Versatility of a hard X-ray Kirkpatrick-Baez focus characterized by ptychography
In the past decade Kirkpatrick–Baez (KB) mirrors have been established as powerful focusing systems in hard X‐ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano‐imaging setup GINIX (Göttingen Instrument for Nano‐Imaging with X‐rays) at the P10 co...
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| Veröffentlicht in: | Journal of synchrotron radiation 2013-05, Vol.20 (3), p.490-497 |
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| container_title | Journal of synchrotron radiation |
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| creator | Giewekemeyer, Klaus Wilke, Robin N. Osterhoff, Markus Bartels, Matthias Kalbfleisch, Sebastian Salditt, Tim |
| description | In the past decade Kirkpatrick–Baez (KB) mirrors have been established as powerful focusing systems in hard X‐ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano‐imaging setup GINIX (Göttingen Instrument for Nano‐Imaging with X‐rays) at the P10 coherence beamline of the PETRA III synchrotron at HASLYLAB/DESY, Germany, is reported. More specifically, it is shown how aberrations in the KB beam, caused by imperfections in the height profile of the focusing mirrors, can be eliminated using a pinhole as a spatial filter near the focal plane. A combination of different pinhole sizes and illumination conditions of the KB setup makes the prepared optical setup well suited not only for high‐resolution ptychographic coherent X‐ray diffractive imaging but also for moderate‐resolution/large‐field‐of‐view propagation imaging in the divergent KB beam. |
| doi_str_mv | 10.1107/S0909049513005372 |
| format | Article |
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Synchrotron Rad</addtitle><description>In the past decade Kirkpatrick–Baez (KB) mirrors have been established as powerful focusing systems in hard X‐ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano‐imaging setup GINIX (Göttingen Instrument for Nano‐Imaging with X‐rays) at the P10 coherence beamline of the PETRA III synchrotron at HASLYLAB/DESY, Germany, is reported. More specifically, it is shown how aberrations in the KB beam, caused by imperfections in the height profile of the focusing mirrors, can be eliminated using a pinhole as a spatial filter near the focal plane. 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| subjects | beamlines and optics Beams (radiation) Computer Simulation Computer-Aided Design Equipment Design Equipment Failure Analysis Focal plane Focusing Imaging Kirkpatrick-Baez mirrors Lenses Microscopy - instrumentation Microscopy - methods Models, Theoretical Nanomaterials Nanostructure Pinholes ptychography Radiographic Image Enhancement - instrumentation Radiographic Image Enhancement - methods X-rays |
| title | Versatility of a hard X-ray Kirkpatrick-Baez focus characterized by ptychography |
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