Diagnostics of laser-induced plasma with soft X-ray (13.9 nm) bi-mirror interference microscopy

X-ray interference microscopy diagnostics of a nanosecond-pulse pumped Al (Z=13) plasma are presented. A transient picosecond Ni-like Ag X-ray laser (13.9 nm) is used as the probe beam and a wavefront division bi-mirror interferometer is adopted as the diagnosis tool. From the fringe shifts, the two...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Applied physics. B, Lasers and optics Lasers and optics, 2004-05, Vol.78 (7-8), p.975-977
Hauptverfasser:	TANG, H, GUILBAUD, O, SUKEGAWA, K, ISHINO, M, NAGASHIMA, K, DAIDO, H, JAMELOT, G, ROS, D, KLISNICK, A, JOYEUX, D, PHALIPPOU, D, KADO, M, NISHIKINO, M, KIBHIMOTO, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Electromagnetism electron and ion optics Exact sciences and technology Fundamental areas of phenomenology (including applications) Instruments, apparatus, components and techniques common to several branches of physics and astronomy Interference Interferometers Lasers Microscopy Nanostructure Optics Physics Physics of gases, plasmas and electric discharges Physics of plasmas and electric discharges Plasma (physics) Plasma diagnostic techniques and instrumentation Two dimensional X- and γ-ray instruments and techniques X- and γ-ray lasers X-ray and y-ray measurements X-ray and γ-ray measurements X-ray beams and x-ray optics X-ray lasers X-ray microscopes
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!