Analog and digital single-event effects experiments in space
Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for th...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2001-12, Vol.48 (6), p.1841-1848 |
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| container_title | IEEE transactions on nuclear science |
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| creator | Crain, S.H. Mazur, J.E. Katz, R.B. Koga, R. Looper, M.D. Lorentzen, K.R. |
| description | Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs. |
| doi_str_mv | 10.1109/23.983140 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_998069560</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>983140</ieee_id><sourcerecordid>2633169061</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-e314cf686e9dfd97fef64b3cd32d244b9c777aca5aca167bbe6994230a609f603</originalsourceid><addsrcrecordid>eNqF0TtPwzAQAGALgUQpDKxMEQOIIcWOnyexVBUvqRILzJHjnKtUaRLiFMG_x5CKgQEG62T70_l8R8gpozPGKFxnfAaGM0H3yIRJaVImtdknE0qZSUEAHJKjENZxKySVE3Izb2zdrhLblElZrarB1kmomlWNKb5hMyToPbohJPjeYV9t4lFIqiYJnXV4TA68rQOe7OKUvNzdPi8e0uXT_eNivkwdV3pIMdbjvDIKofQlaI9eiYK7kmdlJkQBTmttnZVxMaWLAhWAyDi1ioJXlE_J5Zi369vXLYYh31TBYV3bBtttyIEJJXX8bZQXf8rMCCq5gf-hMoJlnEd4_guu220fmxafBUMVyO8Cr0bk-jaEHn3exV7Z_iNnNP-aS57xfJxLtGejrRDxx-0uPwFs4oZg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>998069560</pqid></control><display><type>article</type><title>Analog and digital single-event effects experiments in space</title><source>IEEE Electronic Library (IEL)</source><creator>Crain, S.H. ; Mazur, J.E. ; Katz, R.B. ; Koga, R. ; Looper, M.D. ; Lorentzen, K.R.</creator><creatorcontrib>Crain, S.H. ; Mazur, J.E. ; Katz, R.B. ; Koga, R. ; Looper, M.D. ; Lorentzen, K.R.</creatorcontrib><description>Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/23.983140</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Boards ; Circuits ; Devices ; Digital ; Field programmable gate arrays ; Gate arrays ; Instrumentation ; Microelectronics ; Monitoring ; Operational amplifiers ; Photonics ; Rails ; Single event upset ; Space technology ; Testing ; Voltage</subject><ispartof>IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.1841-1848</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2001</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-e314cf686e9dfd97fef64b3cd32d244b9c777aca5aca167bbe6994230a609f603</citedby><cites>FETCH-LOGICAL-c367t-e314cf686e9dfd97fef64b3cd32d244b9c777aca5aca167bbe6994230a609f603</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/983140$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/983140$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Crain, S.H.</creatorcontrib><creatorcontrib>Mazur, J.E.</creatorcontrib><creatorcontrib>Katz, R.B.</creatorcontrib><creatorcontrib>Koga, R.</creatorcontrib><creatorcontrib>Looper, M.D.</creatorcontrib><creatorcontrib>Lorentzen, K.R.</creatorcontrib><title>Analog and digital single-event effects experiments in space</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs.</description><subject>Boards</subject><subject>Circuits</subject><subject>Devices</subject><subject>Digital</subject><subject>Field programmable gate arrays</subject><subject>Gate arrays</subject><subject>Instrumentation</subject><subject>Microelectronics</subject><subject>Monitoring</subject><subject>Operational amplifiers</subject><subject>Photonics</subject><subject>Rails</subject><subject>Single event upset</subject><subject>Space technology</subject><subject>Testing</subject><subject>Voltage</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0TtPwzAQAGALgUQpDKxMEQOIIcWOnyexVBUvqRILzJHjnKtUaRLiFMG_x5CKgQEG62T70_l8R8gpozPGKFxnfAaGM0H3yIRJaVImtdknE0qZSUEAHJKjENZxKySVE3Izb2zdrhLblElZrarB1kmomlWNKb5hMyToPbohJPjeYV9t4lFIqiYJnXV4TA68rQOe7OKUvNzdPi8e0uXT_eNivkwdV3pIMdbjvDIKofQlaI9eiYK7kmdlJkQBTmttnZVxMaWLAhWAyDi1ioJXlE_J5Zi369vXLYYh31TBYV3bBtttyIEJJXX8bZQXf8rMCCq5gf-hMoJlnEd4_guu220fmxafBUMVyO8Cr0bk-jaEHn3exV7Z_iNnNP-aS57xfJxLtGejrRDxx-0uPwFs4oZg</recordid><startdate>20011201</startdate><enddate>20011201</enddate><creator>Crain, S.H.</creator><creator>Mazur, J.E.</creator><creator>Katz, R.B.</creator><creator>Koga, R.</creator><creator>Looper, M.D.</creator><creator>Lorentzen, K.R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>20011201</creationdate><title>Analog and digital single-event effects experiments in space</title><author>Crain, S.H. ; Mazur, J.E. ; Katz, R.B. ; Koga, R. ; Looper, M.D. ; Lorentzen, K.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-e314cf686e9dfd97fef64b3cd32d244b9c777aca5aca167bbe6994230a609f603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Boards</topic><topic>Circuits</topic><topic>Devices</topic><topic>Digital</topic><topic>Field programmable gate arrays</topic><topic>Gate arrays</topic><topic>Instrumentation</topic><topic>Microelectronics</topic><topic>Monitoring</topic><topic>Operational amplifiers</topic><topic>Photonics</topic><topic>Rails</topic><topic>Single event upset</topic><topic>Space technology</topic><topic>Testing</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Crain, S.H.</creatorcontrib><creatorcontrib>Mazur, J.E.</creatorcontrib><creatorcontrib>Katz, R.B.</creatorcontrib><creatorcontrib>Koga, R.</creatorcontrib><creatorcontrib>Looper, M.D.</creatorcontrib><creatorcontrib>Lorentzen, K.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Crain, S.H.</au><au>Mazur, J.E.</au><au>Katz, R.B.</au><au>Koga, R.</au><au>Looper, M.D.</au><au>Lorentzen, K.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analog and digital single-event effects experiments in space</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2001-12-01</date><risdate>2001</risdate><volume>48</volume><issue>6</issue><spage>1841</spage><epage>1848</epage><pages>1841-1848</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/23.983140</doi><tpages>8</tpages></addata></record> |
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| subjects | Boards Circuits Devices Digital Field programmable gate arrays Gate arrays Instrumentation Microelectronics Monitoring Operational amplifiers Photonics Rails Single event upset Space technology Testing Voltage |
| title | Analog and digital single-event effects experiments in space |
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