Hard X-ray diffraction scanning tomography with sub-micrometre spatial resolution: application to an annealed γ-U0.85Mo0.15 particle

It is demonstrated that scanning X‐ray diffraction tomography of heterogeneous and polycrystalline samples can provide real‐space semi‐quantitative three‐dimensional structural information at a submicrometre spatial resolution. The capabilities of this technique are illustrated by the study of a sli...

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Veröffentlicht in:Journal of applied crystallography 2011-10, Vol.44 (5), p.1111-1119
Hauptverfasser: Palancher, Hervé, Tucoulou, Rémi, Bleuet, Pierre, Bonnin, Anne, Welcomme, Eléonore, Cloetens, Peter
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Sprache:eng
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Zusammenfassung:It is demonstrated that scanning X‐ray diffraction tomography of heterogeneous and polycrystalline samples can provide real‐space semi‐quantitative three‐dimensional structural information at a submicrometre spatial resolution. The capabilities of this technique are illustrated by the study of a slice of a spherical particle consisting of a UMo core (about 37 µm in diameter) surrounded by a UMoAl shell (5 µm thick). The technique allows precise characterization of the embedded UMo/UMoAl interface where the phases α‐U (in the core), UAl2 and U6Mo4Al43 (in the shell) are found. Moreover, an unexpected phase (UC) is detected at a trace level. It is shown that the thickness of the UMoAl shell is locally anticorrelated with the amount of UC, suggesting that this phase plays a protective role in inhibiting thermally activated Al diffusion in UMo.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889811024423