Second-harmonic spectroscopy of electronic structure of Si/SiO2 multiple quantum wells

Size effects in the resonant nonlinear optical response of amorphous Si/SiO2 multiple quantum wells (MQW) are studied by second-harmonic generation (SHG) spectroscopy in a spectral interval of second-harmonic photon energies from 2.5 to 3.4 eV. The sensitivity of SHG spectroscopy to thickness-depend...

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Veröffentlicht in:Applied physics. B, Lasers and optics Lasers and optics, 2002-05, Vol.74 (7-8), p.671-675
Hauptverfasser: Dolgova, T.V., Avramenko, V.G., Nikulin, A.A., Marowsky, G., Pudonin, A.F., Fedyanin, A.A., Aktsipetrov, O.A.
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container_issue 7-8
container_start_page 671
container_title Applied physics. B, Lasers and optics
container_volume 74
creator Dolgova, T.V.
Avramenko, V.G.
Nikulin, A.A.
Marowsky, G.
Pudonin, A.F.
Fedyanin, A.A.
Aktsipetrov, O.A.
description Size effects in the resonant nonlinear optical response of amorphous Si/SiO2 multiple quantum wells (MQW) are studied by second-harmonic generation (SHG) spectroscopy in a spectral interval of second-harmonic photon energies from 2.5 to 3.4 eV. The sensitivity of SHG spectroscopy to thickness-dependent electronic structure (sub-band energy position and density of states line shape) of MQW is demonstrated. A monotonic red shift of central energies of SHG resonances by 120 m eV upon increase of the well thickness from 2.5 to 10 A is observed. This is interpreted as a size dependence of the position of singularities in the combined density of states for a 2D gas of electrons moving in an effective potential well. It is shown that, for agreement with experiment, the simplest (rectangular) shape of the well should be modified in order to take into account the lattice-potential distortion at the interfaces.
doi_str_mv 10.1007/s00340-002-0916-6
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subjects Density of states
Doppler effect
Electronic structure
Intervals
Photons
Quantum wells
Silicon dioxide
Spectroscopy
title Second-harmonic spectroscopy of electronic structure of Si/SiO2 multiple quantum wells
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