Optical frequency domain reflectometry with a narrow linewidth fiber laser
The present a new optical frequency domain reflectometer based on a tunable fiber laser with a very narrow linewidth (about 10 kHz). This instrument performs reflectivity measurements with -110 dB sensitivity and 80 dB dynamic range. The narrow linewidth allows long-range measurements, at 150 m, wit...
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Veröffentlicht in: | IEEE photonics technology letters 2000-07, Vol.12 (7), p.867-869 |
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container_title | IEEE photonics technology letters |
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creator | Oberson, P. Huttner, B. Guinnard, O. Guinnard, L. Ribordy, G. Gisin, N. |
description | The present a new optical frequency domain reflectometer based on a tunable fiber laser with a very narrow linewidth (about 10 kHz). This instrument performs reflectivity measurements with -110 dB sensitivity and 80 dB dynamic range. The narrow linewidth allows long-range measurements, at 150 m, with a spatial resolution of 16 cm. At short range, about 5 m, the resolution increases to subcentimeter. |
doi_str_mv | 10.1109/68.853529 |
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fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_1022892409</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>853529</ieee_id><sourcerecordid>28566572</sourcerecordid><originalsourceid>FETCH-LOGICAL-c337t-b77009889834caf9d6604094546f54eadfa3f9f64cdb77ab878960020e547693</originalsourceid><addsrcrecordid>eNp90EtLAzEQB_AgCtbqwaun4EH0sDXZvI9SfFLopfclzU4wZR812VL67Y1s8eDBU4bMj5nkj9A1JTNKiXmUeqYFE6U5QRNqOC0IVfw01yTXlDJxji5S2hBCuWB8gj6W2yE422Af4WsHnTvgum9t6HAE34Ab-haGeMD7MHxiizsbY7_HTehgH-p85cMaIm5sgniJzrxtElwdzylavTyv5m_FYvn6Pn9aFI4xNRRrpQgxWhvNuLPe1FISTgwXXHrBwdbeMm-85K7O1K610kYSUhIQXEnDpuhuHLuNfX5xGqo2JAdNYzvod6kqtZBSqDLD-38hJWWpTZl3Z3r7h276XezyLyqtuVGKlzqjhxG52KeU46m2MbQ2HvKk6if8SupqDD_bm9EGAPh1x-Y3B6h9fw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884977428</pqid></control><display><type>article</type><title>Optical frequency domain reflectometry with a narrow linewidth fiber laser</title><source>IEEE Electronic Library (IEL)</source><creator>Oberson, P. ; Huttner, B. ; Guinnard, O. ; Guinnard, L. ; Ribordy, G. ; Gisin, N.</creator><creatorcontrib>Oberson, P. ; Huttner, B. ; Guinnard, O. ; Guinnard, L. ; Ribordy, G. ; Gisin, N.</creatorcontrib><description>The present a new optical frequency domain reflectometer based on a tunable fiber laser with a very narrow linewidth (about 10 kHz). This instrument performs reflectivity measurements with -110 dB sensitivity and 80 dB dynamic range. The narrow linewidth allows long-range measurements, at 150 m, with a spatial resolution of 16 cm. At short range, about 5 m, the resolution increases to subcentimeter.</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/68.853529</identifier><identifier>CODEN: IPTLEL</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Dynamic range ; Fiber lasers ; Frequency domain analysis ; Instruments ; Noise levels ; Optical frequency ; Optical sensors ; Performance evaluation ; Photonics ; Reflectivity ; Reflectometers ; Reflectometry ; Spatial resolution ; Tunable circuits and devices</subject><ispartof>IEEE photonics technology letters, 2000-07, Vol.12 (7), p.867-869</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c337t-b77009889834caf9d6604094546f54eadfa3f9f64cdb77ab878960020e547693</citedby><cites>FETCH-LOGICAL-c337t-b77009889834caf9d6604094546f54eadfa3f9f64cdb77ab878960020e547693</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/853529$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/853529$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Oberson, P.</creatorcontrib><creatorcontrib>Huttner, B.</creatorcontrib><creatorcontrib>Guinnard, O.</creatorcontrib><creatorcontrib>Guinnard, L.</creatorcontrib><creatorcontrib>Ribordy, G.</creatorcontrib><creatorcontrib>Gisin, N.</creatorcontrib><title>Optical frequency domain reflectometry with a narrow linewidth fiber laser</title><title>IEEE photonics technology letters</title><addtitle>LPT</addtitle><description>The present a new optical frequency domain reflectometer based on a tunable fiber laser with a very narrow linewidth (about 10 kHz). This instrument performs reflectivity measurements with -110 dB sensitivity and 80 dB dynamic range. The narrow linewidth allows long-range measurements, at 150 m, with a spatial resolution of 16 cm. At short range, about 5 m, the resolution increases to subcentimeter.</description><subject>Dynamic range</subject><subject>Fiber lasers</subject><subject>Frequency domain analysis</subject><subject>Instruments</subject><subject>Noise levels</subject><subject>Optical frequency</subject><subject>Optical sensors</subject><subject>Performance evaluation</subject><subject>Photonics</subject><subject>Reflectivity</subject><subject>Reflectometers</subject><subject>Reflectometry</subject><subject>Spatial resolution</subject><subject>Tunable circuits and devices</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp90EtLAzEQB_AgCtbqwaun4EH0sDXZvI9SfFLopfclzU4wZR812VL67Y1s8eDBU4bMj5nkj9A1JTNKiXmUeqYFE6U5QRNqOC0IVfw01yTXlDJxji5S2hBCuWB8gj6W2yE422Af4WsHnTvgum9t6HAE34Ab-haGeMD7MHxiizsbY7_HTehgH-p85cMaIm5sgniJzrxtElwdzylavTyv5m_FYvn6Pn9aFI4xNRRrpQgxWhvNuLPe1FISTgwXXHrBwdbeMm-85K7O1K610kYSUhIQXEnDpuhuHLuNfX5xGqo2JAdNYzvod6kqtZBSqDLD-38hJWWpTZl3Z3r7h276XezyLyqtuVGKlzqjhxG52KeU46m2MbQ2HvKk6if8SupqDD_bm9EGAPh1x-Y3B6h9fw</recordid><startdate>20000701</startdate><enddate>20000701</enddate><creator>Oberson, P.</creator><creator>Huttner, B.</creator><creator>Guinnard, O.</creator><creator>Guinnard, L.</creator><creator>Ribordy, G.</creator><creator>Gisin, N.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope></search><sort><creationdate>20000701</creationdate><title>Optical frequency domain reflectometry with a narrow linewidth fiber laser</title><author>Oberson, P. ; Huttner, B. ; Guinnard, O. ; Guinnard, L. ; Ribordy, G. ; Gisin, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-b77009889834caf9d6604094546f54eadfa3f9f64cdb77ab878960020e547693</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Dynamic range</topic><topic>Fiber lasers</topic><topic>Frequency domain analysis</topic><topic>Instruments</topic><topic>Noise levels</topic><topic>Optical frequency</topic><topic>Optical sensors</topic><topic>Performance evaluation</topic><topic>Photonics</topic><topic>Reflectivity</topic><topic>Reflectometers</topic><topic>Reflectometry</topic><topic>Spatial resolution</topic><topic>Tunable circuits and devices</topic><toplevel>online_resources</toplevel><creatorcontrib>Oberson, P.</creatorcontrib><creatorcontrib>Huttner, B.</creatorcontrib><creatorcontrib>Guinnard, O.</creatorcontrib><creatorcontrib>Guinnard, L.</creatorcontrib><creatorcontrib>Ribordy, G.</creatorcontrib><creatorcontrib>Gisin, N.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><jtitle>IEEE photonics technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Oberson, P.</au><au>Huttner, B.</au><au>Guinnard, O.</au><au>Guinnard, L.</au><au>Ribordy, G.</au><au>Gisin, N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical frequency domain reflectometry with a narrow linewidth fiber laser</atitle><jtitle>IEEE photonics technology letters</jtitle><stitle>LPT</stitle><date>2000-07-01</date><risdate>2000</risdate><volume>12</volume><issue>7</issue><spage>867</spage><epage>869</epage><pages>867-869</pages><issn>1041-1135</issn><eissn>1941-0174</eissn><coden>IPTLEL</coden><abstract>The present a new optical frequency domain reflectometer based on a tunable fiber laser with a very narrow linewidth (about 10 kHz). This instrument performs reflectivity measurements with -110 dB sensitivity and 80 dB dynamic range. The narrow linewidth allows long-range measurements, at 150 m, with a spatial resolution of 16 cm. At short range, about 5 m, the resolution increases to subcentimeter.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/68.853529</doi><tpages>3</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) |
subjects | Dynamic range Fiber lasers Frequency domain analysis Instruments Noise levels Optical frequency Optical sensors Performance evaluation Photonics Reflectivity Reflectometers Reflectometry Spatial resolution Tunable circuits and devices |
title | Optical frequency domain reflectometry with a narrow linewidth fiber laser |
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