On parameter estimation using level sets
Consider the problem of selecting the member of a parametrized family of curves that best matches a given curve. This is a key step in determining proper values for adjustable parameters in low-order plasma etching and deposition models. Level set methods offer several attractive features for treati...
Gespeichert in:
| Veröffentlicht in: | SIAM journal on control and optimization 1999, Vol.37 (5), p.1372-1393 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1393 |
|---|---|
| container_issue | 5 |
| container_start_page | 1372 |
| container_title | SIAM journal on control and optimization |
| container_volume | 37 |
| creator | BERG, J. M HOLMSTRÖM, K |
| description | Consider the problem of selecting the member of a parametrized family of curves that best matches a given curve. This is a key step in determining proper values for adjustable parameters in low-order plasma etching and deposition models. Level set methods offer several attractive features for treating such problems. This paper presents a parameter estimation scheme that exploits the level set formulation. The method is completely geometric; there is no need to introduce an arbitrary coordinate system for the curves. Analytic results necessary for the application of gradient descent algorithms are derived, and some preliminary numerical results are presented. |
| doi_str_mv | 10.1137/S0363012998336340 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_925819194</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2600547361</sourcerecordid><originalsourceid>FETCH-LOGICAL-c342t-789c528f40f4e50799f7a24a5227c6b95dd6ca9af97d7bc74f5928d4c64e04033</originalsourceid><addsrcrecordid>eNplUE1LxDAQDaJgXf0B3op48FLNJJOmc5TFVWFhD-q5ZNNEunTbmrSC_96WXfDgaR68j3k8xq6B3wNI_fDGZS45CKJCTgj5CUuAk8o0yOKUJTOdzfw5u4hxxzkgAibsbtOmvQlm7wYXUheHem-GumvTMdbtZ9q4b9ek0Q3xkp1500R3dbwL9rF6el--ZOvN8-vycZ1ZiWLIdEFWicIj9-gU10ReG4FGCaFtviVVVbk1ZDzpSm-tRq9IFBXaHB1HLuWC3Rxy-9B9jVOhcteNoZ1eliRUAQSEkwgOIhu6GIPzZR-m4uGnBF7Oe5T_9pg8t8dgE61pfDCtreOfkTCXoOQvR69dTA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>925819194</pqid></control><display><type>article</type><title>On parameter estimation using level sets</title><source>SIAM Journals Online</source><source>Business Source Complete</source><creator>BERG, J. M ; HOLMSTRÖM, K</creator><creatorcontrib>BERG, J. M ; HOLMSTRÖM, K</creatorcontrib><description>Consider the problem of selecting the member of a parametrized family of curves that best matches a given curve. This is a key step in determining proper values for adjustable parameters in low-order plasma etching and deposition models. Level set methods offer several attractive features for treating such problems. This paper presents a parameter estimation scheme that exploits the level set formulation. The method is completely geometric; there is no need to introduce an arbitrary coordinate system for the curves. Analytic results necessary for the application of gradient descent algorithms are derived, and some preliminary numerical results are presented.</description><identifier>ISSN: 0363-0129</identifier><identifier>EISSN: 1095-7138</identifier><identifier>DOI: 10.1137/S0363012998336340</identifier><identifier>CODEN: SJCODC</identifier><language>eng</language><publisher>Philadelphia, PA: Society for Industrial and Applied Mathematics</publisher><subject>Algorithms ; Applied sciences ; Computer science; control theory; systems ; Control theory. Systems ; Exact sciences and technology ; Modelling and identification ; Parameter estimation ; Plasma etching</subject><ispartof>SIAM journal on control and optimization, 1999, Vol.37 (5), p.1372-1393</ispartof><rights>1999 INIST-CNRS</rights><rights>[Copyright] © 1999 Society for Industrial and Applied Mathematics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c342t-789c528f40f4e50799f7a24a5227c6b95dd6ca9af97d7bc74f5928d4c64e04033</citedby><cites>FETCH-LOGICAL-c342t-789c528f40f4e50799f7a24a5227c6b95dd6ca9af97d7bc74f5928d4c64e04033</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,3171,4010,27904,27905,27906</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1946315$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>BERG, J. M</creatorcontrib><creatorcontrib>HOLMSTRÖM, K</creatorcontrib><title>On parameter estimation using level sets</title><title>SIAM journal on control and optimization</title><description>Consider the problem of selecting the member of a parametrized family of curves that best matches a given curve. This is a key step in determining proper values for adjustable parameters in low-order plasma etching and deposition models. Level set methods offer several attractive features for treating such problems. This paper presents a parameter estimation scheme that exploits the level set formulation. The method is completely geometric; there is no need to introduce an arbitrary coordinate system for the curves. Analytic results necessary for the application of gradient descent algorithms are derived, and some preliminary numerical results are presented.</description><subject>Algorithms</subject><subject>Applied sciences</subject><subject>Computer science; control theory; systems</subject><subject>Control theory. Systems</subject><subject>Exact sciences and technology</subject><subject>Modelling and identification</subject><subject>Parameter estimation</subject><subject>Plasma etching</subject><issn>0363-0129</issn><issn>1095-7138</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNplUE1LxDAQDaJgXf0B3op48FLNJJOmc5TFVWFhD-q5ZNNEunTbmrSC_96WXfDgaR68j3k8xq6B3wNI_fDGZS45CKJCTgj5CUuAk8o0yOKUJTOdzfw5u4hxxzkgAibsbtOmvQlm7wYXUheHem-GumvTMdbtZ9q4b9ek0Q3xkp1500R3dbwL9rF6el--ZOvN8-vycZ1ZiWLIdEFWicIj9-gU10ReG4FGCaFtviVVVbk1ZDzpSm-tRq9IFBXaHB1HLuWC3Rxy-9B9jVOhcteNoZ1eliRUAQSEkwgOIhu6GIPzZR-m4uGnBF7Oe5T_9pg8t8dgE61pfDCtreOfkTCXoOQvR69dTA</recordid><startdate>1999</startdate><enddate>1999</enddate><creator>BERG, J. M</creator><creator>HOLMSTRÖM, K</creator><general>Society for Industrial and Applied Mathematics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7RQ</scope><scope>7WY</scope><scope>7WZ</scope><scope>7X2</scope><scope>7XB</scope><scope>87Z</scope><scope>88A</scope><scope>88F</scope><scope>88I</scope><scope>88K</scope><scope>8AL</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FK</scope><scope>8FL</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>ATCPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>KB.</scope><scope>L.-</scope><scope>L6V</scope><scope>LK8</scope><scope>M0C</scope><scope>M0K</scope><scope>M0N</scope><scope>M1Q</scope><scope>M2O</scope><scope>M2P</scope><scope>M2T</scope><scope>M7P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PATMY</scope><scope>PDBOC</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>PYCSY</scope><scope>Q9U</scope><scope>U9A</scope></search><sort><creationdate>1999</creationdate><title>On parameter estimation using level sets</title><author>BERG, J. M ; HOLMSTRÖM, K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c342t-789c528f40f4e50799f7a24a5227c6b95dd6ca9af97d7bc74f5928d4c64e04033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Algorithms</topic><topic>Applied sciences</topic><topic>Computer science; control theory; systems</topic><topic>Control theory. Systems</topic><topic>Exact sciences and technology</topic><topic>Modelling and identification</topic><topic>Parameter estimation</topic><topic>Plasma etching</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>BERG, J. M</creatorcontrib><creatorcontrib>HOLMSTRÖM, K</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Career & Technical Education Database</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>Agricultural Science Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Biology Database (Alumni Edition)</collection><collection>Military Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>Agricultural & Environmental Science Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>Materials Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest Biological Science Collection</collection><collection>ABI/INFORM Global</collection><collection>Agricultural Science Database</collection><collection>Computing Database</collection><collection>Military Database</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Telecommunications Database</collection><collection>Biological Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Environmental Science Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>Environmental Science Collection</collection><collection>ProQuest Central Basic</collection><jtitle>SIAM journal on control and optimization</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>BERG, J. M</au><au>HOLMSTRÖM, K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On parameter estimation using level sets</atitle><jtitle>SIAM journal on control and optimization</jtitle><date>1999</date><risdate>1999</risdate><volume>37</volume><issue>5</issue><spage>1372</spage><epage>1393</epage><pages>1372-1393</pages><issn>0363-0129</issn><eissn>1095-7138</eissn><coden>SJCODC</coden><abstract>Consider the problem of selecting the member of a parametrized family of curves that best matches a given curve. This is a key step in determining proper values for adjustable parameters in low-order plasma etching and deposition models. Level set methods offer several attractive features for treating such problems. This paper presents a parameter estimation scheme that exploits the level set formulation. The method is completely geometric; there is no need to introduce an arbitrary coordinate system for the curves. Analytic results necessary for the application of gradient descent algorithms are derived, and some preliminary numerical results are presented.</abstract><cop>Philadelphia, PA</cop><pub>Society for Industrial and Applied Mathematics</pub><doi>10.1137/S0363012998336340</doi><tpages>22</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0363-0129 |
| ispartof | SIAM journal on control and optimization, 1999, Vol.37 (5), p.1372-1393 |
| issn | 0363-0129 1095-7138 |
| language | eng |
| recordid | cdi_proquest_journals_925819194 |
| source | SIAM Journals Online; Business Source Complete |
| subjects | Algorithms Applied sciences Computer science control theory systems Control theory. Systems Exact sciences and technology Modelling and identification Parameter estimation Plasma etching |
| title | On parameter estimation using level sets |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T09%3A44%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=On%20parameter%20estimation%20using%20level%20sets&rft.jtitle=SIAM%20journal%20on%20control%20and%20optimization&rft.au=BERG,%20J.%20M&rft.date=1999&rft.volume=37&rft.issue=5&rft.spage=1372&rft.epage=1393&rft.pages=1372-1393&rft.issn=0363-0129&rft.eissn=1095-7138&rft.coden=SJCODC&rft_id=info:doi/10.1137/S0363012998336340&rft_dat=%3Cproquest_cross%3E2600547361%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=925819194&rft_id=info:pmid/&rfr_iscdi=true |