The Analysis and Application of Redundant Multistage ADC Resolution Improvements Through PDF Residue Shaping
An analysis of the statistics of multistage (pipeline, SAR, and algorithmic) ADCs with redundancy is performed and the ability to achieve an extra 6 dB of resolution in ADCs with half-bit redundancy is shown due to probability density function (PDF) residue shaping. This paper classifies redundancy...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2012-08, Vol.59 (8), p.1733-1742 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1742 |
---|---|
container_issue | 8 |
container_start_page | 1733 |
container_title | IEEE transactions on circuits and systems. I, Regular papers |
container_volume | 59 |
creator | Guerber, J. Gande, M. Moon, U. |
description | An analysis of the statistics of multistage (pipeline, SAR, and algorithmic) ADCs with redundancy is performed and the ability to achieve an extra 6 dB of resolution in ADCs with half-bit redundancy is shown due to probability density function (PDF) residue shaping. This paper classifies redundancy techniques to show that only some have properties leading to statistical resolution improvements. When properly implemented, resolution gains are maintained even in the presence of large sub-ADC nonlinearity. ADC design criteria for maximizing these resolution increases through PDF residue shaping are described including improved back-end ADCs, stage comparator offset bounds, and the use of scaled conventional restoring with Z added levels (CRZ) stage redundancy. PDF residue shaped structural improvements are also quantified in relation to ideal and nonideal traditional multistage ADC structures. |
doi_str_mv | 10.1109/TCSI.2011.2180435 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_1315695849</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6182722</ieee_id><sourcerecordid>1315695849</sourcerecordid><originalsourceid>FETCH-LOGICAL-c369t-6d2d90f3d6ebdde80940c2bd21ec37471201090c14d40ea72dc823d844a3b2123</originalsourceid><addsrcrecordid>eNpdkE1Lw0AQhoMoWKs_QLwsePGSOvuRZPdYWquFimLjOWyz03ZLmsRsIvTfu7HFg6cZmOcdZp4guKUwohTUYzpZzkcMKB0xKkHw6CwY0CiSIUiIz_teqFByJi-DK-d2AEwBp4OgSLdIxqUuDs46oktDxnVd2Fy3tipJtSYfaLrS6LIlr13RWtfqjQ9MJ37gqqL7xeb7uqm-cY9l60i6bapusyXv01nPWNMhWW51bcvNdXCx1oXDm1MdBp-zp3TyEi7enueT8SLMeazaMDbMKFhzE-PKGJSgBORsZRjFnCciof5PUJBTYQSgTpjJJeNGCqH5ilHGh8HDca8_66tD12Z763IsCl1i1bmMchrFKpJCefT-H7qrusb78BRw4DxmkfQUPVJ5UznX4DqrG7vXzcFDWe8_6_1nvf_s5N9n7o4Zi4h_fEwlSxjjP6x6gKQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1030336258</pqid></control><display><type>article</type><title>The Analysis and Application of Redundant Multistage ADC Resolution Improvements Through PDF Residue Shaping</title><source>IEEE Electronic Library (IEL)</source><creator>Guerber, J. ; Gande, M. ; Moon, U.</creator><creatorcontrib>Guerber, J. ; Gande, M. ; Moon, U.</creatorcontrib><description>An analysis of the statistics of multistage (pipeline, SAR, and algorithmic) ADCs with redundancy is performed and the ability to achieve an extra 6 dB of resolution in ADCs with half-bit redundancy is shown due to probability density function (PDF) residue shaping. This paper classifies redundancy techniques to show that only some have properties leading to statistical resolution improvements. When properly implemented, resolution gains are maintained even in the presence of large sub-ADC nonlinearity. ADC design criteria for maximizing these resolution increases through PDF residue shaping are described including improved back-end ADCs, stage comparator offset bounds, and the use of scaled conventional restoring with Z added levels (CRZ) stage redundancy. PDF residue shaped structural improvements are also quantified in relation to ideal and nonideal traditional multistage ADC structures.</description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2011.2180435</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Algorithmic ADC ; Algorithms ; Ash ; Comparators ; Complexity theory ; error correction ; Gain ; Multistage ; multistage ADC ; pipeline redundancy ; Pipelines ; Probability density function ; Probability density functions ; Quantization ; Redundancy ; redundancy resolution improvement ; residue shaping ; Residues ; SAR redundancy ; Statistics ; Synthetic aperture radar</subject><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2012-08, Vol.59 (8), p.1733-1742</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2012</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-6d2d90f3d6ebdde80940c2bd21ec37471201090c14d40ea72dc823d844a3b2123</citedby><cites>FETCH-LOGICAL-c369t-6d2d90f3d6ebdde80940c2bd21ec37471201090c14d40ea72dc823d844a3b2123</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6182722$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6182722$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Guerber, J.</creatorcontrib><creatorcontrib>Gande, M.</creatorcontrib><creatorcontrib>Moon, U.</creatorcontrib><title>The Analysis and Application of Redundant Multistage ADC Resolution Improvements Through PDF Residue Shaping</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><addtitle>TCSI</addtitle><description>An analysis of the statistics of multistage (pipeline, SAR, and algorithmic) ADCs with redundancy is performed and the ability to achieve an extra 6 dB of resolution in ADCs with half-bit redundancy is shown due to probability density function (PDF) residue shaping. This paper classifies redundancy techniques to show that only some have properties leading to statistical resolution improvements. When properly implemented, resolution gains are maintained even in the presence of large sub-ADC nonlinearity. ADC design criteria for maximizing these resolution increases through PDF residue shaping are described including improved back-end ADCs, stage comparator offset bounds, and the use of scaled conventional restoring with Z added levels (CRZ) stage redundancy. PDF residue shaped structural improvements are also quantified in relation to ideal and nonideal traditional multistage ADC structures.</description><subject>Algorithmic ADC</subject><subject>Algorithms</subject><subject>Ash</subject><subject>Comparators</subject><subject>Complexity theory</subject><subject>error correction</subject><subject>Gain</subject><subject>Multistage</subject><subject>multistage ADC</subject><subject>pipeline redundancy</subject><subject>Pipelines</subject><subject>Probability density function</subject><subject>Probability density functions</subject><subject>Quantization</subject><subject>Redundancy</subject><subject>redundancy resolution improvement</subject><subject>residue shaping</subject><subject>Residues</subject><subject>SAR redundancy</subject><subject>Statistics</subject><subject>Synthetic aperture radar</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1Lw0AQhoMoWKs_QLwsePGSOvuRZPdYWquFimLjOWyz03ZLmsRsIvTfu7HFg6cZmOcdZp4guKUwohTUYzpZzkcMKB0xKkHw6CwY0CiSIUiIz_teqFByJi-DK-d2AEwBp4OgSLdIxqUuDs46oktDxnVd2Fy3tipJtSYfaLrS6LIlr13RWtfqjQ9MJ37gqqL7xeb7uqm-cY9l60i6bapusyXv01nPWNMhWW51bcvNdXCx1oXDm1MdBp-zp3TyEi7enueT8SLMeazaMDbMKFhzE-PKGJSgBORsZRjFnCciof5PUJBTYQSgTpjJJeNGCqH5ilHGh8HDca8_66tD12Z763IsCl1i1bmMchrFKpJCefT-H7qrusb78BRw4DxmkfQUPVJ5UznX4DqrG7vXzcFDWe8_6_1nvf_s5N9n7o4Zi4h_fEwlSxjjP6x6gKQ</recordid><startdate>20120801</startdate><enddate>20120801</enddate><creator>Guerber, J.</creator><creator>Gande, M.</creator><creator>Moon, U.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20120801</creationdate><title>The Analysis and Application of Redundant Multistage ADC Resolution Improvements Through PDF Residue Shaping</title><author>Guerber, J. ; Gande, M. ; Moon, U.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-6d2d90f3d6ebdde80940c2bd21ec37471201090c14d40ea72dc823d844a3b2123</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Algorithmic ADC</topic><topic>Algorithms</topic><topic>Ash</topic><topic>Comparators</topic><topic>Complexity theory</topic><topic>error correction</topic><topic>Gain</topic><topic>Multistage</topic><topic>multistage ADC</topic><topic>pipeline redundancy</topic><topic>Pipelines</topic><topic>Probability density function</topic><topic>Probability density functions</topic><topic>Quantization</topic><topic>Redundancy</topic><topic>redundancy resolution improvement</topic><topic>residue shaping</topic><topic>Residues</topic><topic>SAR redundancy</topic><topic>Statistics</topic><topic>Synthetic aperture radar</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Guerber, J.</creatorcontrib><creatorcontrib>Gande, M.</creatorcontrib><creatorcontrib>Moon, U.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Guerber, J.</au><au>Gande, M.</au><au>Moon, U.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The Analysis and Application of Redundant Multistage ADC Resolution Improvements Through PDF Residue Shaping</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2012-08-01</date><risdate>2012</risdate><volume>59</volume><issue>8</issue><spage>1733</spage><epage>1742</epage><pages>1733-1742</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract>An analysis of the statistics of multistage (pipeline, SAR, and algorithmic) ADCs with redundancy is performed and the ability to achieve an extra 6 dB of resolution in ADCs with half-bit redundancy is shown due to probability density function (PDF) residue shaping. This paper classifies redundancy techniques to show that only some have properties leading to statistical resolution improvements. When properly implemented, resolution gains are maintained even in the presence of large sub-ADC nonlinearity. ADC design criteria for maximizing these resolution increases through PDF residue shaping are described including improved back-end ADCs, stage comparator offset bounds, and the use of scaled conventional restoring with Z added levels (CRZ) stage redundancy. PDF residue shaped structural improvements are also quantified in relation to ideal and nonideal traditional multistage ADC structures.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSI.2011.2180435</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1549-8328 |
ispartof | IEEE transactions on circuits and systems. I, Regular papers, 2012-08, Vol.59 (8), p.1733-1742 |
issn | 1549-8328 1558-0806 |
language | eng |
recordid | cdi_proquest_miscellaneous_1315695849 |
source | IEEE Electronic Library (IEL) |
subjects | Algorithmic ADC Algorithms Ash Comparators Complexity theory error correction Gain Multistage multistage ADC pipeline redundancy Pipelines Probability density function Probability density functions Quantization Redundancy redundancy resolution improvement residue shaping Residues SAR redundancy Statistics Synthetic aperture radar |
title | The Analysis and Application of Redundant Multistage ADC Resolution Improvements Through PDF Residue Shaping |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T00%3A58%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20Analysis%20and%20Application%20of%20Redundant%20Multistage%20ADC%20Resolution%20Improvements%20Through%20PDF%20Residue%20Shaping&rft.jtitle=IEEE%20transactions%20on%20circuits%20and%20systems.%20I,%20Regular%20papers&rft.au=Guerber,%20J.&rft.date=2012-08-01&rft.volume=59&rft.issue=8&rft.spage=1733&rft.epage=1742&rft.pages=1733-1742&rft.issn=1549-8328&rft.eissn=1558-0806&rft.coden=ITCSCH&rft_id=info:doi/10.1109/TCSI.2011.2180435&rft_dat=%3Cproquest_RIE%3E1315695849%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1030336258&rft_id=info:pmid/&rft_ieee_id=6182722&rfr_iscdi=true |