Texture and surface analysis of NiO buffer deposited on biaxially textured Ni tapes by a MOCVD method

NiO buffer layers for YBCO coated conductors were deposited on textured Ni substrates by a metal-organic chemical vapor deposition(MOCVD) method. Processing variables were the oxygen partial pressure and substrate temperature. The degree of texture and the surface roughness of the deposited NiO surf...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 2003-06, Vol.13 (2), p.2539-2542
Hauptverfasser:	SUN, Jong-Won, HYUNG SEOP KIM, BONG KI JI, PARK, Hai-Woong, HONG, Gye-Won, JUNG, Choong-Hwan, PARK, Soon-Dong, JUN, Byung-Hyuk, KIM, Chan-Joong
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Atomic force microscopy Atomic layer deposition Buffer layers Conductors Electrical engineering. Electrical power engineering Exact sciences and technology Materials MOCVD Rough surfaces Scanning electron microscopy Surface roughness Surface texture Yttrium barium copper oxide
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