Self-referenceable frequency comb from an ultrafast thin disk laser

We present the first measurement of the carrier envelope offset (CEO) frequency of an ultrafast thin disk laser (TDL). The TDL used for this proof-of-principle experiment was based on the gain material Yb:Lu(2)O(3) and delivered 7 W of average power in 142-fs pulses, which is more than two times sho...

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Veröffentlicht in:	Optics express 2012-04, Vol.20 (9), p.9650-9656
Hauptverfasser:	Saraceno, Clara J, Pekarek, Selina, Heckl, Oliver H, Baer, Cyrill R E, Schriber, Cinia, Golling, Matthias, Beil, Kolja, Kränkel, Christian, Huber, Günter, Keller, Ursula, Südmeyer, Thomas
Format:	Artikel
Sprache:	eng
Schlagworte:	Equipment Design Equipment Failure Analysis Filtration - instrumentation Lasers Miniaturization Refractometry - instrumentation
Online-Zugang:	Volltext
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