AlGaN/GaN C-HEMT structures for dynamic stress detection

In our work, we investigated the possibility of dynamic stress detection based on the piezoelectric polarization using AlGaN/GaN circular high electron mobility transistors (C-HEMTs). In our knowledge, stress sensors in that account are introduced for the first time. The sensor structures exhibit go...

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Veröffentlicht in:Sensors and actuators. A. Physical. 2011-12, Vol.172 (1), p.98-102
Hauptverfasser: Vanko, Gabriel, Držík, Milan, Vallo, Martin, Lalinský, Tibor, Kutiš, Vladimír, Stančík, Stanislav, Rýger, Ivan, Benčurová, Anna
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container_issue 1
container_start_page 98
container_title Sensors and actuators. A. Physical.
container_volume 172
creator Vanko, Gabriel
Držík, Milan
Vallo, Martin
Lalinský, Tibor
Kutiš, Vladimír
Stančík, Stanislav
Rýger, Ivan
Benčurová, Anna
description In our work, we investigated the possibility of dynamic stress detection based on the piezoelectric polarization using AlGaN/GaN circular high electron mobility transistors (C-HEMTs). In our knowledge, stress sensors in that account are introduced for the first time. The sensor structures exhibit good linearity in the piezoelectric response under dynamic stress conditions. The measurements reveal excellent stress detection sensitivity that is independent on the measured frequency range. The sensitivity of the devices can be easily increased by increase of the area of the Schottky gate ring electrode. The further increase of the sensitivity can be tuned by an optimal selection of the DC drain and gate bias.
doi_str_mv 10.1016/j.sna.2011.02.049
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subjects AlGaN/GaN
Aluminum gallium nitrides
Cantilever
Circular HEMT
Dynamics
Gallium nitrides
Gates
Linearity
Piezoelectric response
Piezoelectricity
Sensors
stress sensor
Stresses
title AlGaN/GaN C-HEMT structures for dynamic stress detection
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