Lifetime predictions of LED-based light bars by accelerated degradation test

The accelerated degradation of light bars was tested under different stresses called junction temperatures, which result from the combination of current and ambient temperature. Light bars are used as a light source in laptops. A general procedure for an accelerated degradation test was used to anal...

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Veröffentlicht in:	Microelectronics and reliability 2012-07, Vol.52 (7), p.1332-1336
Hauptverfasser:	Wang, Fu-Kwun, Chu, Tao-Peng
Format:	Artikel
Sprache:	eng
Schlagworte:	Accelerated tests Bars Criteria Degradation Exact sciences and technology Failure Failure times Fundamental areas of phenomenology (including applications) Mathematical models Optical sources and standards Optics Physics Stresses
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