A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis

This paper presents a BIST system with non-intrusive test pattern generator (TPG) and output response analyzer (ORA) for field-programmable gate array (FPGA) test and diagnosis. The proposed BIST system physically consists of software and hardware parts with two communication channels in between. Th...

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