Exciton polaritons in ZnO microcavities with different active layer thicknesses
We have investigated the characteristics of exciton polaritons in ZnO microcavities with different active layer thicknesses. The microcavity was made from a bulk ZnO active layer and two distributed Bragg reflectors (DBRs) consisting of HfO2 and SiO2 layers. We adopted rf magnetron sputtering and pu...
Gespeichert in:
Veröffentlicht in: | Physica Status Solidi (b) 2011-02, Vol.248 (2), p.460-463 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 463 |
---|---|
container_issue | 2 |
container_start_page | 460 |
container_title | Physica Status Solidi (b) |
container_volume | 248 |
creator | Kawase, Toshiki Kim, DaeGwi Miyazaki, Kenichi Nakayama, Masaaki |
description | We have investigated the characteristics of exciton polaritons in ZnO microcavities with different active layer thicknesses. The microcavity was made from a bulk ZnO active layer and two distributed Bragg reflectors (DBRs) consisting of HfO2 and SiO2 layers. We adopted rf magnetron sputtering and pulsed laser deposition for the preparation of the DBR and ZnO active layer, respectively. Angle‐resolved reflectance spectra demonstrate the formation of cavity polaritons. From the analysis using a phenomenological Hamiltonian for the coupling between the cavity photon and three kinds of excitons labeled A, B, and C peculiar to ZnO, the vacuum Rabi‐splitting energies in the λ/2‐microcavity are estimated to be 30, 71, and 84 meV for the A, B, and C excitons, respectively. Moreover, we indicate the potential to control the Rabi‐splitting energy by changing the active layer thickness. |
doi_str_mv | 10.1002/pssb.201000620 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1031289103</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1031289103</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3900-57767ccbb253084001760a908534e9995e4fa6544572e67d7ef0d9b045fd3dea3</originalsourceid><addsrcrecordid>eNqFkEtP4zAUhS00SHSALWtvRppNyrUdx_FyQDxGqihSeUhsLNe5EYY06fiGR__9pGpVsWN1zuI75-oexk4EjAWAPF0SzccSBg-FhD02ElqKTFktfrARKAOZsEYesJ9ELwNjhBIjNr34DLHvWr7sGp_Wjnhs-VM75YsYUhf8e-wjEv-I_TOvYl1jwrbnPvTxHXnjV5h4_xzDa4tESEdsv_YN4fFWD9n95cXd-XU2mV79Pf8zyYKyAJk2pjAhzOdSKyhzAGEK8BZKrXK01mrMa1_oPNdGYmEqgzVUdg65ritVoVeH7Pemd5m6f29IvVtECtg0vsXujZwAJWRpBxnQ8QYd3iFKWLtligufVgPk1su59XJut9wQ-LXt9hR8Uyffhki7lFRlboUoB85uuI_Y4OqbVnc7m519vZFtspF6_NxlfXp1hVFGu8ebK_dwlwszOzPuWv0HMYGOUw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1031289103</pqid></control><display><type>article</type><title>Exciton polaritons in ZnO microcavities with different active layer thicknesses</title><source>Wiley-Blackwell Journals</source><creator>Kawase, Toshiki ; Kim, DaeGwi ; Miyazaki, Kenichi ; Nakayama, Masaaki</creator><creatorcontrib>Kawase, Toshiki ; Kim, DaeGwi ; Miyazaki, Kenichi ; Nakayama, Masaaki</creatorcontrib><description>We have investigated the characteristics of exciton polaritons in ZnO microcavities with different active layer thicknesses. The microcavity was made from a bulk ZnO active layer and two distributed Bragg reflectors (DBRs) consisting of HfO2 and SiO2 layers. We adopted rf magnetron sputtering and pulsed laser deposition for the preparation of the DBR and ZnO active layer, respectively. Angle‐resolved reflectance spectra demonstrate the formation of cavity polaritons. From the analysis using a phenomenological Hamiltonian for the coupling between the cavity photon and three kinds of excitons labeled A, B, and C peculiar to ZnO, the vacuum Rabi‐splitting energies in the λ/2‐microcavity are estimated to be 30, 71, and 84 meV for the A, B, and C excitons, respectively. Moreover, we indicate the potential to control the Rabi‐splitting energy by changing the active layer thickness.</description><identifier>ISSN: 0370-1972</identifier><identifier>ISSN: 1521-3951</identifier><identifier>EISSN: 1521-3951</identifier><identifier>DOI: 10.1002/pssb.201000620</identifier><identifier>CODEN: PSSBBD</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag</publisher><subject>Bragg reflectors ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Electron states ; Exact sciences and technology ; Excitation ; exciton polariton ; Excitons and related phenomena ; Hafnium oxide ; Holes ; Microcavities ; microcavity ; Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of bulk materials and thin films ; Physics ; Polaritons ; Rabi-splitting energy ; Spectra ; Zinc oxide ; ZnO</subject><ispartof>Physica Status Solidi (b), 2011-02, Vol.248 (2), p.460-463</ispartof><rights>Copyright © 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3900-57767ccbb253084001760a908534e9995e4fa6544572e67d7ef0d9b045fd3dea3</citedby><cites>FETCH-LOGICAL-c3900-57767ccbb253084001760a908534e9995e4fa6544572e67d7ef0d9b045fd3dea3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fpssb.201000620$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fpssb.201000620$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27915,27916,45565,45566</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23849118$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kawase, Toshiki</creatorcontrib><creatorcontrib>Kim, DaeGwi</creatorcontrib><creatorcontrib>Miyazaki, Kenichi</creatorcontrib><creatorcontrib>Nakayama, Masaaki</creatorcontrib><title>Exciton polaritons in ZnO microcavities with different active layer thicknesses</title><title>Physica Status Solidi (b)</title><addtitle>phys. stat. sol. (b)</addtitle><description>We have investigated the characteristics of exciton polaritons in ZnO microcavities with different active layer thicknesses. The microcavity was made from a bulk ZnO active layer and two distributed Bragg reflectors (DBRs) consisting of HfO2 and SiO2 layers. We adopted rf magnetron sputtering and pulsed laser deposition for the preparation of the DBR and ZnO active layer, respectively. Angle‐resolved reflectance spectra demonstrate the formation of cavity polaritons. From the analysis using a phenomenological Hamiltonian for the coupling between the cavity photon and three kinds of excitons labeled A, B, and C peculiar to ZnO, the vacuum Rabi‐splitting energies in the λ/2‐microcavity are estimated to be 30, 71, and 84 meV for the A, B, and C excitons, respectively. Moreover, we indicate the potential to control the Rabi‐splitting energy by changing the active layer thickness.</description><subject>Bragg reflectors</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Electron states</subject><subject>Exact sciences and technology</subject><subject>Excitation</subject><subject>exciton polariton</subject><subject>Excitons and related phenomena</subject><subject>Hafnium oxide</subject><subject>Holes</subject><subject>Microcavities</subject><subject>microcavity</subject><subject>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of bulk materials and thin films</subject><subject>Physics</subject><subject>Polaritons</subject><subject>Rabi-splitting energy</subject><subject>Spectra</subject><subject>Zinc oxide</subject><subject>ZnO</subject><issn>0370-1972</issn><issn>1521-3951</issn><issn>1521-3951</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqFkEtP4zAUhS00SHSALWtvRppNyrUdx_FyQDxGqihSeUhsLNe5EYY06fiGR__9pGpVsWN1zuI75-oexk4EjAWAPF0SzccSBg-FhD02ElqKTFktfrARKAOZsEYesJ9ELwNjhBIjNr34DLHvWr7sGp_Wjnhs-VM75YsYUhf8e-wjEv-I_TOvYl1jwrbnPvTxHXnjV5h4_xzDa4tESEdsv_YN4fFWD9n95cXd-XU2mV79Pf8zyYKyAJk2pjAhzOdSKyhzAGEK8BZKrXK01mrMa1_oPNdGYmEqgzVUdg65ritVoVeH7Pemd5m6f29IvVtECtg0vsXujZwAJWRpBxnQ8QYd3iFKWLtligufVgPk1su59XJut9wQ-LXt9hR8Uyffhki7lFRlboUoB85uuI_Y4OqbVnc7m519vZFtspF6_NxlfXp1hVFGu8ebK_dwlwszOzPuWv0HMYGOUw</recordid><startdate>201102</startdate><enddate>201102</enddate><creator>Kawase, Toshiki</creator><creator>Kim, DaeGwi</creator><creator>Miyazaki, Kenichi</creator><creator>Nakayama, Masaaki</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201102</creationdate><title>Exciton polaritons in ZnO microcavities with different active layer thicknesses</title><author>Kawase, Toshiki ; Kim, DaeGwi ; Miyazaki, Kenichi ; Nakayama, Masaaki</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3900-57767ccbb253084001760a908534e9995e4fa6544572e67d7ef0d9b045fd3dea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Bragg reflectors</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Electron states</topic><topic>Exact sciences and technology</topic><topic>Excitation</topic><topic>exciton polariton</topic><topic>Excitons and related phenomena</topic><topic>Hafnium oxide</topic><topic>Holes</topic><topic>Microcavities</topic><topic>microcavity</topic><topic>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of bulk materials and thin films</topic><topic>Physics</topic><topic>Polaritons</topic><topic>Rabi-splitting energy</topic><topic>Spectra</topic><topic>Zinc oxide</topic><topic>ZnO</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kawase, Toshiki</creatorcontrib><creatorcontrib>Kim, DaeGwi</creatorcontrib><creatorcontrib>Miyazaki, Kenichi</creatorcontrib><creatorcontrib>Nakayama, Masaaki</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica Status Solidi (b)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kawase, Toshiki</au><au>Kim, DaeGwi</au><au>Miyazaki, Kenichi</au><au>Nakayama, Masaaki</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Exciton polaritons in ZnO microcavities with different active layer thicknesses</atitle><jtitle>Physica Status Solidi (b)</jtitle><addtitle>phys. stat. sol. (b)</addtitle><date>2011-02</date><risdate>2011</risdate><volume>248</volume><issue>2</issue><spage>460</spage><epage>463</epage><pages>460-463</pages><issn>0370-1972</issn><issn>1521-3951</issn><eissn>1521-3951</eissn><coden>PSSBBD</coden><abstract>We have investigated the characteristics of exciton polaritons in ZnO microcavities with different active layer thicknesses. The microcavity was made from a bulk ZnO active layer and two distributed Bragg reflectors (DBRs) consisting of HfO2 and SiO2 layers. We adopted rf magnetron sputtering and pulsed laser deposition for the preparation of the DBR and ZnO active layer, respectively. Angle‐resolved reflectance spectra demonstrate the formation of cavity polaritons. From the analysis using a phenomenological Hamiltonian for the coupling between the cavity photon and three kinds of excitons labeled A, B, and C peculiar to ZnO, the vacuum Rabi‐splitting energies in the λ/2‐microcavity are estimated to be 30, 71, and 84 meV for the A, B, and C excitons, respectively. Moreover, we indicate the potential to control the Rabi‐splitting energy by changing the active layer thickness.</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/pssb.201000620</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0370-1972 |
ispartof | Physica Status Solidi (b), 2011-02, Vol.248 (2), p.460-463 |
issn | 0370-1972 1521-3951 1521-3951 |
language | eng |
recordid | cdi_proquest_miscellaneous_1031289103 |
source | Wiley-Blackwell Journals |
subjects | Bragg reflectors Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron states Exact sciences and technology Excitation exciton polariton Excitons and related phenomena Hafnium oxide Holes Microcavities microcavity Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics Polaritons Rabi-splitting energy Spectra Zinc oxide ZnO |
title | Exciton polaritons in ZnO microcavities with different active layer thicknesses |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T19%3A55%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Exciton%20polaritons%20in%20ZnO%20microcavities%20with%20different%20active%20layer%20thicknesses&rft.jtitle=Physica%20Status%20Solidi%20(b)&rft.au=Kawase,%20Toshiki&rft.date=2011-02&rft.volume=248&rft.issue=2&rft.spage=460&rft.epage=463&rft.pages=460-463&rft.issn=0370-1972&rft.eissn=1521-3951&rft.coden=PSSBBD&rft_id=info:doi/10.1002/pssb.201000620&rft_dat=%3Cproquest_cross%3E1031289103%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1031289103&rft_id=info:pmid/&rfr_iscdi=true |