Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe?
We report on the secondary ion emission under massive cluster (from 100 to 1600 atoms) impacts from different organic samples. The study has been preformed at the Orsay Tandem Accelerator equipped with a Liquid Metal Ion Source (LMIS) using a time of flight (ToF) mass spectrometer (MS) with a multia...
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| Veröffentlicht in: | Surface and interface analysis 2011-01, Vol.43 (1-2), p.62-65 |
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| creator | Della-Negra, S. Depauw, J. Guillermier, C. Schweikert, E. A. |
| description | We report on the secondary ion emission under massive cluster (from 100 to 1600 atoms) impacts from different organic samples. The study has been preformed at the Orsay Tandem Accelerator equipped with a Liquid Metal Ion Source (LMIS) using a time of flight (ToF) mass spectrometer (MS) with a multianode localization detector. The influence of the projectile mass and energy is studied in order to investigate the new hydrodynamic regime of the solid‐particle interaction related to the use of these massive clusters. We shall present this study, the energy range of which extends from 10 qkeV up to 4 qMeV. The results show that the ionic emission intensities increase with the energy and the mass of the projectiles (from n/q = 25 to n/q = 400) which allows the simultaneous emission of a few tens ions of the same mass per impact, what had never before been observed in SIMS. The study of the positive ionic emission is surprising. There is an important emission (also a few tens ions) of H+, H2+, H3+ and C+. The setup permits to determine the angular velocity distributions of the ejected ions. We present the results which permit to distinguish four classes of ionic emission. The molecular ions and molecular clusters are preferentially pushed from the surface by a pressure wave which rises perpendicularly to the beam trajectory. Copyright © 2010 John Wiley & Sons, Ltd. |
| doi_str_mv | 10.1002/sia.3416 |
| format | Article |
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New emission processes? New SIMS probe?</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Della-Negra, S. ; Depauw, J. ; Guillermier, C. ; Schweikert, E. A.</creator><creatorcontrib>Della-Negra, S. ; Depauw, J. ; Guillermier, C. ; Schweikert, E. A.</creatorcontrib><description>We report on the secondary ion emission under massive cluster (from 100 to 1600 atoms) impacts from different organic samples. The study has been preformed at the Orsay Tandem Accelerator equipped with a Liquid Metal Ion Source (LMIS) using a time of flight (ToF) mass spectrometer (MS) with a multianode localization detector. The influence of the projectile mass and energy is studied in order to investigate the new hydrodynamic regime of the solid‐particle interaction related to the use of these massive clusters. We shall present this study, the energy range of which extends from 10 qkeV up to 4 qMeV. The results show that the ionic emission intensities increase with the energy and the mass of the projectiles (from n/q = 25 to n/q = 400) which allows the simultaneous emission of a few tens ions of the same mass per impact, what had never before been observed in SIMS. The study of the positive ionic emission is surprising. There is an important emission (also a few tens ions) of H+, H2+, H3+ and C+. The setup permits to determine the angular velocity distributions of the ejected ions. We present the results which permit to distinguish four classes of ionic emission. The molecular ions and molecular clusters are preferentially pushed from the surface by a pressure wave which rises perpendicularly to the beam trajectory. 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A.</creatorcontrib><title>Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe?</title><title>Surface and interface analysis</title><addtitle>Surf. Interface Anal</addtitle><description>We report on the secondary ion emission under massive cluster (from 100 to 1600 atoms) impacts from different organic samples. The study has been preformed at the Orsay Tandem Accelerator equipped with a Liquid Metal Ion Source (LMIS) using a time of flight (ToF) mass spectrometer (MS) with a multianode localization detector. The influence of the projectile mass and energy is studied in order to investigate the new hydrodynamic regime of the solid‐particle interaction related to the use of these massive clusters. We shall present this study, the energy range of which extends from 10 qkeV up to 4 qMeV. The results show that the ionic emission intensities increase with the energy and the mass of the projectiles (from n/q = 25 to n/q = 400) which allows the simultaneous emission of a few tens ions of the same mass per impact, what had never before been observed in SIMS. The study of the positive ionic emission is surprising. There is an important emission (also a few tens ions) of H+, H2+, H3+ and C+. The setup permits to determine the angular velocity distributions of the ejected ions. We present the results which permit to distinguish four classes of ionic emission. The molecular ions and molecular clusters are preferentially pushed from the surface by a pressure wave which rises perpendicularly to the beam trajectory. Copyright © 2010 John Wiley & Sons, Ltd.</description><subject>Atomic, molecular, and ion beam impact and interactions with surfaces</subject><subject>Beams (radiation)</subject><subject>cluster-SIMS</subject><subject>Clusters</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Detectors</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>Emission</subject><subject>Exact sciences and technology</subject><subject>Impact phenomena (including electron spectra and sputtering)</subject><subject>LMI Source</subject><subject>massive cluster impact</subject><subject>nanoparticle-solid interaction</subject><subject>Physics</subject><subject>Position (location)</subject><subject>Projectiles</subject><subject>Secondary ion emission</subject><subject>Secondary ion mass spectrometry</subject><subject>ToF mass spectrometry</subject><issn>0142-2421</issn><issn>1096-9918</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kE1PwzAMhiMEEmMg8RN6QeLSkcRtmnJBiI8xQQGpfByjLHOlQreyeGPw78nYNE6cbNmPXr9-GTsUvCc4lydU2x4kQm2xjuC5ivNc6G3W4SKRsUyk2GV7RG-ccw1adZgpLFH9iZFr5jRDT6dRia6djKz_jnBch2U7iSrfjqPpO75EszaaFvjSi-5x8bf_8K1DIqSz33k5KMrlbIhn-2ynsg3hwbp22fP11dPFTXz30B9cnN_FDpRS8VC7UZZpKysnQiey3OY60U4qADECG5wrASodCZSpyC1YQFcBDCubCkALXXa80g1np3OkmQneHDaNnWA7JyO4lFplKhF_qPMtkcfKfPh6HP4NkFlmaEKGZplhQI_WqpacbSpvJ66mDS8hyzWkSeDiFbeoG_z-V8-Ug_O17pqvQ-ZfG976d6MyyFLzet83t-WjLIrLG5PBD-JZjc0</recordid><startdate>201101</startdate><enddate>201101</enddate><creator>Della-Negra, S.</creator><creator>Depauw, J.</creator><creator>Guillermier, C.</creator><creator>Schweikert, E. A.</creator><general>John Wiley & Sons, Ltd</general><general>Wiley</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201101</creationdate><title>Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe?</title><author>Della-Negra, S. ; Depauw, J. ; Guillermier, C. ; Schweikert, E. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3666-b8cd778a2fc1cd7179a9848c26331d3a24261365d1e2519a3a3ecf33bfa513ea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Atomic, molecular, and ion beam impact and interactions with surfaces</topic><topic>Beams (radiation)</topic><topic>cluster-SIMS</topic><topic>Clusters</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Detectors</topic><topic>Electron and ion emission by liquids and solids; impact phenomena</topic><topic>Emission</topic><topic>Exact sciences and technology</topic><topic>Impact phenomena (including electron spectra and sputtering)</topic><topic>LMI Source</topic><topic>massive cluster impact</topic><topic>nanoparticle-solid interaction</topic><topic>Physics</topic><topic>Position (location)</topic><topic>Projectiles</topic><topic>Secondary ion emission</topic><topic>Secondary ion mass spectrometry</topic><topic>ToF mass spectrometry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Della-Negra, S.</creatorcontrib><creatorcontrib>Depauw, J.</creatorcontrib><creatorcontrib>Guillermier, C.</creatorcontrib><creatorcontrib>Schweikert, E. A.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Della-Negra, S.</au><au>Depauw, J.</au><au>Guillermier, C.</au><au>Schweikert, E. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe?</atitle><jtitle>Surface and interface analysis</jtitle><addtitle>Surf. Interface Anal</addtitle><date>2011-01</date><risdate>2011</risdate><volume>43</volume><issue>1-2</issue><spage>62</spage><epage>65</epage><pages>62-65</pages><issn>0142-2421</issn><issn>1096-9918</issn><eissn>1096-9918</eissn><coden>SIANDQ</coden><abstract>We report on the secondary ion emission under massive cluster (from 100 to 1600 atoms) impacts from different organic samples. The study has been preformed at the Orsay Tandem Accelerator equipped with a Liquid Metal Ion Source (LMIS) using a time of flight (ToF) mass spectrometer (MS) with a multianode localization detector. The influence of the projectile mass and energy is studied in order to investigate the new hydrodynamic regime of the solid‐particle interaction related to the use of these massive clusters. We shall present this study, the energy range of which extends from 10 qkeV up to 4 qMeV. The results show that the ionic emission intensities increase with the energy and the mass of the projectiles (from n/q = 25 to n/q = 400) which allows the simultaneous emission of a few tens ions of the same mass per impact, what had never before been observed in SIMS. The study of the positive ionic emission is surprising. There is an important emission (also a few tens ions) of H+, H2+, H3+ and C+. The setup permits to determine the angular velocity distributions of the ejected ions. We present the results which permit to distinguish four classes of ionic emission. The molecular ions and molecular clusters are preferentially pushed from the surface by a pressure wave which rises perpendicularly to the beam trajectory. Copyright © 2010 John Wiley & Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/sia.3416</doi><tpages>4</tpages></addata></record> |
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| subjects | Atomic, molecular, and ion beam impact and interactions with surfaces Beams (radiation) cluster-SIMS Clusters Condensed matter: electronic structure, electrical, magnetic, and optical properties Detectors Electron and ion emission by liquids and solids impact phenomena Emission Exact sciences and technology Impact phenomena (including electron spectra and sputtering) LMI Source massive cluster impact nanoparticle-solid interaction Physics Position (location) Projectiles Secondary ion emission Secondary ion mass spectrometry ToF mass spectrometry |
| title | Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe? |
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