Application of Analog IC Testing Circuit

This paper presents application of Neural classifier with High pass filter(HPF) to examine its own functional health, to speed up test time and to facilitate fault diagnosis Here we presents an application to insert a built in test block to test any complicated analog circuit in terms of performance...

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Veröffentlicht in:	International journal of computer applications 2012-01, Vol.48 (11), p.1-3
Hauptverfasser:	LKM, Ganesh, Khare, Kavita, Sharma, Priyanka
Format:	Artikel
Sprache:	eng
Schlagworte:	Analog circuits Blocking Cancellers Circuits Inserts Test times Tolerances Voltage converters
Online-Zugang:	Volltext
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