AlGaN/GaN C-HEMT structures for dynamic stress detection
In our work, we investigated the possibility of dynamic stress detection based on the piezoelectric polarization using AlGaN/GaN circular high electron mobility transistors (C-HEMTs). In our knowledge, stress sensors in that account are introduced for the first time. The sensor structures exhibit go...
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Veröffentlicht in: | Sensors and actuators. A. Physical. 2011-12, Vol.172 (1), p.98-102 |
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container_title | Sensors and actuators. A. Physical. |
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creator | Vanko, Gabriel Držík, Milan Vallo, Martin Lalinský, Tibor Kutiš, Vladimír Stančík, Stanislav Rýger, Ivan Benčurová, Anna |
description | In our work, we investigated the possibility of dynamic stress detection based on the piezoelectric polarization using AlGaN/GaN circular high electron mobility transistors (C-HEMTs). In our knowledge, stress sensors in that account are introduced for the first time. The sensor structures exhibit good linearity in the piezoelectric response under dynamic stress conditions. The measurements reveal excellent stress detection sensitivity that is independent on the measured frequency range. The sensitivity of the devices can be easily increased by increase of the area of the Schottky gate ring electrode. The further increase of the sensitivity can be tuned by an optimal selection of the DC drain and gate bias. |
doi_str_mv | 10.1016/j.sna.2011.02.049 |
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The further increase of the sensitivity can be tuned by an optimal selection of the DC drain and gate bias.</description><subject>AlGaN/GaN</subject><subject>Aluminum gallium nitrides</subject><subject>Cantilever</subject><subject>Circular HEMT</subject><subject>Dynamics</subject><subject>Gallium nitrides</subject><subject>Gates</subject><subject>Linearity</subject><subject>Piezoelectric response</subject><subject>Piezoelectricity</subject><subject>Sensors</subject><subject>stress sensor</subject><subject>Stresses</subject><issn>0924-4247</issn><issn>1873-3069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp9kE9Lw0AQxRdRsFY_gLccvSTO_mk2wVMptRWqXup52c5OYEua1N1E6Ld3Sz07MAw8fm_gPcYeORQcePm8L2JnCwGcFyAKUPUVm_BKy1xCWV-zCdRC5UoofcvuYtwDgJRaT1g1b1f24zlttsjXy_dtFocw4jAGilnTh8ydOnvweJYpxszRQDj4vrtnN41tIz383Sn7el1uF-t887l6W8w3OUoJQ261QoCZlprPdlxpRXVlkVts-K6s04CqtAWnkQBnkjtUkrCpGyeE2DVKTtnT5e8x9N8jxcEcfERqW9tRP0aT0kNVSaGrhPILiqGPMVBjjsEfbDgl6MyVZm9SS-bckgFhUkvJ83LxUMrw4ymYiJ46JOdDCmpc7_9x_wKpZ23u</recordid><startdate>201112</startdate><enddate>201112</enddate><creator>Vanko, Gabriel</creator><creator>Držík, Milan</creator><creator>Vallo, Martin</creator><creator>Lalinský, Tibor</creator><creator>Kutiš, Vladimír</creator><creator>Stančík, Stanislav</creator><creator>Rýger, Ivan</creator><creator>Benčurová, Anna</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QQ</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>201112</creationdate><title>AlGaN/GaN C-HEMT structures for dynamic stress detection</title><author>Vanko, Gabriel ; Držík, Milan ; Vallo, Martin ; Lalinský, Tibor ; Kutiš, Vladimír ; Stančík, Stanislav ; Rýger, Ivan ; Benčurová, Anna</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c330t-a74c00573715b1474e98ac1acf1b699990487a0d7ce0c531dc43ecf9fd222bf43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>AlGaN/GaN</topic><topic>Aluminum gallium nitrides</topic><topic>Cantilever</topic><topic>Circular HEMT</topic><topic>Dynamics</topic><topic>Gallium nitrides</topic><topic>Gates</topic><topic>Linearity</topic><topic>Piezoelectric response</topic><topic>Piezoelectricity</topic><topic>Sensors</topic><topic>stress sensor</topic><topic>Stresses</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vanko, Gabriel</creatorcontrib><creatorcontrib>Držík, Milan</creatorcontrib><creatorcontrib>Vallo, Martin</creatorcontrib><creatorcontrib>Lalinský, Tibor</creatorcontrib><creatorcontrib>Kutiš, Vladimír</creatorcontrib><creatorcontrib>Stančík, Stanislav</creatorcontrib><creatorcontrib>Rýger, Ivan</creatorcontrib><creatorcontrib>Benčurová, Anna</creatorcontrib><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Sensors and actuators. A. Physical.</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vanko, Gabriel</au><au>Držík, Milan</au><au>Vallo, Martin</au><au>Lalinský, Tibor</au><au>Kutiš, Vladimír</au><au>Stančík, Stanislav</au><au>Rýger, Ivan</au><au>Benčurová, Anna</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>AlGaN/GaN C-HEMT structures for dynamic stress detection</atitle><jtitle>Sensors and actuators. A. Physical.</jtitle><date>2011-12</date><risdate>2011</risdate><volume>172</volume><issue>1</issue><spage>98</spage><epage>102</epage><pages>98-102</pages><issn>0924-4247</issn><eissn>1873-3069</eissn><abstract>In our work, we investigated the possibility of dynamic stress detection based on the piezoelectric polarization using AlGaN/GaN circular high electron mobility transistors (C-HEMTs). In our knowledge, stress sensors in that account are introduced for the first time. The sensor structures exhibit good linearity in the piezoelectric response under dynamic stress conditions. The measurements reveal excellent stress detection sensitivity that is independent on the measured frequency range. The sensitivity of the devices can be easily increased by increase of the area of the Schottky gate ring electrode. The further increase of the sensitivity can be tuned by an optimal selection of the DC drain and gate bias.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.sna.2011.02.049</doi><tpages>5</tpages></addata></record> |
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source | ScienceDirect Journals (5 years ago - present) |
subjects | AlGaN/GaN Aluminum gallium nitrides Cantilever Circular HEMT Dynamics Gallium nitrides Gates Linearity Piezoelectric response Piezoelectricity Sensors stress sensor Stresses |
title | AlGaN/GaN C-HEMT structures for dynamic stress detection |
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