Luminescence imaging for inline characterisation in silicon photovoltaics

Luminescence imaging is a very rapid technique for the characterisation of silicon samples. Megapixel luminescence images on silicon bricks, unprocessed wafers, partially processed wafers and fully processed cells can be captured with acquisition times of typically a few seconds or less than one sec...

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Veröffentlicht in:	Physica status solidi. PSS-RRL. Rapid research letters 2011-04, Vol.5 (4), p.131-137
Hauptverfasser:	Trupke, Thorsten, Nyhus, Jørgen, Haunschild, Jonas
Format:	Artikel
Sprache:	eng
Schlagworte:	Bricks Cross-disciplinary physics: materials science rheology Devices Exact sciences and technology Imaging Luminescence Materials science Materials testing Monitoring photoluminescence imaging Physics Silicon solar cells Wafers
Online-Zugang:	Volltext
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