Investigation of thermostability and phonon-phonon interactions in Mo6S3I6 nanowires by Raman scattering spectroscopy

Detailed Raman scattering measurements were performed on molybdenum–sulfur–iodine nanowires (Mo6S3I6). At room temperature, 21 well‐resolved Raman modes were experimentally observed for the first time in this new compound. The phase stability and vibrational properties of the nanowires were investig...

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Veröffentlicht in:Journal of Raman spectroscopy 2010-09, Vol.41 (9), p.978-982
Hauptverfasser: Todorović, J. M., Dohčević-Mitrović, Z. D., Ðokić, D. M., Mihailović, D., Popović, Z. V.
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Sprache:eng
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Zusammenfassung:Detailed Raman scattering measurements were performed on molybdenum–sulfur–iodine nanowires (Mo6S3I6). At room temperature, 21 well‐resolved Raman modes were experimentally observed for the first time in this new compound. The phase stability and vibrational properties of the nanowires were investigated by different temperature treatments. High‐temperature Raman spectra showed that the phase separation of Mo6S3I6 nanowires took place between 573 and 673 K, followed by appearance of a new mode at 819 cm−1 characteristic of the MoO3 phase. Low‐temperature Raman scattering spectra showed a significant difference in phonon–phonon interactions between internal and external Raman modes of Mo6S3I6 nanowires. These interesting vibrational properties can give new insights for improved material preparation and achievement of higher conductivity and other functional properties of these otherwise interesting materials. Copyright © 2009 John Wiley & Sons, Ltd. Raman scattering measurements were performed at different temperatures on Mo6S3I6 nanowires. At room temperature, 21 well‐resolved Raman modes were experimentally observed. The Raman spectra showed that the phase separation of Mo6S3I6 nanowires took place between 573 and 673 K. Low‐temperature Raman scattering spectra showed a significant difference in phonon–phonon interactions between internal and external Raman modes of Mo6S3I6 nanowires.
ISSN:0377-0486
1097-4555
1097-4555
DOI:10.1002/jrs.2528