$Verification of effective refraction index approach to the surface plasmon propagation in ultrathin tapered metal–dielectric–metal slot waveguides$

Verification of effective refraction index approach to the surface plasmon propagation in ultrathin tapered metal–dielectric–metal slot waveguides

We verify the effective refraction index approach (ERIA) developed for surface plasmon propagation in ultrathin tapered metal-dielectric-metal slot waveguides by means of comparison of exact solutions obtained within ERIA for two different profiles and different scales of tapering with finite-differ...

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Veröffentlicht in:	Journal of the Optical Society of America. B, Optical physics Optical physics, 2013-06, Vol.30 (6), p.1601-1605
Hauptverfasser:	Zharov, Alexander A., Smirnova, Daria A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer simulation Finite difference method Mathematical analysis Plasmons Refraction Tapering Wave propagation Waveguides
Online-Zugang:	Volltext
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