Distribution of barrier heights in Au/porous GaAs Schottky diodes from current–voltage–temperature measurements

In this work, we have studied the electrical characteristics of the Au/porous GaAs/p-GaAs diodes as a function of temperature. The ( I–V) –T characteristics are analysed on the basis of thermionic emission (TE). The temperature behaviour of the barrier height potential and the ideality factor demons...

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Veröffentlicht in:Physica. B, Condensed matter Condensed matter, 2010-09, Vol.405 (17), p.3745-3750
Hauptverfasser: Harrabi, Z., Jomni, S., Beji, L., Bouazizi, A.
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container_issue 17
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creator Harrabi, Z.
Jomni, S.
Beji, L.
Bouazizi, A.
description In this work, we have studied the electrical characteristics of the Au/porous GaAs/p-GaAs diodes as a function of temperature. The ( I–V) –T characteristics are analysed on the basis of thermionic emission (TE). The temperature behaviour of the barrier height potential and the ideality factor demonstrate that the current transport is controlled by the thermionic emission mechanism (TE) with Gaussian distribution of the barrier height potential. The Gaussian distribution of barrier height potential is due to barrier inhomogeneity, which is suggested to be caused by the presence of the porous GaAs interfacial layer. The experimental ( I–V) –T characteristics of the Au/porous GaAs/p-GaAs heterostructure demonstrate the presence of a two Gaussian distributions having a mean barrier height potential Φ b 0 ¯ of about 0.67 and 0.54 V and standard deviations σ s 2 of about 8.4×10 −3 and 4.2×10 −3 V, respectively. Using the obtained standard deviation, the obtained Richardson constant value is in accordance with the well documented value (79.2 A cm −2 K −2) of p-type GaAs and the mean barrier height Φ b 0 ¯ is closed to the band gap of GaAs. The obtained values prove that the I–V–T characteristics of Au/porous GaAs/p-GaAs heterostructure are governed by the TE mechanism theory with two Gaussian distributions of barrier heights.
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Using the obtained standard deviation, the obtained Richardson constant value is in accordance with the well documented value (79.2 A cm −2 K −2) of p-type GaAs and the mean barrier height Φ b 0 ¯ is closed to the band gap of GaAs. 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B, Condensed matter</title><description>In this work, we have studied the electrical characteristics of the Au/porous GaAs/p-GaAs diodes as a function of temperature. The ( I–V) –T characteristics are analysed on the basis of thermionic emission (TE). The temperature behaviour of the barrier height potential and the ideality factor demonstrate that the current transport is controlled by the thermionic emission mechanism (TE) with Gaussian distribution of the barrier height potential. The Gaussian distribution of barrier height potential is due to barrier inhomogeneity, which is suggested to be caused by the presence of the porous GaAs interfacial layer. The experimental ( I–V) –T characteristics of the Au/porous GaAs/p-GaAs heterostructure demonstrate the presence of a two Gaussian distributions having a mean barrier height potential Φ b 0 ¯ of about 0.67 and 0.54 V and standard deviations σ s 2 of about 8.4×10 −3 and 4.2×10 −3 V, respectively. Using the obtained standard deviation, the obtained Richardson constant value is in accordance with the well documented value (79.2 A cm −2 K −2) of p-type GaAs and the mean barrier height Φ b 0 ¯ is closed to the band gap of GaAs. 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The temperature behaviour of the barrier height potential and the ideality factor demonstrate that the current transport is controlled by the thermionic emission mechanism (TE) with Gaussian distribution of the barrier height potential. The Gaussian distribution of barrier height potential is due to barrier inhomogeneity, which is suggested to be caused by the presence of the porous GaAs interfacial layer. The experimental ( I–V) –T characteristics of the Au/porous GaAs/p-GaAs heterostructure demonstrate the presence of a two Gaussian distributions having a mean barrier height potential Φ b 0 ¯ of about 0.67 and 0.54 V and standard deviations σ s 2 of about 8.4×10 −3 and 4.2×10 −3 V, respectively. Using the obtained standard deviation, the obtained Richardson constant value is in accordance with the well documented value (79.2 A cm −2 K −2) of p-type GaAs and the mean barrier height Φ b 0 ¯ is closed to the band gap of GaAs. 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subjects Barriers
Condensed matter
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Current–voltage characteristics
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Gallium arsenide
Gallium arsenides
Gold
Mathematical analysis
Normal distribution
Physics
Porous GaAs
Schottky contact
Standard deviation
Surface double layers, schottky barriers, and work functions
title Distribution of barrier heights in Au/porous GaAs Schottky diodes from current–voltage–temperature measurements
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