An introduction to three-dimensional X-ray diffraction microscopy

Three‐dimensional X‐ray diffraction microscopy is a fast and nondestructive structural characterization technique aimed at studies of the individual crystalline elements (grains or subgrains) within millimetre‐sized polycrystalline specimens. It is based on two principles: the use of highly penetrat...

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Veröffentlicht in:	J. Appl. Crystallogr 2012-12, Vol.45 (6), p.1084-1097
1. Verfasser:	Poulsen, Henning Friis
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Crystallography Diffraction diffraction imaging Grains Microscopy Reconstruction structural characterization synchrotron radiation Three dimensional three-dimensional X-ray diffraction microscopy tomography X-rays
Online-Zugang:	Volltext
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