Fast and direct measurements of the electrical properties of graphene using micro four-point probes
We present measurements of the electronic properties of graphene using a repositionable micro four-point probe system, which we show here to have unique advantages over measurements made on lithographically defined devices; namely speed, simplicity and lack of a need to pattern graphene. Measurement...
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| Veröffentlicht in: | Nanotechnology 2011-11, Vol.22 (44), p.445702-1-6 |
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| container_end_page | 1-6 |
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| container_issue | 44 |
| container_start_page | 445702 |
| container_title | Nanotechnology |
| container_volume | 22 |
| creator | Klarskov, M B Dam, H F Petersen, D H Hansen, T M Löwenborg, A Booth, T J Schmidt, M S Lin, R Nielsen, P F Bøggild, P |
| description | We present measurements of the electronic properties of graphene using a repositionable micro four-point probe system, which we show here to have unique advantages over measurements made on lithographically defined devices; namely speed, simplicity and lack of a need to pattern graphene. Measurements are performed in ambient, vacuum and controlled environmental conditions using an environmental scanning electron microscope (SEM). The results are comparable to previous results for microcleaved graphene on silicon dioxide (SiO(2)). We observe a pronounced hysteresis of the charge neutrality point, dependent on the sweep rate of the gate voltage; and environmental measurements provide insight into the sensor application prospects of graphene. The method offers a fast, local and non-destructive technique for electronic measurements on graphene, which can be positioned freely on a graphene flake. |
| doi_str_mv | 10.1088/0957-4484/22/44/445702 |
| format | Article |
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The method offers a fast, local and non-destructive technique for electronic measurements on graphene, which can be positioned freely on a graphene flake.</description><subject>Electric potential</subject><subject>Electrical properties</subject><subject>Electronics</subject><subject>Graphene</subject><subject>Nondestructive testing</subject><subject>Scanning electron microscopy</subject><subject>Silicon dioxide</subject><subject>Voltage</subject><issn>0957-4484</issn><issn>1361-6528</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqFkclOBCEQhonR6Li8guGml3aApoE-GuOWmHjRM6GhUExvQvfBt5dxxrloNKmkDv9X218InVJyQYlSS1JXsuBc8SVjS85zVJKwHbSgpaCFqJjaRYstdIAOU3ojhFLF6D46YLSWVSXKBbI3Jk3Y9A67EMFOuAOT5ggd9FPCg8fTK2BosxKDNS0e4zBCnAJ8iS_RjK_QA55T6F9wF2wcsB_mWIxD6KcV3UA6RnvetAlONvkIPd9cP13dFQ-Pt_dXlw-F5ZJOBQjnlG-kNJVwVNZCCTDclRaMZER6WnMoG98YXjtlGyp8WVvXEFY5JlSlyiN0tu6bx77PkCbdhWShbU0Pw5x0TYjI7hCeyfM_SUpoLQQjJc2oWKP5tJQieD3G0Jn4kSG9eoVeuaxXLmvGctbrV-TC082MuenAbcu-vc9AsQbCMG7V35vp0fnM05_8P0t8AgOQobg</recordid><startdate>20111104</startdate><enddate>20111104</enddate><creator>Klarskov, M B</creator><creator>Dam, H F</creator><creator>Petersen, D H</creator><creator>Hansen, T M</creator><creator>Löwenborg, A</creator><creator>Booth, T J</creator><creator>Schmidt, M S</creator><creator>Lin, R</creator><creator>Nielsen, P F</creator><creator>Bøggild, P</creator><general>IOP Publishing</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>20111104</creationdate><title>Fast and direct measurements of the electrical properties of graphene using micro four-point probes</title><author>Klarskov, M B ; Dam, H F ; Petersen, D H ; Hansen, T M ; Löwenborg, A ; Booth, T J ; Schmidt, M S ; Lin, R ; Nielsen, P F ; Bøggild, P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c471t-e6dd8fb77a56d179686ea4d3cea7207f194e3bfba49d8cb16f39cdb025d268583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Electric potential</topic><topic>Electrical properties</topic><topic>Electronics</topic><topic>Graphene</topic><topic>Nondestructive testing</topic><topic>Scanning electron microscopy</topic><topic>Silicon dioxide</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Klarskov, M B</creatorcontrib><creatorcontrib>Dam, H F</creatorcontrib><creatorcontrib>Petersen, D H</creatorcontrib><creatorcontrib>Hansen, T M</creatorcontrib><creatorcontrib>Löwenborg, A</creatorcontrib><creatorcontrib>Booth, T J</creatorcontrib><creatorcontrib>Schmidt, M S</creatorcontrib><creatorcontrib>Lin, R</creatorcontrib><creatorcontrib>Nielsen, P F</creatorcontrib><creatorcontrib>Bøggild, P</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Klarskov, M B</au><au>Dam, H F</au><au>Petersen, D H</au><au>Hansen, T M</au><au>Löwenborg, A</au><au>Booth, T J</au><au>Schmidt, M S</au><au>Lin, R</au><au>Nielsen, P F</au><au>Bøggild, P</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fast and direct measurements of the electrical properties of graphene using micro four-point probes</atitle><jtitle>Nanotechnology</jtitle><addtitle>Nanotechnology</addtitle><date>2011-11-04</date><risdate>2011</risdate><volume>22</volume><issue>44</issue><spage>445702</spage><epage>1-6</epage><pages>445702-1-6</pages><issn>0957-4484</issn><eissn>1361-6528</eissn><abstract>We present measurements of the electronic properties of graphene using a repositionable micro four-point probe system, which we show here to have unique advantages over measurements made on lithographically defined devices; namely speed, simplicity and lack of a need to pattern graphene. 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| issn | 0957-4484 1361-6528 |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Electric potential Electrical properties Electronics Graphene Nondestructive testing Scanning electron microscopy Silicon dioxide Voltage |
| title | Fast and direct measurements of the electrical properties of graphene using micro four-point probes |
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