Surface Roughness and Light Scattering in a Small Effective Area Microstructured Fiber
We report here the combined study of air/silica surface roughness and light scattering in a microstructured optical fiber designed for non-linear operation. Side polishing of the fiber gave access to the surface of the holes, and allowed measurements of their roughness by atomic force microscopy. Th...
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| Veröffentlicht in: | Journal of lightwave technology 2009-06, Vol.27 (11), p.1597-1604 |
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| container_title | Journal of lightwave technology |
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| creator | Minh-Chau Phan-Huy Moison, J.-M. Levenson, J.A. Richard, S. Melin, G. Douay, M. Quiquempois, Y. |
| description | We report here the combined study of air/silica surface roughness and light scattering in a microstructured optical fiber designed for non-linear operation. Side polishing of the fiber gave access to the surface of the holes, and allowed measurements of their roughness by atomic force microscopy. The observed roughness topography, not reported in such fibers until now, consists of a rather regular arrangement of shallow patterns with lateral size in the micron range and amplitude in the 10 nm range. By comparing measured angle-resolved scattering patterns to coupled-mode calculations, we show that roughness-induced scattering loss can be linked to both the roughness and the overlap of fundamental with radiative modes at the air/silica interfaces. The reduction of surface roughness amplitude down to the thermodynamic limit could permit to strongly decrease the threshold of Raman fiber lasers. |
| doi_str_mv | 10.1109/JLT.2009.2020608 |
| format | Article |
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Side polishing of the fiber gave access to the surface of the holes, and allowed measurements of their roughness by atomic force microscopy. The observed roughness topography, not reported in such fibers until now, consists of a rather regular arrangement of shallow patterns with lateral size in the micron range and amplitude in the 10 nm range. By comparing measured angle-resolved scattering patterns to coupled-mode calculations, we show that roughness-induced scattering loss can be linked to both the roughness and the overlap of fundamental with radiative modes at the air/silica interfaces. The reduction of surface roughness amplitude down to the thermodynamic limit could permit to strongly decrease the threshold of Raman fiber lasers.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2009.2020608</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Amplitudes ; Atomic force microscopy ; Atomic measurements ; Fibers ; Force measurement ; Light scattering ; microstructured optical fiber ; Optical fibers ; Photonic crystal fibers ; Raman laser ; Rough surfaces ; Roughness ; Scattering ; scattering loss ; Silicon compounds ; Silicon dioxide ; Surface roughness ; Surface topography ; Topography</subject><ispartof>Journal of lightwave technology, 2009-06, Vol.27 (11), p.1597-1604</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c433t-a4a6fb75d3e1c7313a69697645352926553e9b0f62dc3d0092893b6441edd0093</citedby><cites>FETCH-LOGICAL-c433t-a4a6fb75d3e1c7313a69697645352926553e9b0f62dc3d0092893b6441edd0093</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5037986$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5037986$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Minh-Chau Phan-Huy</creatorcontrib><creatorcontrib>Moison, J.-M.</creatorcontrib><creatorcontrib>Levenson, J.A.</creatorcontrib><creatorcontrib>Richard, S.</creatorcontrib><creatorcontrib>Melin, G.</creatorcontrib><creatorcontrib>Douay, M.</creatorcontrib><creatorcontrib>Quiquempois, Y.</creatorcontrib><title>Surface Roughness and Light Scattering in a Small Effective Area Microstructured Fiber</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>We report here the combined study of air/silica surface roughness and light scattering in a microstructured optical fiber designed for non-linear operation. Side polishing of the fiber gave access to the surface of the holes, and allowed measurements of their roughness by atomic force microscopy. The observed roughness topography, not reported in such fibers until now, consists of a rather regular arrangement of shallow patterns with lateral size in the micron range and amplitude in the 10 nm range. By comparing measured angle-resolved scattering patterns to coupled-mode calculations, we show that roughness-induced scattering loss can be linked to both the roughness and the overlap of fundamental with radiative modes at the air/silica interfaces. The reduction of surface roughness amplitude down to the thermodynamic limit could permit to strongly decrease the threshold of Raman fiber lasers.</description><subject>Amplitudes</subject><subject>Atomic force microscopy</subject><subject>Atomic measurements</subject><subject>Fibers</subject><subject>Force measurement</subject><subject>Light scattering</subject><subject>microstructured optical fiber</subject><subject>Optical fibers</subject><subject>Photonic crystal fibers</subject><subject>Raman laser</subject><subject>Rough surfaces</subject><subject>Roughness</subject><subject>Scattering</subject><subject>scattering loss</subject><subject>Silicon compounds</subject><subject>Silicon dioxide</subject><subject>Surface roughness</subject><subject>Surface topography</subject><subject>Topography</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kctLw0AQxhdRsD7ugpfFg3qJ7jvZYymtDyKCVa9hu5nULWlSdxPB_94NFQ8eeplh4Dcz38yH0BklN5QSffuYv94wQnQMjCiS7aERlTJLGKN8H41IynmSpUwcoqMQVoRQIbJ0hN7nva-MBfzS9suPBkLApilx7pYfHZ5b03XgXbPErsEGz9emrvG0qsB27gvw2IPBT876NnS-t13vocQztwB_gg4qUwc4_c3H6G02fZ3cJ_nz3cNknCdWcN4lRhhVLVJZcqA25ZQbpZVOlZBcMs2UlBz0glSKlZaX8TqWab5QQlAoh5Ifo6vt3I1vP3sIXbF2wUJdmwbaPhRZKgmTjLJIXu4kueIivk1F8HonSAljmjBNZUQv_qGrtvdNPLjIZFxNhR4kki00vCl4qIqNd2vjv-OkYrCuiNYVg3XFr3Wx5Xzb4gDgD5eEpzoK_AEDC5Hc</recordid><startdate>20090601</startdate><enddate>20090601</enddate><creator>Minh-Chau Phan-Huy</creator><creator>Moison, J.-M.</creator><creator>Levenson, J.A.</creator><creator>Richard, S.</creator><creator>Melin, G.</creator><creator>Douay, M.</creator><creator>Quiquempois, Y.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20090601</creationdate><title>Surface Roughness and Light Scattering in a Small Effective Area Microstructured Fiber</title><author>Minh-Chau Phan-Huy ; Moison, J.-M. ; Levenson, J.A. ; Richard, S. ; Melin, G. ; Douay, M. ; Quiquempois, Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c433t-a4a6fb75d3e1c7313a69697645352926553e9b0f62dc3d0092893b6441edd0093</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Amplitudes</topic><topic>Atomic force microscopy</topic><topic>Atomic measurements</topic><topic>Fibers</topic><topic>Force measurement</topic><topic>Light scattering</topic><topic>microstructured optical fiber</topic><topic>Optical fibers</topic><topic>Photonic crystal fibers</topic><topic>Raman laser</topic><topic>Rough surfaces</topic><topic>Roughness</topic><topic>Scattering</topic><topic>scattering loss</topic><topic>Silicon compounds</topic><topic>Silicon dioxide</topic><topic>Surface roughness</topic><topic>Surface topography</topic><topic>Topography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Minh-Chau Phan-Huy</creatorcontrib><creatorcontrib>Moison, J.-M.</creatorcontrib><creatorcontrib>Levenson, J.A.</creatorcontrib><creatorcontrib>Richard, S.</creatorcontrib><creatorcontrib>Melin, G.</creatorcontrib><creatorcontrib>Douay, M.</creatorcontrib><creatorcontrib>Quiquempois, Y.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Minh-Chau Phan-Huy</au><au>Moison, J.-M.</au><au>Levenson, J.A.</au><au>Richard, S.</au><au>Melin, G.</au><au>Douay, M.</au><au>Quiquempois, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface Roughness and Light Scattering in a Small Effective Area Microstructured Fiber</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2009-06-01</date><risdate>2009</risdate><volume>27</volume><issue>11</issue><spage>1597</spage><epage>1604</epage><pages>1597-1604</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>We report here the combined study of air/silica surface roughness and light scattering in a microstructured optical fiber designed for non-linear operation. Side polishing of the fiber gave access to the surface of the holes, and allowed measurements of their roughness by atomic force microscopy. The observed roughness topography, not reported in such fibers until now, consists of a rather regular arrangement of shallow patterns with lateral size in the micron range and amplitude in the 10 nm range. By comparing measured angle-resolved scattering patterns to coupled-mode calculations, we show that roughness-induced scattering loss can be linked to both the roughness and the overlap of fundamental with radiative modes at the air/silica interfaces. The reduction of surface roughness amplitude down to the thermodynamic limit could permit to strongly decrease the threshold of Raman fiber lasers.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JLT.2009.2020608</doi><tpages>8</tpages></addata></record> |
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| ispartof | Journal of lightwave technology, 2009-06, Vol.27 (11), p.1597-1604 |
| issn | 0733-8724 1558-2213 |
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| source | IEEE Electronic Library (IEL) |
| subjects | Amplitudes Atomic force microscopy Atomic measurements Fibers Force measurement Light scattering microstructured optical fiber Optical fibers Photonic crystal fibers Raman laser Rough surfaces Roughness Scattering scattering loss Silicon compounds Silicon dioxide Surface roughness Surface topography Topography |
| title | Surface Roughness and Light Scattering in a Small Effective Area Microstructured Fiber |
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