Development of scattering near-field optical microspectroscopy apparatus using an infrared synchrotron radiation source
We report the status of a scattering near-field microspectroscopy apparatus developed at SPring-8 using an infrared synchrotron radiation (IR-SR) source. It consists of a scattering type scanning near-field optical microscope and a Fourier transform infrared spectrometer. The IR-SR is used as a high...
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Veröffentlicht in: | Optics communications 2012-04, Vol.285 (8), p.2212-2217 |
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container_title | Optics communications |
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creator | Ikemoto, Yuka Ishikawa, Michio Nakashima, Satoru Okamura, Hidekazu Haruyama, Yuichi Matsui, Shinji Moriwaki, Taro Kinoshita, Toyohiko |
description | We report the status of a scattering near-field microspectroscopy apparatus developed at SPring-8 using an infrared synchrotron radiation (IR-SR) source. It consists of a scattering type scanning near-field optical microscope and a Fourier transform infrared spectrometer. The IR-SR is used as a highly brilliant and broad-band IR source. This apparatus has potential for application in near-field spectroscopy with high spatial resolution beyond the diffraction limit. In order to eliminate background scatterings from the probe shaft and/or sample surface, we used higher harmonic demodulation method. The near-field spectra were observed by 2nd harmonic components using the lock-in detection. The spatial resolution of about 300nm was achieved at around 1000cm−1 (10μm wavelength). |
doi_str_mv | 10.1016/j.optcom.2011.12.106 |
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subjects | Demodulation Diffraction Fourier transforms Infrared radiation Infrared spectroscopy Infrared synchrotron radiation Near-field microscopy Scattering Spatial resolution Spectra Synchrotron radiation |
title | Development of scattering near-field optical microspectroscopy apparatus using an infrared synchrotron radiation source |
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