Developing a model for the bond heel lifetime prediction of thick aluminium wire bonds
Purpose - The purpose of this paper is to establish a law on the durability of thick aluminium wire bonds in low cycle fatigue for different geometries and wire diameters under a purely mechanical load.Design methodology approach - Bond wires with different geometries were tested with various loads...
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Veröffentlicht in: | Soldering & surface mount technology 2012-01, Vol.24 (2), p.127-134 |
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description | Purpose - The purpose of this paper is to establish a law on the durability of thick aluminium wire bonds in low cycle fatigue for different geometries and wire diameters under a purely mechanical load.Design methodology approach - Bond wires with different geometries were tested with various loads and a mechanical test bench, and their endurance was determined. The same load situation was modelled with finite element analysis and then compared against the experimental results.Findings - A correlation was found between the plastic strain per cycle and the determined lifespan. Therefore, the lifespan can be calculated by mechanical-plastic simulation for various loop geometries and loading cases.Practical implications - The loop height strongly influences the durability of the wire bond, whereas other parameters, such as the loop angle, have a weaker influence on the bond heel lifetime.Originality value - The mechanical simulation is able to replace the time-consuming lifetime experiments. |
doi_str_mv | 10.1108/09540911211214703 |
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The same load situation was modelled with finite element analysis and then compared against the experimental results.Findings - A correlation was found between the plastic strain per cycle and the determined lifespan. Therefore, the lifespan can be calculated by mechanical-plastic simulation for various loop geometries and loading cases.Practical implications - The loop height strongly influences the durability of the wire bond, whereas other parameters, such as the loop angle, have a weaker influence on the bond heel lifetime.Originality value - The mechanical simulation is able to replace the time-consuming lifetime experiments.</description><identifier>ISSN: 0954-0911</identifier><identifier>EISSN: 1758-6836</identifier><identifier>DOI: 10.1108/09540911211214703</identifier><identifier>CODEN: SSMOEO</identifier><language>eng</language><publisher>Bradford: Emerald Group Publishing Limited</publisher><subject>Aluminium ; Aluminum ; Applied sciences ; Bonding ; Bonding strength ; Design. Technologies. Operation analysis. Testing ; Durability ; Electronics ; Exact sciences and technology ; Finite element analysis ; Geometry ; Heels ; Integrated circuits ; Kinematics ; Load ; Mathematical models ; Semiconductor electronics. Microelectronics. Optoelectronics. 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The same load situation was modelled with finite element analysis and then compared against the experimental results.Findings - A correlation was found between the plastic strain per cycle and the determined lifespan. Therefore, the lifespan can be calculated by mechanical-plastic simulation for various loop geometries and loading cases.Practical implications - The loop height strongly influences the durability of the wire bond, whereas other parameters, such as the loop angle, have a weaker influence on the bond heel lifetime.Originality value - The mechanical simulation is able to replace the time-consuming lifetime experiments.</description><subject>Aluminium</subject><subject>Aluminum</subject><subject>Applied sciences</subject><subject>Bonding</subject><subject>Bonding strength</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Durability</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Finite element analysis</subject><subject>Geometry</subject><subject>Heels</subject><subject>Integrated circuits</subject><subject>Kinematics</subject><subject>Load</subject><subject>Mathematical models</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Simulation</subject><subject>Soldering</subject><subject>Studies</subject><subject>Wire</subject><subject>Yield stress</subject><issn>0954-0911</issn><issn>1758-6836</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kMtKxDAUhoMoOI4-gLsgCC6sJpNL26V4B8GNui25asa0qUmr-PZmqMzCCxwInHz_x-EHYB-jE4xRdYpqRlGN8WI1tERkA8xwyaqCV4Rvgtnqv1gB22AnpSVCiPKazMDThXk3PvSue4YCtkEbD22IcHgxUIZOwxeTN95ZM7jWwD4a7dTgQgeDzZBTr1D4sXWdG1v44eKUSrtgywqfzN73OwePV5cP5zfF3f317fnZXaEo40PBEalKJSURjErBkDVUyFJSzKVWFa4QKyuuiWS2ppILpRjHFBGxKNGCaKXJHBxN3j6Gt9GkoWldUsZ70ZkwpgYjXHNWUkYzevADXYYxdvm6puaEZG0uZA7wBKkYUorGNn10rYif2dSsim5-FZ0zh99ikZTwNopOubQOLliNa0p55o4nzrQmCq_XxC9l02ubcfQ3_v8lX3cKl5Y</recordid><startdate>20120101</startdate><enddate>20120101</enddate><creator>Merkle, Lutz</creator><creator>Sonner, Marcus</creator><creator>Petzold, Matthias</creator><general>Emerald Group Publishing Limited</general><general>Emerald</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7RQ</scope><scope>7SP</scope><scope>7TB</scope><scope>7WY</scope><scope>7XB</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FR3</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K6~</scope><scope>KB.</scope><scope>KR7</scope><scope>L.-</scope><scope>L7M</scope><scope>M0F</scope><scope>M2P</scope><scope>PDBOC</scope><scope>PQBIZ</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>Q9U</scope><scope>7QF</scope></search><sort><creationdate>20120101</creationdate><title>Developing a model for the bond heel lifetime prediction of thick aluminium wire bonds</title><author>Merkle, Lutz ; Sonner, Marcus ; Petzold, Matthias</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c456t-60387cbb3a54ba50fe4ab7b416bdc81805786d3b5f94b6acc561403a27023dcd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Aluminium</topic><topic>Aluminum</topic><topic>Applied sciences</topic><topic>Bonding</topic><topic>Bonding strength</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Durability</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Finite element analysis</topic><topic>Geometry</topic><topic>Heels</topic><topic>Integrated circuits</topic><topic>Kinematics</topic><topic>Load</topic><topic>Mathematical models</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. 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The same load situation was modelled with finite element analysis and then compared against the experimental results.Findings - A correlation was found between the plastic strain per cycle and the determined lifespan. Therefore, the lifespan can be calculated by mechanical-plastic simulation for various loop geometries and loading cases.Practical implications - The loop height strongly influences the durability of the wire bond, whereas other parameters, such as the loop angle, have a weaker influence on the bond heel lifetime.Originality value - The mechanical simulation is able to replace the time-consuming lifetime experiments.</abstract><cop>Bradford</cop><pub>Emerald Group Publishing Limited</pub><doi>10.1108/09540911211214703</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Aluminium Aluminum Applied sciences Bonding Bonding strength Design. Technologies. Operation analysis. Testing Durability Electronics Exact sciences and technology Finite element analysis Geometry Heels Integrated circuits Kinematics Load Mathematical models Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Simulation Soldering Studies Wire Yield stress |
title | Developing a model for the bond heel lifetime prediction of thick aluminium wire bonds |
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