Why do we care about measurement?
The IEEE Instrumentation and Measurement (I&M) Society surveyed its membership during the summer of 2003 to clarify IEEE Instrumentation and Measurement Magazine's role and purpose. One prominent result was the need for tutorials on I&M. The response to our survey heavily favoured a reg...
Gespeichert in:
Veröffentlicht in: | IEEE instrumentation & measurement magazine 2004-03, Vol.7 (1), p.38-46 |
---|---|
Hauptverfasser: | , |
Format: | Magazinearticle |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 46 |
---|---|
container_issue | 1 |
container_start_page | 38 |
container_title | IEEE instrumentation & measurement magazine |
container_volume | 7 |
creator | Fowler, K.R. Schmalzel, J. |
description | The IEEE Instrumentation and Measurement (I&M) Society surveyed its membership during the summer of 2003 to clarify IEEE Instrumentation and Measurement Magazine's role and purpose. One prominent result was the need for tutorials on I&M. The response to our survey heavily favoured a regular feature in the magazine. Each article focuses on a different concern. Its purpose is to help folks at all levels. Some might be just getting into the discipline and wanting to learn the basics of I&M, general definitions, and common concerns. Moreover, these general areas of knowledge need to be made useful by tying together various I&M elements. Others already working in the field may want introductions to, and possibly more depth in, new and emerging areas. All of the articles are written at a level of a basic undergraduate textbook. To make them as useful as possible, we need your input. That is, we need to know how well the articles meet your needs. These tutorials aim to overcome this myopic view of development and to provide you with a bigger picture - or the systems perspective. Our hope is that understanding the system will thereby help you build more useful instruments. This first tutorial is introductory and provides a basic systems overview. |
doi_str_mv | 10.1109/MIM.2004.1288747 |
format | Magazinearticle |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_921352764</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1288747</ieee_id><sourcerecordid>1136366284</sourcerecordid><originalsourceid>FETCH-LOGICAL-i294t-d2ac0257978ddca9bb6bc79cf97594e04522d83856c01226d1abf168659f0e9c3</originalsourceid><addsrcrecordid>eNp90EtLw0AQB_BFFKzVu-AlCoqX1J19z0mk-Ci0eFE8hs1mgyl5aDZB-u1daUHw4GkG5scw_yHkFOgMgOLNarGaMUrFDJgxWug9MgEUkFJgfD_2FEWqUOEhOQphTSkIoc2EnL-9b5KiS7584mzvE5t345A03oax941vh9tjclDaOviTXZ2S14f7l_lTunx-XMzvlmnFUAxpwayjTGrUpiicxTxXudPoStQShadCMlYYbqRy8SSmCrB5CcooiSX16PiUXG33fvTd5-jDkDVVcL6ubeu7MWQxFkhAiPD6XwjAFVeKGRHpxR-67sa-jTEyZMAl0-oHXe6QDc7WZW9bV4Xso68a228ykIoa1Dq6s62rvPe_4-27-TdwkW-M</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>magazinearticle</recordtype><pqid>921352764</pqid></control><display><type>magazinearticle</type><title>Why do we care about measurement?</title><source>IEEE Electronic Library (IEL)</source><creator>Fowler, K.R. ; Schmalzel, J.</creator><creatorcontrib>Fowler, K.R. ; Schmalzel, J.</creatorcontrib><description>The IEEE Instrumentation and Measurement (I&M) Society surveyed its membership during the summer of 2003 to clarify IEEE Instrumentation and Measurement Magazine's role and purpose. One prominent result was the need for tutorials on I&M. The response to our survey heavily favoured a regular feature in the magazine. Each article focuses on a different concern. Its purpose is to help folks at all levels. Some might be just getting into the discipline and wanting to learn the basics of I&M, general definitions, and common concerns. Moreover, these general areas of knowledge need to be made useful by tying together various I&M elements. Others already working in the field may want introductions to, and possibly more depth in, new and emerging areas. All of the articles are written at a level of a basic undergraduate textbook. To make them as useful as possible, we need your input. That is, we need to know how well the articles meet your needs. These tutorials aim to overcome this myopic view of development and to provide you with a bigger picture - or the systems perspective. Our hope is that understanding the system will thereby help you build more useful instruments. This first tutorial is introductory and provides a basic systems overview.</description><identifier>ISSN: 1094-6969</identifier><identifier>EISSN: 1941-0123</identifier><identifier>DOI: 10.1109/MIM.2004.1288747</identifier><identifier>CODEN: IIMMF9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Actuators ; Applied sciences ; Computer science; control theory; systems ; Computer systems and distributed systems. User interface ; Construction ; Displays ; Exact sciences and technology ; Instrumentation ; Instrumentation and measurement ; Instruments ; Length measurement ; Pictures ; Production ; Signal processing ; Societies ; Software ; Summer ; Textbooks ; Tutorial</subject><ispartof>IEEE instrumentation & measurement magazine, 2004-03, Vol.7 (1), p.38-46</ispartof><rights>2004 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2004</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1288747$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>780,784,796,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1288747$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15608977$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Fowler, K.R.</creatorcontrib><creatorcontrib>Schmalzel, J.</creatorcontrib><title>Why do we care about measurement?</title><title>IEEE instrumentation & measurement magazine</title><addtitle>IM-M</addtitle><description>The IEEE Instrumentation and Measurement (I&M) Society surveyed its membership during the summer of 2003 to clarify IEEE Instrumentation and Measurement Magazine's role and purpose. One prominent result was the need for tutorials on I&M. The response to our survey heavily favoured a regular feature in the magazine. Each article focuses on a different concern. Its purpose is to help folks at all levels. Some might be just getting into the discipline and wanting to learn the basics of I&M, general definitions, and common concerns. Moreover, these general areas of knowledge need to be made useful by tying together various I&M elements. Others already working in the field may want introductions to, and possibly more depth in, new and emerging areas. All of the articles are written at a level of a basic undergraduate textbook. To make them as useful as possible, we need your input. That is, we need to know how well the articles meet your needs. These tutorials aim to overcome this myopic view of development and to provide you with a bigger picture - or the systems perspective. Our hope is that understanding the system will thereby help you build more useful instruments. This first tutorial is introductory and provides a basic systems overview.</description><subject>Actuators</subject><subject>Applied sciences</subject><subject>Computer science; control theory; systems</subject><subject>Computer systems and distributed systems. User interface</subject><subject>Construction</subject><subject>Displays</subject><subject>Exact sciences and technology</subject><subject>Instrumentation</subject><subject>Instrumentation and measurement</subject><subject>Instruments</subject><subject>Length measurement</subject><subject>Pictures</subject><subject>Production</subject><subject>Signal processing</subject><subject>Societies</subject><subject>Software</subject><subject>Summer</subject><subject>Textbooks</subject><subject>Tutorial</subject><issn>1094-6969</issn><issn>1941-0123</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2004</creationdate><recordtype>magazinearticle</recordtype><sourceid>RIE</sourceid><recordid>eNp90EtLw0AQB_BFFKzVu-AlCoqX1J19z0mk-Ci0eFE8hs1mgyl5aDZB-u1daUHw4GkG5scw_yHkFOgMgOLNarGaMUrFDJgxWug9MgEUkFJgfD_2FEWqUOEhOQphTSkIoc2EnL-9b5KiS7584mzvE5t345A03oax941vh9tjclDaOviTXZ2S14f7l_lTunx-XMzvlmnFUAxpwayjTGrUpiicxTxXudPoStQShadCMlYYbqRy8SSmCrB5CcooiSX16PiUXG33fvTd5-jDkDVVcL6ubeu7MWQxFkhAiPD6XwjAFVeKGRHpxR-67sa-jTEyZMAl0-oHXe6QDc7WZW9bV4Xso68a228ykIoa1Dq6s62rvPe_4-27-TdwkW-M</recordid><startdate>20040301</startdate><enddate>20040301</enddate><creator>Fowler, K.R.</creator><creator>Schmalzel, J.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>7SC</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20040301</creationdate><title>Why do we care about measurement?</title><author>Fowler, K.R. ; Schmalzel, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i294t-d2ac0257978ddca9bb6bc79cf97594e04522d83856c01226d1abf168659f0e9c3</frbrgroupid><rsrctype>magazinearticle</rsrctype><prefilter>magazinearticle</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Actuators</topic><topic>Applied sciences</topic><topic>Computer science; control theory; systems</topic><topic>Computer systems and distributed systems. User interface</topic><topic>Construction</topic><topic>Displays</topic><topic>Exact sciences and technology</topic><topic>Instrumentation</topic><topic>Instrumentation and measurement</topic><topic>Instruments</topic><topic>Length measurement</topic><topic>Pictures</topic><topic>Production</topic><topic>Signal processing</topic><topic>Societies</topic><topic>Software</topic><topic>Summer</topic><topic>Textbooks</topic><topic>Tutorial</topic><toplevel>online_resources</toplevel><creatorcontrib>Fowler, K.R.</creatorcontrib><creatorcontrib>Schmalzel, J.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE instrumentation & measurement magazine</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fowler, K.R.</au><au>Schmalzel, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Why do we care about measurement?</atitle><jtitle>IEEE instrumentation & measurement magazine</jtitle><stitle>IM-M</stitle><date>2004-03-01</date><risdate>2004</risdate><volume>7</volume><issue>1</issue><spage>38</spage><epage>46</epage><pages>38-46</pages><issn>1094-6969</issn><eissn>1941-0123</eissn><coden>IIMMF9</coden><abstract>The IEEE Instrumentation and Measurement (I&M) Society surveyed its membership during the summer of 2003 to clarify IEEE Instrumentation and Measurement Magazine's role and purpose. One prominent result was the need for tutorials on I&M. The response to our survey heavily favoured a regular feature in the magazine. Each article focuses on a different concern. Its purpose is to help folks at all levels. Some might be just getting into the discipline and wanting to learn the basics of I&M, general definitions, and common concerns. Moreover, these general areas of knowledge need to be made useful by tying together various I&M elements. Others already working in the field may want introductions to, and possibly more depth in, new and emerging areas. All of the articles are written at a level of a basic undergraduate textbook. To make them as useful as possible, we need your input. That is, we need to know how well the articles meet your needs. These tutorials aim to overcome this myopic view of development and to provide you with a bigger picture - or the systems perspective. Our hope is that understanding the system will thereby help you build more useful instruments. This first tutorial is introductory and provides a basic systems overview.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/MIM.2004.1288747</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1094-6969 |
ispartof | IEEE instrumentation & measurement magazine, 2004-03, Vol.7 (1), p.38-46 |
issn | 1094-6969 1941-0123 |
language | eng |
recordid | cdi_proquest_journals_921352764 |
source | IEEE Electronic Library (IEL) |
subjects | Actuators Applied sciences Computer science control theory systems Computer systems and distributed systems. User interface Construction Displays Exact sciences and technology Instrumentation Instrumentation and measurement Instruments Length measurement Pictures Production Signal processing Societies Software Summer Textbooks Tutorial |
title | Why do we care about measurement? |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T13%3A12%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Why%20do%20we%20care%20about%20measurement?&rft.jtitle=IEEE%20instrumentation%20&%20measurement%20magazine&rft.au=Fowler,%20K.R.&rft.date=2004-03-01&rft.volume=7&rft.issue=1&rft.spage=38&rft.epage=46&rft.pages=38-46&rft.issn=1094-6969&rft.eissn=1941-0123&rft.coden=IIMMF9&rft_id=info:doi/10.1109/MIM.2004.1288747&rft_dat=%3Cproquest_RIE%3E1136366284%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=921352764&rft_id=info:pmid/&rft_ieee_id=1288747&rfr_iscdi=true |