Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience

We report on the design and first tests of a novel instrument aimed at combining the benefits of scanning force microscopy with those of X-ray spectroscopy. For this we built an instrument combining a scanning transmission X-ray microscope with a beam-deflection atomic force microscope in a coaxial...

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Veröffentlicht in:	Ultramicroscopy 2010-09, Vol.110 (10), p.1267-1272
Hauptverfasser:	Schmid, I., Raabe, J., Sarafimov, B., Quitmann, C., Vranjkovic, S., Pellmont, Y., Hug, H.J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Microscopes Nanocomposites Nanomaterials Nanostructure Scanning Scanning probe microscopy Spectroscopy Topography X-ray absorption spectroscopy X-ray microscopy X-rays
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