Magnetic Near-Field Probes With High-Pass and Notch Filters for Electric Field Suppression
Several new types of low-cost and robust magnetic near-field probes manufactured in low-temperature co-fired ceramics (LTCC) are presented in this paper. Parallel C-shaped strips and their variations are inserted into the loop area in the front end of probes to achieve common-mode high-pass and notc...
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Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2013-06, Vol.61 (6), p.2460-2470 |
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description | Several new types of low-cost and robust magnetic near-field probes manufactured in low-temperature co-fired ceramics (LTCC) are presented in this paper. Parallel C-shaped strips and their variations are inserted into the loop area in the front end of probes to achieve common-mode high-pass and notch filters for electric-field noise suppression. These probes with this kind of filter have excellent wideband electric field suppression. They are called high electric field suppression probes type A ~ D. The size of loop aperture in all probes is 100 μm long and 400 μm wide. The signal received from the loop is routed to a measurement apparatus through a semi-rigid coaxial cable with an outer diameter of 0.047 in. The flip-chip junction with low loss and good shielding is used between the probe head in LTCC and the semi-rigid coaxial cable. We take the probes over a 2000-μm-wide microstrip line as device-under-test to measure the probe characteristics. The isolation between electric and magnetic fields for a reference probe based on an old design using the same LTCC process is better than 30 dB from 0.05 to 12.65 GHz. The type A probe has two parallel C-shaped strips, it has better isolation of 35 dB from 0.1 to 11.05 GHz. Type C has one end of its strip shorted to ground, its 30-dB isolation frequency range can be extended to 0.05 ~ 17.8 GHz. With additional layout variation in type D, isolation can be improved to 40 dB up to 10.9 GHz. The spatial resolution for these probes is 140 μm when the distance between the metal surface of the microstrip line and the nearest edge of the loop is held at 120 μm. The calibration factors of the proposed probes are only slightly increased as compared with reference probe. |
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Parallel C-shaped strips and their variations are inserted into the loop area in the front end of probes to achieve common-mode high-pass and notch filters for electric-field noise suppression. These probes with this kind of filter have excellent wideband electric field suppression. They are called high electric field suppression probes type A ~ D. The size of loop aperture in all probes is 100 μm long and 400 μm wide. The signal received from the loop is routed to a measurement apparatus through a semi-rigid coaxial cable with an outer diameter of 0.047 in. The flip-chip junction with low loss and good shielding is used between the probe head in LTCC and the semi-rigid coaxial cable. We take the probes over a 2000-μm-wide microstrip line as device-under-test to measure the probe characteristics. The isolation between electric and magnetic fields for a reference probe based on an old design using the same LTCC process is better than 30 dB from 0.05 to 12.65 GHz. The type A probe has two parallel C-shaped strips, it has better isolation of 35 dB from 0.1 to 11.05 GHz. Type C has one end of its strip shorted to ground, its 30-dB isolation frequency range can be extended to 0.05 ~ 17.8 GHz. With additional layout variation in type D, isolation can be improved to 40 dB up to 10.9 GHz. The spatial resolution for these probes is 140 μm when the distance between the metal surface of the microstrip line and the nearest edge of the loop is held at 120 μm. The calibration factors of the proposed probes are only slightly increased as compared with reference probe.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2013.2258034</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Apertures ; Applied sciences ; Circuit properties ; Coaxial cables ; Common-mode high-pass and notch filter ; Couplings ; Design. Technologies. Operation analysis. Testing ; electric field suppression ; Electric fields ; Electric, optical and optoelectronic circuits ; Electrical junctions ; Electromagnetic compatibility ; electromagnetic interference (EMI) ; Electronic circuits ; Electronics ; Exact sciences and technology ; Frequency filters ; high spatial resolution ; Information, signal and communications theory ; Integrated circuits ; magnetic near-field probe ; Magnetic noise ; Magnetic separation ; Magnetic shielding ; Materials ; Microstrip ; Microstrip lines ; Noise levels ; Notch filters ; Probes ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Strip ; Telecommunications and information theory</subject><ispartof>IEEE transactions on microwave theory and techniques, 2013-06, Vol.61 (6), p.2460-2470</ispartof><rights>2014 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2013</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c356t-98c37c377db45bfeaecec6bcdb44986b133b96b4dd03f1a756770454e95f1f633</citedby><cites>FETCH-LOGICAL-c356t-98c37c377db45bfeaecec6bcdb44986b133b96b4dd03f1a756770454e95f1f633</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6509967$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27915,27916,54749</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6509967$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27483849$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>CHOU, Yien-Tien</creatorcontrib><creatorcontrib>LU, Hsin-Chia</creatorcontrib><title>Magnetic Near-Field Probes With High-Pass and Notch Filters for Electric Field Suppression</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>Several new types of low-cost and robust magnetic near-field probes manufactured in low-temperature co-fired ceramics (LTCC) are presented in this paper. Parallel C-shaped strips and their variations are inserted into the loop area in the front end of probes to achieve common-mode high-pass and notch filters for electric-field noise suppression. These probes with this kind of filter have excellent wideband electric field suppression. They are called high electric field suppression probes type A ~ D. The size of loop aperture in all probes is 100 μm long and 400 μm wide. The signal received from the loop is routed to a measurement apparatus through a semi-rigid coaxial cable with an outer diameter of 0.047 in. The flip-chip junction with low loss and good shielding is used between the probe head in LTCC and the semi-rigid coaxial cable. We take the probes over a 2000-μm-wide microstrip line as device-under-test to measure the probe characteristics. The isolation between electric and magnetic fields for a reference probe based on an old design using the same LTCC process is better than 30 dB from 0.05 to 12.65 GHz. The type A probe has two parallel C-shaped strips, it has better isolation of 35 dB from 0.1 to 11.05 GHz. Type C has one end of its strip shorted to ground, its 30-dB isolation frequency range can be extended to 0.05 ~ 17.8 GHz. With additional layout variation in type D, isolation can be improved to 40 dB up to 10.9 GHz. The spatial resolution for these probes is 140 μm when the distance between the metal surface of the microstrip line and the nearest edge of the loop is held at 120 μm. The calibration factors of the proposed probes are only slightly increased as compared with reference probe.</description><subject>Apertures</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Coaxial cables</subject><subject>Common-mode high-pass and notch filter</subject><subject>Couplings</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>electric field suppression</subject><subject>Electric fields</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electrical junctions</subject><subject>Electromagnetic compatibility</subject><subject>electromagnetic interference (EMI)</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency filters</subject><subject>high spatial resolution</subject><subject>Information, signal and communications theory</subject><subject>Integrated circuits</subject><subject>magnetic near-field probe</subject><subject>Magnetic noise</subject><subject>Magnetic separation</subject><subject>Magnetic shielding</subject><subject>Materials</subject><subject>Microstrip</subject><subject>Microstrip lines</subject><subject>Noise levels</subject><subject>Notch filters</subject><subject>Probes</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Strip</subject><subject>Telecommunications and information theory</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkcFKAzEQhoMoWKsPIF4CInjZmjTJJjmKtFaoWrAieAnZ7KyNbHdrsnvw7U1p6UEIhCHfPzN8QeiSkhGlRN8tn5fL0ZhQNhqPhSKMH6EBFUJmOpfkGA0IoSrTXJFTdBbjdyq5IGqAPp_tVwOdd_gFbMimHuoSL0JbQMQfvlvhmf9aZQsbI7ZNiV_azq3w1NcdhIirNuBJDa4LKb-LvvWbTYAYfduco5PK1hEu9vcQvU8ny4dZNn99fHq4n2eOibzLtHJMpiPLgouiAgsOXF64VHKt8oIyVui84GVJWEWtFLmUhAsOWlS0yhkbottd301of3qInVn76KCubQNtHw3lVCrJFRcJvf6Hfrd9aNJ2hrJcbK1omSi6o1xoYwxQmU3waxt-DSVma9tsbZutbbO3nTI3-842OltXwTbOx0NwnOYzxXXirnacB4DDcxqt00exP4RGhzA</recordid><startdate>20130601</startdate><enddate>20130601</enddate><creator>CHOU, Yien-Tien</creator><creator>LU, Hsin-Chia</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7QQ</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope></search><sort><creationdate>20130601</creationdate><title>Magnetic Near-Field Probes With High-Pass and Notch Filters for Electric Field Suppression</title><author>CHOU, Yien-Tien ; LU, Hsin-Chia</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c356t-98c37c377db45bfeaecec6bcdb44986b133b96b4dd03f1a756770454e95f1f633</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Apertures</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Coaxial cables</topic><topic>Common-mode high-pass and notch filter</topic><topic>Couplings</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>electric field suppression</topic><topic>Electric fields</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electrical junctions</topic><topic>Electromagnetic compatibility</topic><topic>electromagnetic interference (EMI)</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency filters</topic><topic>high spatial resolution</topic><topic>Information, signal and communications theory</topic><topic>Integrated circuits</topic><topic>magnetic near-field probe</topic><topic>Magnetic noise</topic><topic>Magnetic separation</topic><topic>Magnetic shielding</topic><topic>Materials</topic><topic>Microstrip</topic><topic>Microstrip lines</topic><topic>Noise levels</topic><topic>Notch filters</topic><topic>Probes</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Strip</topic><topic>Telecommunications and information theory</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>CHOU, Yien-Tien</creatorcontrib><creatorcontrib>LU, Hsin-Chia</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Ceramic Abstracts</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHOU, Yien-Tien</au><au>LU, Hsin-Chia</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnetic Near-Field Probes With High-Pass and Notch Filters for Electric Field Suppression</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2013-06-01</date><risdate>2013</risdate><volume>61</volume><issue>6</issue><spage>2460</spage><epage>2470</epage><pages>2460-2470</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>Several new types of low-cost and robust magnetic near-field probes manufactured in low-temperature co-fired ceramics (LTCC) are presented in this paper. Parallel C-shaped strips and their variations are inserted into the loop area in the front end of probes to achieve common-mode high-pass and notch filters for electric-field noise suppression. These probes with this kind of filter have excellent wideband electric field suppression. They are called high electric field suppression probes type A ~ D. The size of loop aperture in all probes is 100 μm long and 400 μm wide. The signal received from the loop is routed to a measurement apparatus through a semi-rigid coaxial cable with an outer diameter of 0.047 in. The flip-chip junction with low loss and good shielding is used between the probe head in LTCC and the semi-rigid coaxial cable. We take the probes over a 2000-μm-wide microstrip line as device-under-test to measure the probe characteristics. The isolation between electric and magnetic fields for a reference probe based on an old design using the same LTCC process is better than 30 dB from 0.05 to 12.65 GHz. The type A probe has two parallel C-shaped strips, it has better isolation of 35 dB from 0.1 to 11.05 GHz. Type C has one end of its strip shorted to ground, its 30-dB isolation frequency range can be extended to 0.05 ~ 17.8 GHz. With additional layout variation in type D, isolation can be improved to 40 dB up to 10.9 GHz. The spatial resolution for these probes is 140 μm when the distance between the metal surface of the microstrip line and the nearest edge of the loop is held at 120 μm. The calibration factors of the proposed probes are only slightly increased as compared with reference probe.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMTT.2013.2258034</doi><tpages>11</tpages></addata></record> |
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subjects | Apertures Applied sciences Circuit properties Coaxial cables Common-mode high-pass and notch filter Couplings Design. Technologies. Operation analysis. Testing electric field suppression Electric fields Electric, optical and optoelectronic circuits Electrical junctions Electromagnetic compatibility electromagnetic interference (EMI) Electronic circuits Electronics Exact sciences and technology Frequency filters high spatial resolution Information, signal and communications theory Integrated circuits magnetic near-field probe Magnetic noise Magnetic separation Magnetic shielding Materials Microstrip Microstrip lines Noise levels Notch filters Probes Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Strip Telecommunications and information theory |
title | Magnetic Near-Field Probes With High-Pass and Notch Filters for Electric Field Suppression |
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