Plasmon nanofocusing in a dielectric hemisphere covered in tapered metal film

We propose and analyze a new type of mechanically robust optical nanofocusing probe with minimized external environmental interference. The probe consists of a dielectric optical fiber terminated by a dielectric hemisphere - both covered in thin gold film whose thickness is reduced (tapered) along the surface of the hemisphere toward its tip. Thus the proposed probe combines the advantages of the diffraction-limited focusing due to annular propagation of the plasmon with its nanofocusing by a tapered metal wedge (i.e. a metal film with reducing local thickness). The numerical finite-element analysis demonstrates strongly subwavelength resolution of the described structure with the achievable size of the focal spot of ~20 nm with up to ~150 times enhancement of the local electric field intensity. Detailed physical interpretations of the obtained results are presented and possible application as a new type of SNOM probe for subwavelength imaging, spectroscopy and sensing are also discussed.