Measurement of in-plane displacements using the phase singularities generated by directional wavelet transforms of speckle pattern images

We present a method to determine micro and nano in-plane displacements based on the phase singularities generated by application of directional wavelet transforms to speckle pattern images. The spatial distribution of the obtained phase singularities by the wavelet transform configures a network, wh...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Applied optics (2004) 2013-03, Vol.52 (9), p.1805-1813
Hauptverfasser:	Vadnjal, Ana Laura, Etchepareborda, Pablo, Federico, Alejandro, Kaufmann, Guillermo H
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!