Electrode Defects in Multilayer Capacitors Part II: Finite Element Analysis of Local Field Enhancement and Leakage Current in Three-Dimensional Microstructures

Multilayer ceramic capacitors (MLCCs), owing to their processing conditions, can exhibit microstructure defects, such as electrode porosity and roughness. The effect of such extrinsic defects on the electrical performance of these devices needs to be understood to achieve successful miniaturization....

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Veröffentlicht in:	Journal of the American Ceramic Society 2012-01, Vol.95 (1), p.264-268
Hauptverfasser:	Samantaray, Malay M., Gurav, Abhijit, Dickey, Elizabeth C., Randall, Clive A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Ceramics Computer simulation Defects Devices Electric fields Electrodes Finite element analysis Leakage current Microstructure Porosity Surface roughness Three dimensional
Online-Zugang:	Volltext
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