Incorporating Large-Scale FPAAs Into Analog Design and Test Courses

The development of large-scale field-programmable analog arrays (FPAAs) provides an excellent opportunity for expanding the capabilities of analog design courses and their laboratories. These devices allow the complete design and test cycle of an analog IC to be explored within the span of a single-...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on education 2008-08, Vol.51 (3), p.319-324
Hauptverfasser: Twigg, C.M., Hasler, P.E.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 324
container_issue 3
container_start_page 319
container_title IEEE transactions on education
container_volume 51
creator Twigg, C.M.
Hasler, P.E.
description The development of large-scale field-programmable analog arrays (FPAAs) provides an excellent opportunity for expanding the capabilities of analog design courses and their laboratories. These devices allow the complete design and test cycle of an analog IC to be explored within the span of a single-term course without being limited to prefabricated integrated circuits. A brief discussion of the authors' experience in incorporating the reconfigurable analog signal processor (RASP) into courses and workshops is presented.
doi_str_mv 10.1109/TE.2008.916762
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_1365155989</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4544801</ieee_id><sourcerecordid>1365155989</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-23aaa0ad90b6525a22a76d8733a885ad07ffb8fe0f06611b69f8e129e727840c3</originalsourceid><addsrcrecordid>eNpdkM1Lw0AQxRdRsFavXrwET14S9yP7dQyx1UJBwXhepskmpKTZupse_O9diXjwNAz83sx7D6FbgjNCsH6sVhnFWGWaCCnoGVoQzmWqBVPnaIExUalmXF-iqxD2cc055QtUbsba-aPzMPVjl2zBdzZ9r2GwyfqtKEKyGSeXFCMMrkuebOi7MYGxSSobpqR0Jx9suEYXLQzB3vzOJfpYr6ryJd2-Pm_KYpvWjOgppQwAMDQa70T8DZSCFI2SjIFSHBos23anWotbLAQhO6FbZQnVVlKpclyzJXqY7x69-zxFA-bQh9oOA4zWnYIhTPCYWSsd0ft_6D56jSmC0YTSnGkmI5TNUO1dCN625uj7A_gvQ7D5qdRUK_NTqZkrjYK7WdBba__gnOe5woR9Axnob0A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912243937</pqid></control><display><type>article</type><title>Incorporating Large-Scale FPAAs Into Analog Design and Test Courses</title><source>IEEE Electronic Library (IEL)</source><creator>Twigg, C.M. ; Hasler, P.E.</creator><creatorcontrib>Twigg, C.M. ; Hasler, P.E.</creatorcontrib><description>The development of large-scale field-programmable analog arrays (FPAAs) provides an excellent opportunity for expanding the capabilities of analog design courses and their laboratories. These devices allow the complete design and test cycle of an analog IC to be explored within the span of a single-term course without being limited to prefabricated integrated circuits. A brief discussion of the authors' experience in incorporating the reconfigurable analog signal processor (RASP) into courses and workshops is presented.</description><identifier>ISSN: 0018-9359</identifier><identifier>EISSN: 1557-9638</identifier><identifier>DOI: 10.1109/TE.2008.916762</identifier><identifier>CODEN: IEEDAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Analog design ; analog test ; Arrays ; Devices ; Education ; field-programmable analog array (FPAA) ; Integrated circuits ; laboratory ; Microprocessors ; Prefabricated ; reconfigurable analog ; Signal processing ; Workshops</subject><ispartof>IEEE transactions on education, 2008-08, Vol.51 (3), p.319-324</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-23aaa0ad90b6525a22a76d8733a885ad07ffb8fe0f06611b69f8e129e727840c3</citedby><cites>FETCH-LOGICAL-c319t-23aaa0ad90b6525a22a76d8733a885ad07ffb8fe0f06611b69f8e129e727840c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4544801$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27915,27916,54749</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4544801$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Twigg, C.M.</creatorcontrib><creatorcontrib>Hasler, P.E.</creatorcontrib><title>Incorporating Large-Scale FPAAs Into Analog Design and Test Courses</title><title>IEEE transactions on education</title><addtitle>TE</addtitle><description>The development of large-scale field-programmable analog arrays (FPAAs) provides an excellent opportunity for expanding the capabilities of analog design courses and their laboratories. These devices allow the complete design and test cycle of an analog IC to be explored within the span of a single-term course without being limited to prefabricated integrated circuits. A brief discussion of the authors' experience in incorporating the reconfigurable analog signal processor (RASP) into courses and workshops is presented.</description><subject>Analog design</subject><subject>analog test</subject><subject>Arrays</subject><subject>Devices</subject><subject>Education</subject><subject>field-programmable analog array (FPAA)</subject><subject>Integrated circuits</subject><subject>laboratory</subject><subject>Microprocessors</subject><subject>Prefabricated</subject><subject>reconfigurable analog</subject><subject>Signal processing</subject><subject>Workshops</subject><issn>0018-9359</issn><issn>1557-9638</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkM1Lw0AQxRdRsFavXrwET14S9yP7dQyx1UJBwXhepskmpKTZupse_O9diXjwNAz83sx7D6FbgjNCsH6sVhnFWGWaCCnoGVoQzmWqBVPnaIExUalmXF-iqxD2cc055QtUbsba-aPzMPVjl2zBdzZ9r2GwyfqtKEKyGSeXFCMMrkuebOi7MYGxSSobpqR0Jx9suEYXLQzB3vzOJfpYr6ryJd2-Pm_KYpvWjOgppQwAMDQa70T8DZSCFI2SjIFSHBos23anWotbLAQhO6FbZQnVVlKpclyzJXqY7x69-zxFA-bQh9oOA4zWnYIhTPCYWSsd0ft_6D56jSmC0YTSnGkmI5TNUO1dCN625uj7A_gvQ7D5qdRUK_NTqZkrjYK7WdBba__gnOe5woR9Axnob0A</recordid><startdate>20080801</startdate><enddate>20080801</enddate><creator>Twigg, C.M.</creator><creator>Hasler, P.E.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>F28</scope></search><sort><creationdate>20080801</creationdate><title>Incorporating Large-Scale FPAAs Into Analog Design and Test Courses</title><author>Twigg, C.M. ; Hasler, P.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-23aaa0ad90b6525a22a76d8733a885ad07ffb8fe0f06611b69f8e129e727840c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Analog design</topic><topic>analog test</topic><topic>Arrays</topic><topic>Devices</topic><topic>Education</topic><topic>field-programmable analog array (FPAA)</topic><topic>Integrated circuits</topic><topic>laboratory</topic><topic>Microprocessors</topic><topic>Prefabricated</topic><topic>reconfigurable analog</topic><topic>Signal processing</topic><topic>Workshops</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Twigg, C.M.</creatorcontrib><creatorcontrib>Hasler, P.E.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><jtitle>IEEE transactions on education</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Twigg, C.M.</au><au>Hasler, P.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Incorporating Large-Scale FPAAs Into Analog Design and Test Courses</atitle><jtitle>IEEE transactions on education</jtitle><stitle>TE</stitle><date>2008-08-01</date><risdate>2008</risdate><volume>51</volume><issue>3</issue><spage>319</spage><epage>324</epage><pages>319-324</pages><issn>0018-9359</issn><eissn>1557-9638</eissn><coden>IEEDAB</coden><abstract>The development of large-scale field-programmable analog arrays (FPAAs) provides an excellent opportunity for expanding the capabilities of analog design courses and their laboratories. These devices allow the complete design and test cycle of an analog IC to be explored within the span of a single-term course without being limited to prefabricated integrated circuits. A brief discussion of the authors' experience in incorporating the reconfigurable analog signal processor (RASP) into courses and workshops is presented.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TE.2008.916762</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9359
ispartof IEEE transactions on education, 2008-08, Vol.51 (3), p.319-324
issn 0018-9359
1557-9638
language eng
recordid cdi_proquest_miscellaneous_1365155989
source IEEE Electronic Library (IEL)
subjects Analog design
analog test
Arrays
Devices
Education
field-programmable analog array (FPAA)
Integrated circuits
laboratory
Microprocessors
Prefabricated
reconfigurable analog
Signal processing
Workshops
title Incorporating Large-Scale FPAAs Into Analog Design and Test Courses
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T23%3A26%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Incorporating%20Large-Scale%20FPAAs%20Into%20Analog%20Design%20and%20Test%20Courses&rft.jtitle=IEEE%20transactions%20on%20education&rft.au=Twigg,%20C.M.&rft.date=2008-08-01&rft.volume=51&rft.issue=3&rft.spage=319&rft.epage=324&rft.pages=319-324&rft.issn=0018-9359&rft.eissn=1557-9638&rft.coden=IEEDAB&rft_id=info:doi/10.1109/TE.2008.916762&rft_dat=%3Cproquest_RIE%3E1365155989%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=912243937&rft_id=info:pmid/&rft_ieee_id=4544801&rfr_iscdi=true