Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis
Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-z...
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Veröffentlicht in: | Bulletin of the Polish Academy of Sciences. Technical sciences 2013-06, Vol.61 (2), p.535-539 |
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Sprache: | eng |
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