Analysis and fragmentation of organic samples by (low-energy) dynamic SIMS
Up to now, the analysis of organic or biological samples was mainly investigated using static SIMS, while dynamic SIMS was generally limited to the analysis of inorganic samples. The increasing sophistication of organic optoelectronic devices (e.g. organic light emitting diodes and organic photovolt...
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| Veröffentlicht in: | Surface and interface analysis 2011-01, Vol.43 (1-2), p.88-91 |
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| container_title | Surface and interface analysis |
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| creator | Ngo, K. Q. Philipp, P. Jin, Y. Morris, S. E. Shtein, M. Kieffer, J. Wirtz, T. |
| description | Up to now, the analysis of organic or biological samples was mainly investigated using static SIMS, while dynamic SIMS was generally limited to the analysis of inorganic samples. The increasing sophistication of organic optoelectronic devices (e.g. organic light emitting diodes and organic photovoltaic cells, etc.) requires molecular‐level dimensional control in the fabrication of multilayered structures with specifically engineered interfaces. However, analytical tools for monitoring such fabrication precision are scarce. In a current project, we address this challenge by advancing the development of low‐energy Secondary Ion Mass Spectrometry (LE‐SIMS) for the analysis of organic‐based optoelectronic materials systems.
In the present work, we investigate the fragmentation as well as the ionization mechanisms for several molecules used in such devices: fullerene, copper phthalocyanine and tris(8‐hydroxyquinolinato) aluminium have been deposited onto silicon wafers. The study has been carried out on a Cameca SC‐Ultra instrument under Cs+ bombardment for various impact energies in the M− mode. Constant M− secondary ion intensities have been observed throughout the organic layers for some characteristic fragments of the organic molecules. Copyright © 2010 John Wiley & Sons, Ltd. |
| doi_str_mv | 10.1002/sia.3533 |
| format | Article |
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In the present work, we investigate the fragmentation as well as the ionization mechanisms for several molecules used in such devices: fullerene, copper phthalocyanine and tris(8‐hydroxyquinolinato) aluminium have been deposited onto silicon wafers. The study has been carried out on a Cameca SC‐Ultra instrument under Cs+ bombardment for various impact energies in the M− mode. Constant M− secondary ion intensities have been observed throughout the organic layers for some characteristic fragments of the organic molecules. Copyright © 2010 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0142-2421</identifier><identifier>ISSN: 1096-9918</identifier><identifier>EISSN: 1096-9918</identifier><identifier>DOI: 10.1002/sia.3533</identifier><identifier>CODEN: SIANDQ</identifier><language>eng</language><publisher>Chichester, UK: John Wiley & Sons, Ltd</publisher><subject>Atomic, molecular, and ion beam impact and interactions with surfaces ; cluster abundance distribution ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; COPPER PHTHALOCYANINE ; Devices ; Dynamic tests ; Dynamics ; Electron and ion emission by liquids and solids; impact phenomena ; ELECTRONIC PRODUCTS ; Exact sciences and technology ; Fragmentation ; Fragments ; impact energy ; Impact phenomena (including electron spectra and sputtering) ; Ionization ; Optoelectronic devices ; ORGANIC COMPOUNDS ; Physics ; Secondary ion mass spectrometry ; SIMS ; SOLAR CELLS ; sputtering</subject><ispartof>Surface and interface analysis, 2011-01, Vol.43 (1-2), p.88-91</ispartof><rights>Copyright © 2010 John Wiley & Sons, Ltd.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4003-4d7991c5d50e8fc914bd7ebf2f27058262189b66e9a31c0bde2022fed1d4a5173</citedby><cites>FETCH-LOGICAL-c4003-4d7991c5d50e8fc914bd7ebf2f27058262189b66e9a31c0bde2022fed1d4a5173</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsia.3533$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsia.3533$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,1417,4049,4050,23929,23930,25139,27923,27924,45573,45574</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23798361$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Ngo, K. Q.</creatorcontrib><creatorcontrib>Philipp, P.</creatorcontrib><creatorcontrib>Jin, Y.</creatorcontrib><creatorcontrib>Morris, S. E.</creatorcontrib><creatorcontrib>Shtein, M.</creatorcontrib><creatorcontrib>Kieffer, J.</creatorcontrib><creatorcontrib>Wirtz, T.</creatorcontrib><title>Analysis and fragmentation of organic samples by (low-energy) dynamic SIMS</title><title>Surface and interface analysis</title><addtitle>Surf. Interface Anal</addtitle><description>Up to now, the analysis of organic or biological samples was mainly investigated using static SIMS, while dynamic SIMS was generally limited to the analysis of inorganic samples. The increasing sophistication of organic optoelectronic devices (e.g. organic light emitting diodes and organic photovoltaic cells, etc.) requires molecular‐level dimensional control in the fabrication of multilayered structures with specifically engineered interfaces. However, analytical tools for monitoring such fabrication precision are scarce. In a current project, we address this challenge by advancing the development of low‐energy Secondary Ion Mass Spectrometry (LE‐SIMS) for the analysis of organic‐based optoelectronic materials systems.
In the present work, we investigate the fragmentation as well as the ionization mechanisms for several molecules used in such devices: fullerene, copper phthalocyanine and tris(8‐hydroxyquinolinato) aluminium have been deposited onto silicon wafers. The study has been carried out on a Cameca SC‐Ultra instrument under Cs+ bombardment for various impact energies in the M− mode. Constant M− secondary ion intensities have been observed throughout the organic layers for some characteristic fragments of the organic molecules. Copyright © 2010 John Wiley & Sons, Ltd.</description><subject>Atomic, molecular, and ion beam impact and interactions with surfaces</subject><subject>cluster abundance distribution</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>COPPER PHTHALOCYANINE</subject><subject>Devices</subject><subject>Dynamic tests</subject><subject>Dynamics</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>ELECTRONIC PRODUCTS</subject><subject>Exact sciences and technology</subject><subject>Fragmentation</subject><subject>Fragments</subject><subject>impact energy</subject><subject>Impact phenomena (including electron spectra and sputtering)</subject><subject>Ionization</subject><subject>Optoelectronic devices</subject><subject>ORGANIC COMPOUNDS</subject><subject>Physics</subject><subject>Secondary ion mass spectrometry</subject><subject>SIMS</subject><subject>SOLAR CELLS</subject><subject>sputtering</subject><issn>0142-2421</issn><issn>1096-9918</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp10E1PwjAcx_HGaCKiiS9hFxM8DPuwtd0RiQI-4AEfjk3XtaS6ddiO4N69IxA8eeqhn3zzzw-ASwSHCEJ8E6wckpSQI9BDMKNxliF-DHoQJTjGCUan4CyETwghJ5z2wMPIybINNkTSFZHxcllp18jG1i6qTVT7pXRWRUFWq1KHKG-jQVlvYu20X7bXUdE6WXX_i9nz4hycGFkGfbF_--Dt_u51PI2fXiaz8egpVgmEJE4K1t2k0iKFmhuVoSQvmM4NNpjBlGOKEc9ySnUmCVIwLzSGGBtdoCKRKWKkDwa77srX32sdGlHZoHRZSqfrdRCo45wyTuEfVb4OwWsjVt5W0rcdEtu5RDeX2M7V0at9VQYly24Jp2w4eExYxglFnYt3bmNL3f7bE4vZaN_dexsa_XPw0n8JyghLxcd8Iuj8_ZZMKROP5BfqNIYm</recordid><startdate>201101</startdate><enddate>201101</enddate><creator>Ngo, K. 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Q.</creatorcontrib><creatorcontrib>Philipp, P.</creatorcontrib><creatorcontrib>Jin, Y.</creatorcontrib><creatorcontrib>Morris, S. E.</creatorcontrib><creatorcontrib>Shtein, M.</creatorcontrib><creatorcontrib>Kieffer, J.</creatorcontrib><creatorcontrib>Wirtz, T.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ngo, K. Q.</au><au>Philipp, P.</au><au>Jin, Y.</au><au>Morris, S. 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However, analytical tools for monitoring such fabrication precision are scarce. In a current project, we address this challenge by advancing the development of low‐energy Secondary Ion Mass Spectrometry (LE‐SIMS) for the analysis of organic‐based optoelectronic materials systems.
In the present work, we investigate the fragmentation as well as the ionization mechanisms for several molecules used in such devices: fullerene, copper phthalocyanine and tris(8‐hydroxyquinolinato) aluminium have been deposited onto silicon wafers. The study has been carried out on a Cameca SC‐Ultra instrument under Cs+ bombardment for various impact energies in the M− mode. Constant M− secondary ion intensities have been observed throughout the organic layers for some characteristic fragments of the organic molecules. Copyright © 2010 John Wiley & Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/sia.3533</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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| subjects | Atomic, molecular, and ion beam impact and interactions with surfaces cluster abundance distribution Condensed matter: electronic structure, electrical, magnetic, and optical properties COPPER PHTHALOCYANINE Devices Dynamic tests Dynamics Electron and ion emission by liquids and solids impact phenomena ELECTRONIC PRODUCTS Exact sciences and technology Fragmentation Fragments impact energy Impact phenomena (including electron spectra and sputtering) Ionization Optoelectronic devices ORGANIC COMPOUNDS Physics Secondary ion mass spectrometry SIMS SOLAR CELLS sputtering |
| title | Analysis and fragmentation of organic samples by (low-energy) dynamic SIMS |
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