Investigation of Post-Etch Copper Residue on Direct Bonded Copper (DBC) Substrates

For many years, direct bonded copper (DBC) substrates have proved to be an excellent solution for electrical isolation and thermal management of high-power semiconductor modules. However, in this study we detected a copper residue on the surface of DBC alumina, presumably a result of pattern etching...

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Veröffentlicht in:Journal of electronic materials 2011-10, Vol.40 (10), p.2119-2125
Hauptverfasser: Mei, Yunhui, Lu, Guo-Quan, Chen, Xu, Gang, Chen, Luo, Shufang, Ibitayo, Dimeji
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Sprache:eng
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