Loss of Siloxane Monolayers from GaN Surfaces in Water

Gallium nitride, with a thin passivating layer of Ga2O3, has been functionalized with octadecyltrichlorosilane (OTS) and aminopropyltriethoxysilane (APTES) self-assembled monolayers (SAMs). Water contact angles, atomic force microscopy, and X-ray photoelectron spectroscopy were used for characteriza...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Langmuir 2013-04, Vol.29 (17), p.5145-5149
Hauptverfasser: Arisio, Christina, Cassou, Catherine A, Lieberman, Marya
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 5149
container_issue 17
container_start_page 5145
container_title Langmuir
container_volume 29
creator Arisio, Christina
Cassou, Catherine A
Lieberman, Marya
description Gallium nitride, with a thin passivating layer of Ga2O3, has been functionalized with octadecyltrichlorosilane (OTS) and aminopropyltriethoxysilane (APTES) self-assembled monolayers (SAMs). Water contact angles, atomic force microscopy, and X-ray photoelectron spectroscopy were used for characterization of the bare and functionalized surfaces. The SAMs are stable in acetonitrile, but both the hydrophobic OTS SAM and the hydrophilic APTES SAM completely desorb after 1–24 h of immersion in water and common buffers. The concentration of gallium in solution after a clean GaN chip is immersed in water is consistent with dissolution of roughly one monolayer of interfacial gallium oxide. Dissolution of this oxide layer could account for the loss of SAMs from GaN surfaces.
doi_str_mv 10.1021/la400849j
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1347789420</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1347789420</sourcerecordid><originalsourceid>FETCH-LOGICAL-a345t-e9ddf90658359de8125dccf8dda941ebc06b8d09e4b2bd84136400160aa6c3763</originalsourceid><addsrcrecordid>eNpt0LtKA0EUBuBBFBOjhS8g0wharM79UkrQKEQtolgus3OBDbs7cSYL5u1dSTSN1Wk-_nPOD8A5RjcYEXzbGIaQYnp5AMaYE1RwReQhGCPJaCGZoCNwkvMSIaQp08dgRCinTDE1BmIec4YxwEXdxC_Tefgcu9iYjU8ZhhRbODMvcNGnYKzPsO7gh1n7dAqOgmmyP9vNCXh_uH-bPhbz19nT9G5eGMr4uvDauaCR4Ipy7bzChDtrg3LOaIZ9ZZGolEPas4pUTjFMxfAJFsgYYakUdAKutrmrFD97n9dlW2frm2a4NPa5xJRJqTQjaKDXW2rT8FLyoVylujVpU2JU_tRU_tU02ItdbF-13v3J314GcLkDJlvThGQ6W-e9k5RgzuXeGZvLZexTN7Txz8JvfbJ5bA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1347789420</pqid></control><display><type>article</type><title>Loss of Siloxane Monolayers from GaN Surfaces in Water</title><source>ACS Publications</source><source>MEDLINE</source><creator>Arisio, Christina ; Cassou, Catherine A ; Lieberman, Marya</creator><creatorcontrib>Arisio, Christina ; Cassou, Catherine A ; Lieberman, Marya</creatorcontrib><description>Gallium nitride, with a thin passivating layer of Ga2O3, has been functionalized with octadecyltrichlorosilane (OTS) and aminopropyltriethoxysilane (APTES) self-assembled monolayers (SAMs). Water contact angles, atomic force microscopy, and X-ray photoelectron spectroscopy were used for characterization of the bare and functionalized surfaces. The SAMs are stable in acetonitrile, but both the hydrophobic OTS SAM and the hydrophilic APTES SAM completely desorb after 1–24 h of immersion in water and common buffers. The concentration of gallium in solution after a clean GaN chip is immersed in water is consistent with dissolution of roughly one monolayer of interfacial gallium oxide. Dissolution of this oxide layer could account for the loss of SAMs from GaN surfaces.</description><identifier>ISSN: 0743-7463</identifier><identifier>EISSN: 1520-5827</identifier><identifier>DOI: 10.1021/la400849j</identifier><identifier>PMID: 23534848</identifier><identifier>CODEN: LANGD5</identifier><language>eng</language><publisher>Washington, DC: American Chemical Society</publisher><subject>Chemistry ; Exact sciences and technology ; Gallium - chemistry ; General and physical chemistry ; Hydrophobic and Hydrophilic Interactions ; Propylamines ; Silanes - chemistry ; Siloxanes - chemistry ; Solid-liquid interface ; Solubility ; Surface physical chemistry ; Surface Properties ; Water - chemistry</subject><ispartof>Langmuir, 2013-04, Vol.29 (17), p.5145-5149</ispartof><rights>Copyright © 2013 American Chemical Society</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a345t-e9ddf90658359de8125dccf8dda941ebc06b8d09e4b2bd84136400160aa6c3763</citedby><cites>FETCH-LOGICAL-a345t-e9ddf90658359de8125dccf8dda941ebc06b8d09e4b2bd84136400160aa6c3763</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/la400849j$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/la400849j$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,776,780,2752,27053,27901,27902,56713,56763</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=27321557$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/23534848$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Arisio, Christina</creatorcontrib><creatorcontrib>Cassou, Catherine A</creatorcontrib><creatorcontrib>Lieberman, Marya</creatorcontrib><title>Loss of Siloxane Monolayers from GaN Surfaces in Water</title><title>Langmuir</title><addtitle>Langmuir</addtitle><description>Gallium nitride, with a thin passivating layer of Ga2O3, has been functionalized with octadecyltrichlorosilane (OTS) and aminopropyltriethoxysilane (APTES) self-assembled monolayers (SAMs). Water contact angles, atomic force microscopy, and X-ray photoelectron spectroscopy were used for characterization of the bare and functionalized surfaces. The SAMs are stable in acetonitrile, but both the hydrophobic OTS SAM and the hydrophilic APTES SAM completely desorb after 1–24 h of immersion in water and common buffers. The concentration of gallium in solution after a clean GaN chip is immersed in water is consistent with dissolution of roughly one monolayer of interfacial gallium oxide. Dissolution of this oxide layer could account for the loss of SAMs from GaN surfaces.</description><subject>Chemistry</subject><subject>Exact sciences and technology</subject><subject>Gallium - chemistry</subject><subject>General and physical chemistry</subject><subject>Hydrophobic and Hydrophilic Interactions</subject><subject>Propylamines</subject><subject>Silanes - chemistry</subject><subject>Siloxanes - chemistry</subject><subject>Solid-liquid interface</subject><subject>Solubility</subject><subject>Surface physical chemistry</subject><subject>Surface Properties</subject><subject>Water - chemistry</subject><issn>0743-7463</issn><issn>1520-5827</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNpt0LtKA0EUBuBBFBOjhS8g0wharM79UkrQKEQtolgus3OBDbs7cSYL5u1dSTSN1Wk-_nPOD8A5RjcYEXzbGIaQYnp5AMaYE1RwReQhGCPJaCGZoCNwkvMSIaQp08dgRCinTDE1BmIec4YxwEXdxC_Tefgcu9iYjU8ZhhRbODMvcNGnYKzPsO7gh1n7dAqOgmmyP9vNCXh_uH-bPhbz19nT9G5eGMr4uvDauaCR4Ipy7bzChDtrg3LOaIZ9ZZGolEPas4pUTjFMxfAJFsgYYakUdAKutrmrFD97n9dlW2frm2a4NPa5xJRJqTQjaKDXW2rT8FLyoVylujVpU2JU_tRU_tU02ItdbF-13v3J314GcLkDJlvThGQ6W-e9k5RgzuXeGZvLZexTN7Txz8JvfbJ5bA</recordid><startdate>20130430</startdate><enddate>20130430</enddate><creator>Arisio, Christina</creator><creator>Cassou, Catherine A</creator><creator>Lieberman, Marya</creator><general>American Chemical Society</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20130430</creationdate><title>Loss of Siloxane Monolayers from GaN Surfaces in Water</title><author>Arisio, Christina ; Cassou, Catherine A ; Lieberman, Marya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a345t-e9ddf90658359de8125dccf8dda941ebc06b8d09e4b2bd84136400160aa6c3763</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Chemistry</topic><topic>Exact sciences and technology</topic><topic>Gallium - chemistry</topic><topic>General and physical chemistry</topic><topic>Hydrophobic and Hydrophilic Interactions</topic><topic>Propylamines</topic><topic>Silanes - chemistry</topic><topic>Siloxanes - chemistry</topic><topic>Solid-liquid interface</topic><topic>Solubility</topic><topic>Surface physical chemistry</topic><topic>Surface Properties</topic><topic>Water - chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Arisio, Christina</creatorcontrib><creatorcontrib>Cassou, Catherine A</creatorcontrib><creatorcontrib>Lieberman, Marya</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Langmuir</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Arisio, Christina</au><au>Cassou, Catherine A</au><au>Lieberman, Marya</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Loss of Siloxane Monolayers from GaN Surfaces in Water</atitle><jtitle>Langmuir</jtitle><addtitle>Langmuir</addtitle><date>2013-04-30</date><risdate>2013</risdate><volume>29</volume><issue>17</issue><spage>5145</spage><epage>5149</epage><pages>5145-5149</pages><issn>0743-7463</issn><eissn>1520-5827</eissn><coden>LANGD5</coden><abstract>Gallium nitride, with a thin passivating layer of Ga2O3, has been functionalized with octadecyltrichlorosilane (OTS) and aminopropyltriethoxysilane (APTES) self-assembled monolayers (SAMs). Water contact angles, atomic force microscopy, and X-ray photoelectron spectroscopy were used for characterization of the bare and functionalized surfaces. The SAMs are stable in acetonitrile, but both the hydrophobic OTS SAM and the hydrophilic APTES SAM completely desorb after 1–24 h of immersion in water and common buffers. The concentration of gallium in solution after a clean GaN chip is immersed in water is consistent with dissolution of roughly one monolayer of interfacial gallium oxide. Dissolution of this oxide layer could account for the loss of SAMs from GaN surfaces.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><pmid>23534848</pmid><doi>10.1021/la400849j</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0743-7463
ispartof Langmuir, 2013-04, Vol.29 (17), p.5145-5149
issn 0743-7463
1520-5827
language eng
recordid cdi_proquest_miscellaneous_1347789420
source ACS Publications; MEDLINE
subjects Chemistry
Exact sciences and technology
Gallium - chemistry
General and physical chemistry
Hydrophobic and Hydrophilic Interactions
Propylamines
Silanes - chemistry
Siloxanes - chemistry
Solid-liquid interface
Solubility
Surface physical chemistry
Surface Properties
Water - chemistry
title Loss of Siloxane Monolayers from GaN Surfaces in Water
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T18%3A35%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Loss%20of%20Siloxane%20Monolayers%20from%20GaN%20Surfaces%20in%20Water&rft.jtitle=Langmuir&rft.au=Arisio,%20Christina&rft.date=2013-04-30&rft.volume=29&rft.issue=17&rft.spage=5145&rft.epage=5149&rft.pages=5145-5149&rft.issn=0743-7463&rft.eissn=1520-5827&rft.coden=LANGD5&rft_id=info:doi/10.1021/la400849j&rft_dat=%3Cproquest_cross%3E1347789420%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1347789420&rft_id=info:pmid/23534848&rfr_iscdi=true