Identification of orbital measurements of spacecraft
A new approach to identifying orbital measurements of spacecraft is proposed that does not require estimation of systematic errors. Here the monitoring discrepancy includes the difference of two successive measurements and extrapolation estimates. As a result, the unknown systematic errors are mutua...
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Veröffentlicht in: | Measurement techniques 2013-02, Vol.55 (11), p.1234-1239 |
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description | A new approach to identifying orbital measurements of spacecraft is proposed that does not require estimation of systematic errors. Here the monitoring discrepancy includes the difference of two successive measurements and extrapolation estimates. As a result, the unknown systematic errors are mutually eliminated, so it is possible to identify the measurements without knowing the magnitudes and signs of the systematic errors. |
doi_str_mv | 10.1007/s11018-013-0122-4 |
format | Article |
fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_miscellaneous_1429892560</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A373677625</galeid><sourcerecordid>A373677625</sourcerecordid><originalsourceid>FETCH-LOGICAL-c374t-5c317972f2ef4f2b0e6fef41515f292e21899480aa2d876be1015021d2ea4dfa3</originalsourceid><addsrcrecordid>eNp1kV1rHCEUhiU0kO0mPyB3C7lpL2br8WOcuVxCkywECk1yLa5zXFxmxq060P77uEwukkARUY7Po0deQq6BroFS9SMBUGgqCrxMxipxRhYgFa-altZfyIJKwStoFbsgX1M6UEq5qtsFEdsOx-ydtyb7MK6CW4W489n0qwFNmiIO5Tyd6uloLNpoXL4k5870Ca_e1iV5ufv5fPtQPf66395uHivLlciVtBxUedIxdMKxHcXalR1IkI61DBk0bSsaagzrGlXvsHxBUgYdQyM6Z_iSfJvvPcbwZ8KU9eCTxb43I4YpaRCsbVoma1rQm0_oIUxxLN0VCpiQVMm6UOuZ2psetR9dyNHYMjocvA0jOl_qG654rVTNZBG-fxAKk_Fv3pspJb19-v2RhZm1MaQU0elj9IOJ_zRQfQpJzyHpEpI-haRFcdjspMKOe4zv2v6v9ApUZZE9</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1412450756</pqid></control><display><type>article</type><title>Identification of orbital measurements of spacecraft</title><source>Springer Nature - Complete Springer Journals</source><creator>Hajiyev, Ch. M.</creator><creatorcontrib>Hajiyev, Ch. M.</creatorcontrib><description>A new approach to identifying orbital measurements of spacecraft is proposed that does not require estimation of systematic errors. Here the monitoring discrepancy includes the difference of two successive measurements and extrapolation estimates. As a result, the unknown systematic errors are mutually eliminated, so it is possible to identify the measurements without knowing the magnitudes and signs of the systematic errors.</description><identifier>ISSN: 0543-1972</identifier><identifier>EISSN: 1573-8906</identifier><identifier>DOI: 10.1007/s11018-013-0122-4</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Analysis ; Analytical Chemistry ; Characterization and Evaluation of Materials ; Errors ; Estimates ; Extrapolation ; Identification ; Kalman filters ; Measurement ; Measurement Science and Instrumentation ; Measurement techniques ; Monitoring ; Orbitals ; Orbits ; Physical Chemistry ; Physics ; Physics and Astronomy ; Probability ; Space ships ; Space vehicles ; Spacecraft ; Statistical analysis ; Studies ; Systematic errors</subject><ispartof>Measurement techniques, 2013-02, Vol.55 (11), p.1234-1239</ispartof><rights>Springer Science+Business Media New York 2013</rights><rights>COPYRIGHT 2013 Springer</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c374t-5c317972f2ef4f2b0e6fef41515f292e21899480aa2d876be1015021d2ea4dfa3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11018-013-0122-4$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11018-013-0122-4$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51298</link.rule.ids></links><search><creatorcontrib>Hajiyev, Ch. M.</creatorcontrib><title>Identification of orbital measurements of spacecraft</title><title>Measurement techniques</title><addtitle>Meas Tech</addtitle><description>A new approach to identifying orbital measurements of spacecraft is proposed that does not require estimation of systematic errors. Here the monitoring discrepancy includes the difference of two successive measurements and extrapolation estimates. As a result, the unknown systematic errors are mutually eliminated, so it is possible to identify the measurements without knowing the magnitudes and signs of the systematic errors.</description><subject>Analysis</subject><subject>Analytical Chemistry</subject><subject>Characterization and Evaluation of Materials</subject><subject>Errors</subject><subject>Estimates</subject><subject>Extrapolation</subject><subject>Identification</subject><subject>Kalman filters</subject><subject>Measurement</subject><subject>Measurement Science and Instrumentation</subject><subject>Measurement techniques</subject><subject>Monitoring</subject><subject>Orbitals</subject><subject>Orbits</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Probability</subject><subject>Space ships</subject><subject>Space vehicles</subject><subject>Spacecraft</subject><subject>Statistical analysis</subject><subject>Studies</subject><subject>Systematic errors</subject><issn>0543-1972</issn><issn>1573-8906</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kV1rHCEUhiU0kO0mPyB3C7lpL2br8WOcuVxCkywECk1yLa5zXFxmxq060P77uEwukkARUY7Po0deQq6BroFS9SMBUGgqCrxMxipxRhYgFa-altZfyIJKwStoFbsgX1M6UEq5qtsFEdsOx-ydtyb7MK6CW4W489n0qwFNmiIO5Tyd6uloLNpoXL4k5870Ca_e1iV5ufv5fPtQPf66395uHivLlciVtBxUedIxdMKxHcXalR1IkI61DBk0bSsaagzrGlXvsHxBUgYdQyM6Z_iSfJvvPcbwZ8KU9eCTxb43I4YpaRCsbVoma1rQm0_oIUxxLN0VCpiQVMm6UOuZ2psetR9dyNHYMjocvA0jOl_qG654rVTNZBG-fxAKk_Fv3pspJb19-v2RhZm1MaQU0elj9IOJ_zRQfQpJzyHpEpI-haRFcdjspMKOe4zv2v6v9ApUZZE9</recordid><startdate>20130201</startdate><enddate>20130201</enddate><creator>Hajiyev, Ch. M.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><scope>3V.</scope><scope>7U5</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>88I</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>L7M</scope><scope>M0C</scope><scope>M0N</scope><scope>M2P</scope><scope>M7S</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope><scope>7TB</scope><scope>FR3</scope><scope>H8D</scope></search><sort><creationdate>20130201</creationdate><title>Identification of orbital measurements of spacecraft</title><author>Hajiyev, Ch. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c374t-5c317972f2ef4f2b0e6fef41515f292e21899480aa2d876be1015021d2ea4dfa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Analysis</topic><topic>Analytical Chemistry</topic><topic>Characterization and Evaluation of Materials</topic><topic>Errors</topic><topic>Estimates</topic><topic>Extrapolation</topic><topic>Identification</topic><topic>Kalman filters</topic><topic>Measurement</topic><topic>Measurement Science and Instrumentation</topic><topic>Measurement techniques</topic><topic>Monitoring</topic><topic>Orbitals</topic><topic>Orbits</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Probability</topic><topic>Space ships</topic><topic>Space vehicles</topic><topic>Spacecraft</topic><topic>Statistical analysis</topic><topic>Studies</topic><topic>Systematic errors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hajiyev, Ch. M.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><jtitle>Measurement techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hajiyev, Ch. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Identification of orbital measurements of spacecraft</atitle><jtitle>Measurement techniques</jtitle><stitle>Meas Tech</stitle><date>2013-02-01</date><risdate>2013</risdate><volume>55</volume><issue>11</issue><spage>1234</spage><epage>1239</epage><pages>1234-1239</pages><issn>0543-1972</issn><eissn>1573-8906</eissn><abstract>A new approach to identifying orbital measurements of spacecraft is proposed that does not require estimation of systematic errors. Here the monitoring discrepancy includes the difference of two successive measurements and extrapolation estimates. As a result, the unknown systematic errors are mutually eliminated, so it is possible to identify the measurements without knowing the magnitudes and signs of the systematic errors.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11018-013-0122-4</doi><tpages>6</tpages></addata></record> |
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subjects | Analysis Analytical Chemistry Characterization and Evaluation of Materials Errors Estimates Extrapolation Identification Kalman filters Measurement Measurement Science and Instrumentation Measurement techniques Monitoring Orbitals Orbits Physical Chemistry Physics Physics and Astronomy Probability Space ships Space vehicles Spacecraft Statistical analysis Studies Systematic errors |
title | Identification of orbital measurements of spacecraft |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T18%3A30%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Identification%20of%20orbital%20measurements%20of%20spacecraft&rft.jtitle=Measurement%20techniques&rft.au=Hajiyev,%20Ch.%20M.&rft.date=2013-02-01&rft.volume=55&rft.issue=11&rft.spage=1234&rft.epage=1239&rft.pages=1234-1239&rft.issn=0543-1972&rft.eissn=1573-8906&rft_id=info:doi/10.1007/s11018-013-0122-4&rft_dat=%3Cgale_proqu%3EA373677625%3C/gale_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1412450756&rft_id=info:pmid/&rft_galeid=A373677625&rfr_iscdi=true |