Gas gun shock experiments with single-pulse x-ray phase contrast imaging and diffraction at the Advanced Photon Source
The highly transient nature of shock loading and pronounced microstructure effects on dynamic materials response call for in situ, temporally and spatially resolved, x-ray-based diagnostics. Third-generation synchrotron x-ray sources are advantageous for x-ray phase contrast imaging (PCI) and diffra...
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Veröffentlicht in: | Review of scientific instruments 2012-07, Vol.83 (7), p.073903-073903 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The highly transient nature of shock loading and pronounced microstructure effects on dynamic materials response call for in situ, temporally and spatially resolved, x-ray-based diagnostics. Third-generation synchrotron x-ray sources are advantageous for x-ray phase contrast imaging (PCI) and diffraction under dynamic loading, due to their high photon fluxes, high coherency, and high pulse repetition rates. The feasibility of bulk-scale gas gun shock experiments with dynamic x-ray PCI and diffraction measurements was investigated at the beamline 32ID-B of the Advanced Photon Source. The x-ray beam characteristics, experimental setup, x-ray diagnostics, and static and dynamic test results are described. We demonstrate ultrafast, multiframe, single-pulse PCI measurements with unprecedented temporal ( |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.4733704 |