In situ sputtering growth and characterization of MgB2 films for microwave applications
The films were characterized by a variety of structural and electronic techniques including profilometry, XRD, EDS, and STM-AFM analyses, critical current, upper critical field and penetration depth measurements.
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2003-06, Vol.13 (2), p.3602-3605 |
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| container_end_page | 3605 |
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| container_issue | 2 |
| container_start_page | 3602 |
| container_title | IEEE transactions on applied superconductivity |
| container_volume | 13 |
| creator | ANDREONE, Antonello CASSINESE, Antonio CHIARELLA, Fabio DI CAPUA, Roberto DI GENNARO, Emiliano LAMURA, Gianrico MAGLIONE, Maria Grazia SALLUZZO, Marco VAGLIO, Ruggero |
| description | The films were characterized by a variety of structural and electronic techniques including profilometry, XRD, EDS, and STM-AFM analyses, critical current, upper critical field and penetration depth measurements. |
| doi_str_mv | 10.1109/TASC.2003.812408 |
| format | Article |
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| identifier | ISSN: 1051-8223 |
| ispartof | IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.3602-3605 |
| issn | 1051-8223 1558-2515 |
| language | eng |
| recordid | cdi_proquest_journals_921507096 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronics Exact sciences and technology High-tc films Microelectronic fabrication (materials and surfaces technology) Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting films and low-dimensional structures Superconductivity |
| title | In situ sputtering growth and characterization of MgB2 films for microwave applications |
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