><creatorcontrib>Murakami, Sunao</creatorcontrib><creatorcontrib>Ikehara, Tsuyoshi</creatorcontrib><creatorcontrib>Konno, Mitsuo</creatorcontrib><creatorcontrib>Maeda, Ryutaro</creatorcontrib><creatorcontrib>Fukawa, Tadashi</creatorcontrib><creatorcontrib>Kimura, Mutsumi</creatorcontrib><creatorcontrib>Mihara, Takashi</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Electronics and communications in Japan</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Murakami, Sunao</au><au>Ikehara, Tsuyoshi</au><au>Konno, Mitsuo</au><au>Maeda, Ryutaro</au><au>Fukawa, Tadashi</au><au>Kimura, Mutsumi</au><au>Mihara, Takashi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sub-Micron-Wide Surficial Trench Frames to Define the Coating Areas of Sensitive Layers on Silicon MEMS Resonant Chemical Sensors</atitle><jtitle>Electronics and communications in Japan</jtitle><addtitle>Electron. Comm. Jpn</addtitle><date>2013-10</date><risdate>2013</risdate><volume>96</volume><issue>10</issue><spage>60</spage><epage>66</epage><pages>60-66</pages><issn>1942-9533</issn><eissn>1942-9541</eissn><abstract>SUMMARY
We propose a new processing method to form thin films on the predefined micro‐areas of movable parts of microdevices by using trench frames on the device surfaces in the coating of solutions containing the membrane materials. We fabricated 500‐nm‐wide surficial trench frames additively on silicon microcantilevers to define the areas coated with the thin films by increasing the tolerance to protrusion of a liquid droplet from the edge in the coating process. The trench frames were fabricated on the silicon surfaces by deep‐reactive ion etching with the resist mask patterned by electron beam lithography. We also fabricated the same trench frames on planar silicon substrates, and we examined the proper conditions for the formation of polybutadiene (PBD) thin films on the framed surfaces by coating PBD solution using a microdispenser system. When the n‐dodecane solution of PBD was applied to the micro‐area framed by the trenches, PBD film was successfully defined within the framed area. The trench frames fabricated on the cantilevers indicated the practical effectiveness to define the PBD thin films within the framed micro‐areas. © 2013 Wiley Periodicals, Inc. Electron Comm Jpn, 96(10): 60–66, 2013; Published online in Wiley Online Library (wileyonlinelibrary.com). DOI 10.1002/ecj.11379</abstract><cop>Hoboken</cop><pub>Wiley Subscription Services, Inc., A Wiley Company</pub><doi>10.1002/ecj.11379</doi><tpages>7</tpages></addata></record> |
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subjects | cantilever chemical sensor Coating Devices Droplets Electron beam lithography Frames polymer coating Silicon silicon resonator surficial micropattern Thin films Trenches |
title | Sub-Micron-Wide Surficial Trench Frames to Define the Coating Areas of Sensitive Layers on Silicon MEMS Resonant Chemical Sensors |
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