Relative ion yields measured with a high-resolution glow discharge mass spectrometer operated with an argon/hydrogen mixture
Quantitative elemental analysis by glow discharge mass spectrometry (GDMS) requires a calibration factor for each element. The calibration factors used in the present work are called relative ion yields (RIYs). The RIYs of each of 19 elements within samples of four National Institute of Standards an...
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| Veröffentlicht in: | Journal of the American Society for Mass Spectrometry 1993-03, Vol.4 (3), p.278-285 |
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| creator | Smithwick, R.W. Lynch, D.W. Franklin, J.C. |
| description | Quantitative elemental analysis by glow discharge mass spectrometry (GDMS) requires a calibration factor for each element. The calibration factors used in the present work are called relative ion yields (RIYs). The RIYs of each of 19 elements within samples of four National Institute of Standards and Technology steel reference materials (nos. 661-664) were measured using pure argon and an argon mixture containing 1.0% hydrogen by volume. The RIYs measured using pure argon correlated within a factor of approximately 2–3 to the RIYs calculated by a theoretical model. The RIYs measured for these 19 elements using the argon mixture containing 1.0% hydrogen correlated within a factor of approximately 1.3 to the calculated RIYs. These results may have significant analytical potential with respect to GDMS and may have application to other plasma techniques. |
| doi_str_mv | 10.1016/1044-0305(93)85092-C |
| format | Article |
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| subjects | Analytical chemistry Chemistry Exact sciences and technology Spectrometric and optical methods |
| title | Relative ion yields measured with a high-resolution glow discharge mass spectrometer operated with an argon/hydrogen mixture |
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